CA1196080A - Methode de tri pour les diodes laser - Google Patents

Methode de tri pour les diodes laser

Info

Publication number
CA1196080A
CA1196080A CA000447814A CA447814A CA1196080A CA 1196080 A CA1196080 A CA 1196080A CA 000447814 A CA000447814 A CA 000447814A CA 447814 A CA447814 A CA 447814A CA 1196080 A CA1196080 A CA 1196080A
Authority
CA
Canada
Prior art keywords
laser
laser diode
diodes
current
burn
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA000447814A
Other languages
English (en)
Inventor
Kiu-Chi D. Chik
Tibor F. Devenyi
John C. Dyment
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lumentum Technology UK Ltd
Original Assignee
Northern Telecom Ltd
Bookham Technology PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Northern Telecom Ltd, Bookham Technology PLC filed Critical Northern Telecom Ltd
Priority to CA000447814A priority Critical patent/CA1196080A/fr
Application granted granted Critical
Publication of CA1196080A publication Critical patent/CA1196080A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Lasers (AREA)
CA000447814A 1984-02-20 1984-02-20 Methode de tri pour les diodes laser Expired CA1196080A (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CA000447814A CA1196080A (fr) 1984-02-20 1984-02-20 Methode de tri pour les diodes laser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA000447814A CA1196080A (fr) 1984-02-20 1984-02-20 Methode de tri pour les diodes laser

Publications (1)

Publication Number Publication Date
CA1196080A true CA1196080A (fr) 1985-10-29

Family

ID=4127238

Family Applications (1)

Application Number Title Priority Date Filing Date
CA000447814A Expired CA1196080A (fr) 1984-02-20 1984-02-20 Methode de tri pour les diodes laser

Country Status (1)

Country Link
CA (1) CA1196080A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0981214A2 (fr) * 1998-08-19 2000-02-23 Nec Corporation Emetteur optique

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0981214A2 (fr) * 1998-08-19 2000-02-23 Nec Corporation Emetteur optique
EP0981214A3 (fr) * 1998-08-19 2003-07-16 Nec Corporation Emetteur optique

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Legal Events

Date Code Title Description
MKEC Expiry (correction)
MKEX Expiry