CA1152739A - Inspection system - Google Patents
Inspection systemInfo
- Publication number
- CA1152739A CA1152739A CA000373620A CA373620A CA1152739A CA 1152739 A CA1152739 A CA 1152739A CA 000373620 A CA000373620 A CA 000373620A CA 373620 A CA373620 A CA 373620A CA 1152739 A CA1152739 A CA 1152739A
- Authority
- CA
- Canada
- Prior art keywords
- picture screen
- objects
- inspection system
- electrical
- braun tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes
- G01R13/22—Circuits therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/20—Cathode-ray oscilloscopes
- G01R13/202—Non-electric appliances, e.g. scales, masks
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
ABSTRACT OF THE DISCLOSURE
In inspection systems that inspect the good or bad of objects such as electrical circuits or the like by observing wave forms of characteristics of the objects which appear on a picture screen of a Braun tube oscillo-scope, the wave forms being provided by sweeping the electrical characteristics of objects in relation with time, the inspection system having an optical sensor which generates outputs by sensing the light from the picture screen and an optical mask which practically prevents the passage of light from the picture screen, the optical mask having a shape in response with the standard wave form for the electrical characteristics of the above mentioned inspected object, and being placed at a predetermined positioned on the picture screen.
In inspection systems that inspect the good or bad of objects such as electrical circuits or the like by observing wave forms of characteristics of the objects which appear on a picture screen of a Braun tube oscillo-scope, the wave forms being provided by sweeping the electrical characteristics of objects in relation with time, the inspection system having an optical sensor which generates outputs by sensing the light from the picture screen and an optical mask which practically prevents the passage of light from the picture screen, the optical mask having a shape in response with the standard wave form for the electrical characteristics of the above mentioned inspected object, and being placed at a predetermined positioned on the picture screen.
Description
TITLE: INSPECTION SYSTEM ~1~2739 BACKGROUND OF THE INVENTION
Field of the Invention The present invention relates generally to inspec~-tion systems by which the inspection of the characteristics of circuit elements or the like can be automatically inspected, and is directed more specifically to inspection systems that utilize Braun tube oscilloscopes to conduct the automated inspection.
Description of the Prior Art In the recent years, in conjunction with the advance of electronic technologies, electric circui~s have become increasingly of high precision nature, whereas a vast and wide variety of circuit elements are being introduced as new materials, are developed and such processing technology advances. At the same time high demands are being placed for the function or special characteristics of such circuits or elements and in the inspection of such electrical character-istics, such demands may not be satisfied by one point inspection such as the frequency characteristics, spectrum, transient characteristics or distortion ratio, and for instance, precision measurement of changes in relation to time is required.
Normally such above mentioned inspection is conducted by utilizing a Braun tube oscilloscope by taking the voltage or frequency on the time axis which is sweeped to form a wave form on the Braun tube and thereby visually inspecting such ~L~L52739 wave form to check whether the required characteristics are satisfied or not. In the present days, it is co~non that such circuit elements are masproduced and the circumstances to have automated inspection of such electrical characteris- ¦
tics are actually prepared. However, under the present status, it is a fact that systems which will enable such above mentioned inspection automatically are not yet proposed.
As the next step, explanation of an inspection system by utilization of sraun tube oscillographs under the prior art will be made in reference with Fig. 1 and Fig. 2.
Fig. 1 illustrates the front view of a picture screen PS of f the Braun tube oscilloscope. Curve a on this picture screen PS indicates a usually seen band pass characteristics (standard wave) of the high frequency circuit of an object to be inspected, which in this case, the points of inspection, for instance, are the frequency width fl at the skirt of the band characteristic curve a, the frequency band f2 at the top portions, or the indent or drops Ll (level variation) at the top portions. At the inspection of actual circuits, upper and lower limits to be tolerable are established for the values fl, f2 or Ll, and when the curve a stays within such tolerance range, the inspected circuitisaccepted as a qualified product.
Accordingly, in the usual case, as shown on Fig. 2, a standard range R by solid line curves _ and c which indicate the upper and lower t~olerance values to the desired curve a as shown by the dotted line a is imaged on the picture screen PS of the Braun tube, by which the actual curve of an inspected object as drawn on the picture screen PS is visually inspected for whether the curve lies within the standard range R or not.
~1 ~52739 -~ However, from a practical standpoint, in conducting the inspection by imaginary setting of such standard range R
on the picture screen PS with considerations to the nature of the picture screen PS on the Braun tube and the fluctuation of the inspected curve a, difficulties are contained in tne inspection, and precise and positive inspection cannot be anticipated. Further, inspection becomes more difficult when the tolerance range R is small.
In addition, when huge quantities of objects are inspected, many defects get involved, such as the accumulation of inevitable fatigue of the inspector's eye.
OBJECTS AND SU~lARY OF T~E INVENTION
Accordingly, the main purpose of the present invention is to offer an inspection system by which automatic inspection of such above mentioned various characteristics of the electrical circuits may be conducted by utilizing Braun 3 tube oscilloscopes.
The features of the present invention lie in an inspection system which has an optical sensor which produces outputs as reactions to the light from the picture screen of Braun tubes, whereas Braun tube oscilloscopes are used for sweeping the electrical characteristics of inspected objects such as electric circuits or electric circuit elements in relation with time, where such inspection systems are used to inspectl the good or bad of an inspected object by observations of the wave that indicates the electrical characteristics of an inspected object as it appears on the picture screen of the Braun tube, on which arrangements are made on the Braun tube , , . ~ 1 .
' ,.
~L~52739 to place an optical mask that practically p,events any passing of light from a standard range at a predetermined location, whereas such shape concurrs to the standard wave of the electrical characteristics of an inspected object.
The additional objectsj, features and advantages of the present invention will become apparent in conjunction with the following description taken in conjunction with the accompanying drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
Fig. l and Fig. 2 illustrate the front views of picture screens of Braun tubes on Braun tube oscilloscopes respectively; and , Fig. 3 illustrates a schematic drawing of one example of an inspection system by the present invention.
DESCRIPTION OF THE PREFERRED EMBODIMENTS
One example of the inspection system according to the present invention will be explained in conjunction with Fig. 3.
On Fig. 3, re~erence numeral 1 designates a sweep generator which generates sweep signals on time axes , to the voltage or frequency depending upon the purpose of measure-ments to be made, and such signals therefrom are supplied to objects 2 to be inspected which are electric circuits or circuit elements as an example. The signals that are generated from the swe~p generator l and passed through inspected objects '30 such as electric circuit 2 are supplied to a Braun tube ~2739 - oscillograph 3 so that the characteristics of the inspected electrical circuit 2 is drawn on picture screen PS of the Braun tube as a characteristic curve.
Now in the case of the present invention, an optical shielding mask OM which responds to the values of the upper and lower limits to the standard characteristic curve for the characteristics of the object i.e. electrical circuit 2 to be measured or inspected, in other words, a mask which covers the tolerable value range R of the measured curve as a res-ponding range on the picture screen PS of the Braun tube at a predetermined location where the characteristic curve of the inspected object 2 appears on the picture screen PS, which is at the position responding to the above mentioned tolerance range R so that the.optical mask OM will shield the passing of light from the picture screen PS of the Braun tube under such mask.' Accordingly, upon actual measuring, when the inspected object 2 is a good product or is within standards, the characteristic curve on the picture screen PS is hidden within the optical mask OM ana,there is no spot of light on the picture screen PS. However, when the inspected object 2 is a bad product, in other words, is not within the standards, the characteristic curve on the picture screen PS of the same .escapes the masked range by the mask OM, by which spots of light or the like ap~ear on the picture screen PS. In other ,, words, if the above r:;entioned mask OM is located at a prede-termined position on the picture screen PS of the Braun tube, the good or bad of the inspected object 2 may be inspected by whether spots of light appear or not on the picture screen PS.
Therefore, under the present invention, an optical , 30 sensor 4 such as photodiodes, for instance, is located at a . .
.~ ' .
., ,, desired position in front of the picture screen PS of the Braun tube, such as on the vertical axis of the same, by which whether the optical spot appears or not on the picture screen PS may be detected, and the good or bad of the inspected circuitry 2 may be automatically inspected. In actuality, the output from sensor 4 is passed through amplifier 5 as necessary to supply to an alarm system 6 which contains a buzzer or lamp, etc., to be driven.
According to the present invention, sensor 4 generates an output when a spot of light appears on the picture screen PS, in other words, only when the characteristic curve of the inspected object 2 escapes the masked area by mask OM
or the object 2 is a bad product. Therefore, the only time when the alarm system 6 to which the output from sensor 4 is supplied, generates an alarm is when the inspected object is a reject.
Further, although not shown on the drawing, the output from sensor 4 may be supplied to a comparator, by which the output from sensor 4 will be selected against a properly set~threshold value to enlarge the S/N ratio.
As further matters, in order to prevent the occur-rence of erroneous action by unnecessary outside light mixture other than the spot of light from the picture screen PS to sensor 4, an outer light shielding cover may be installed between the sensor 4 and picture screen PS, or an optical mask which will only pass the spot of light on the picture screen PS may be installed on the picture screen PS or on sensor 4.
In addition, it is also possible to raise the detection sensitivity or resolution ability by using a video camera as the sensor 4.
l~SiZ739 ,, .
- It is also noted that if the optical characteristics of the optical mask OM, for lnstance is so selected that it only passes such light that it is visible for the human being but the sensor 4 does not detect the same, such an advantage is effected that the observer visually checks whether the inspection is being conducted or not.
As above described, according to the present invention, the various electrical characteristics of the inspected object, such as changes within extremely short passing features of nano second orders, for instance, can be accurately and positively automatically be inspected as wave forms and the merits are huge.
Lastly, in the example of the present invention as illustrated on Fig. 3, each elements such as 1, 2, 3, 4, 5 and 6 were separately illustrated for the sake of explanations, but it is obvious that all such elements may be unitized to form a specialized inspection system very easily.
It will be apparent that many modifications and variations could be effected by one skilled i.n the art without departing from the spirits or scope of the novel concepts of the invention.
, . . .
!
Field of the Invention The present invention relates generally to inspec~-tion systems by which the inspection of the characteristics of circuit elements or the like can be automatically inspected, and is directed more specifically to inspection systems that utilize Braun tube oscilloscopes to conduct the automated inspection.
Description of the Prior Art In the recent years, in conjunction with the advance of electronic technologies, electric circui~s have become increasingly of high precision nature, whereas a vast and wide variety of circuit elements are being introduced as new materials, are developed and such processing technology advances. At the same time high demands are being placed for the function or special characteristics of such circuits or elements and in the inspection of such electrical character-istics, such demands may not be satisfied by one point inspection such as the frequency characteristics, spectrum, transient characteristics or distortion ratio, and for instance, precision measurement of changes in relation to time is required.
Normally such above mentioned inspection is conducted by utilizing a Braun tube oscilloscope by taking the voltage or frequency on the time axis which is sweeped to form a wave form on the Braun tube and thereby visually inspecting such ~L~L52739 wave form to check whether the required characteristics are satisfied or not. In the present days, it is co~non that such circuit elements are masproduced and the circumstances to have automated inspection of such electrical characteris- ¦
tics are actually prepared. However, under the present status, it is a fact that systems which will enable such above mentioned inspection automatically are not yet proposed.
As the next step, explanation of an inspection system by utilization of sraun tube oscillographs under the prior art will be made in reference with Fig. 1 and Fig. 2.
Fig. 1 illustrates the front view of a picture screen PS of f the Braun tube oscilloscope. Curve a on this picture screen PS indicates a usually seen band pass characteristics (standard wave) of the high frequency circuit of an object to be inspected, which in this case, the points of inspection, for instance, are the frequency width fl at the skirt of the band characteristic curve a, the frequency band f2 at the top portions, or the indent or drops Ll (level variation) at the top portions. At the inspection of actual circuits, upper and lower limits to be tolerable are established for the values fl, f2 or Ll, and when the curve a stays within such tolerance range, the inspected circuitisaccepted as a qualified product.
Accordingly, in the usual case, as shown on Fig. 2, a standard range R by solid line curves _ and c which indicate the upper and lower t~olerance values to the desired curve a as shown by the dotted line a is imaged on the picture screen PS of the Braun tube, by which the actual curve of an inspected object as drawn on the picture screen PS is visually inspected for whether the curve lies within the standard range R or not.
~1 ~52739 -~ However, from a practical standpoint, in conducting the inspection by imaginary setting of such standard range R
on the picture screen PS with considerations to the nature of the picture screen PS on the Braun tube and the fluctuation of the inspected curve a, difficulties are contained in tne inspection, and precise and positive inspection cannot be anticipated. Further, inspection becomes more difficult when the tolerance range R is small.
In addition, when huge quantities of objects are inspected, many defects get involved, such as the accumulation of inevitable fatigue of the inspector's eye.
OBJECTS AND SU~lARY OF T~E INVENTION
Accordingly, the main purpose of the present invention is to offer an inspection system by which automatic inspection of such above mentioned various characteristics of the electrical circuits may be conducted by utilizing Braun 3 tube oscilloscopes.
The features of the present invention lie in an inspection system which has an optical sensor which produces outputs as reactions to the light from the picture screen of Braun tubes, whereas Braun tube oscilloscopes are used for sweeping the electrical characteristics of inspected objects such as electric circuits or electric circuit elements in relation with time, where such inspection systems are used to inspectl the good or bad of an inspected object by observations of the wave that indicates the electrical characteristics of an inspected object as it appears on the picture screen of the Braun tube, on which arrangements are made on the Braun tube , , . ~ 1 .
' ,.
~L~52739 to place an optical mask that practically p,events any passing of light from a standard range at a predetermined location, whereas such shape concurrs to the standard wave of the electrical characteristics of an inspected object.
The additional objectsj, features and advantages of the present invention will become apparent in conjunction with the following description taken in conjunction with the accompanying drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
Fig. l and Fig. 2 illustrate the front views of picture screens of Braun tubes on Braun tube oscilloscopes respectively; and , Fig. 3 illustrates a schematic drawing of one example of an inspection system by the present invention.
DESCRIPTION OF THE PREFERRED EMBODIMENTS
One example of the inspection system according to the present invention will be explained in conjunction with Fig. 3.
On Fig. 3, re~erence numeral 1 designates a sweep generator which generates sweep signals on time axes , to the voltage or frequency depending upon the purpose of measure-ments to be made, and such signals therefrom are supplied to objects 2 to be inspected which are electric circuits or circuit elements as an example. The signals that are generated from the swe~p generator l and passed through inspected objects '30 such as electric circuit 2 are supplied to a Braun tube ~2739 - oscillograph 3 so that the characteristics of the inspected electrical circuit 2 is drawn on picture screen PS of the Braun tube as a characteristic curve.
Now in the case of the present invention, an optical shielding mask OM which responds to the values of the upper and lower limits to the standard characteristic curve for the characteristics of the object i.e. electrical circuit 2 to be measured or inspected, in other words, a mask which covers the tolerable value range R of the measured curve as a res-ponding range on the picture screen PS of the Braun tube at a predetermined location where the characteristic curve of the inspected object 2 appears on the picture screen PS, which is at the position responding to the above mentioned tolerance range R so that the.optical mask OM will shield the passing of light from the picture screen PS of the Braun tube under such mask.' Accordingly, upon actual measuring, when the inspected object 2 is a good product or is within standards, the characteristic curve on the picture screen PS is hidden within the optical mask OM ana,there is no spot of light on the picture screen PS. However, when the inspected object 2 is a bad product, in other words, is not within the standards, the characteristic curve on the picture screen PS of the same .escapes the masked range by the mask OM, by which spots of light or the like ap~ear on the picture screen PS. In other ,, words, if the above r:;entioned mask OM is located at a prede-termined position on the picture screen PS of the Braun tube, the good or bad of the inspected object 2 may be inspected by whether spots of light appear or not on the picture screen PS.
Therefore, under the present invention, an optical , 30 sensor 4 such as photodiodes, for instance, is located at a . .
.~ ' .
., ,, desired position in front of the picture screen PS of the Braun tube, such as on the vertical axis of the same, by which whether the optical spot appears or not on the picture screen PS may be detected, and the good or bad of the inspected circuitry 2 may be automatically inspected. In actuality, the output from sensor 4 is passed through amplifier 5 as necessary to supply to an alarm system 6 which contains a buzzer or lamp, etc., to be driven.
According to the present invention, sensor 4 generates an output when a spot of light appears on the picture screen PS, in other words, only when the characteristic curve of the inspected object 2 escapes the masked area by mask OM
or the object 2 is a bad product. Therefore, the only time when the alarm system 6 to which the output from sensor 4 is supplied, generates an alarm is when the inspected object is a reject.
Further, although not shown on the drawing, the output from sensor 4 may be supplied to a comparator, by which the output from sensor 4 will be selected against a properly set~threshold value to enlarge the S/N ratio.
As further matters, in order to prevent the occur-rence of erroneous action by unnecessary outside light mixture other than the spot of light from the picture screen PS to sensor 4, an outer light shielding cover may be installed between the sensor 4 and picture screen PS, or an optical mask which will only pass the spot of light on the picture screen PS may be installed on the picture screen PS or on sensor 4.
In addition, it is also possible to raise the detection sensitivity or resolution ability by using a video camera as the sensor 4.
l~SiZ739 ,, .
- It is also noted that if the optical characteristics of the optical mask OM, for lnstance is so selected that it only passes such light that it is visible for the human being but the sensor 4 does not detect the same, such an advantage is effected that the observer visually checks whether the inspection is being conducted or not.
As above described, according to the present invention, the various electrical characteristics of the inspected object, such as changes within extremely short passing features of nano second orders, for instance, can be accurately and positively automatically be inspected as wave forms and the merits are huge.
Lastly, in the example of the present invention as illustrated on Fig. 3, each elements such as 1, 2, 3, 4, 5 and 6 were separately illustrated for the sake of explanations, but it is obvious that all such elements may be unitized to form a specialized inspection system very easily.
It will be apparent that many modifications and variations could be effected by one skilled i.n the art without departing from the spirits or scope of the novel concepts of the invention.
, . . .
!
Claims (4)
1. An inspection system utilizing a Braun tube oscilloscope and inspecting electrical characteristics of objects such as electric circuit elements or the like, in which the electrical characteristics are swept in relation to time to form corresponding waveforms on a Braun tube of the Braun tube oscilloscope and the waveforms are observed to inspect whether said objects are good or not, comprising:
a) an optical mask means made of such a material substantially preventing passage of light appearing on a picture screen of said Braun tube as the electrical chacter-istics of said object and having a shape corresponding to a standard waveform for the electrical character-istics of the objects, said optical mask means being located on said picture screen at a predetermined position; and b) an optical sensor means for sensing a light emitted from said picture screen to generate an electrical output.
a) an optical mask means made of such a material substantially preventing passage of light appearing on a picture screen of said Braun tube as the electrical chacter-istics of said object and having a shape corresponding to a standard waveform for the electrical character-istics of the objects, said optical mask means being located on said picture screen at a predetermined position; and b) an optical sensor means for sensing a light emitted from said picture screen to generate an electrical output.
2. An inspection system as claimed in claim 1 further comprising an alarm means connected to said optical sensor means to provide an alarm when said optical sensor means generates the electrical output.
3. An inspection system as claimed in claim 1 further comprising a comparator means which is supplied with the output from said optical sensor means to select the output based upon a desired threshold value to increase a signal-to-noise ratio.
4. An inspection system as claimed in claim 1 further comprising a light shielding means provided between said picture screen and said sensor means to prevent undesired light from being incident on said optical sensor means.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP37155/1980 | 1980-03-24 | ||
| JP3715580A JPS56133667A (en) | 1980-03-24 | 1980-03-24 | Inspecting device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1152739A true CA1152739A (en) | 1983-08-30 |
Family
ID=12489705
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA000373620A Expired CA1152739A (en) | 1980-03-24 | 1981-03-23 | Inspection system |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JPS56133667A (en) |
| CA (1) | CA1152739A (en) |
| DE (1) | DE3111351A1 (en) |
| FR (1) | FR2478821B1 (en) |
| GB (1) | GB2072862B (en) |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| LU54931A1 (en) * | 1967-11-21 | 1969-07-07 | ||
| US3543148A (en) * | 1968-12-16 | 1970-11-24 | Siemens Ag | Apparatus for automatic testing of electrical devices by testing their characteristic curves for excess of tolerance zones |
| DE2209980A1 (en) * | 1972-03-02 | 1973-09-06 | Licentia Gmbh | DEVICE FOR MEASURING DETERMINATION OR CONTROL OF THE MEASURING DATA OF A MEASURING OBJECT |
| FR2417785A1 (en) * | 1978-02-17 | 1979-09-14 | Thomson Csf | Camera to oscilloscope optical coupling - consists of rigid rectangular tube with adjustable camera position |
| JPS56142372U (en) * | 1980-03-24 | 1981-10-27 |
-
1980
- 1980-03-24 JP JP3715580A patent/JPS56133667A/en active Pending
-
1981
- 1981-03-12 GB GB8107733A patent/GB2072862B/en not_active Expired
- 1981-03-23 DE DE19813111351 patent/DE3111351A1/en active Granted
- 1981-03-23 FR FR8105737A patent/FR2478821B1/en not_active Expired
- 1981-03-23 CA CA000373620A patent/CA1152739A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| GB2072862B (en) | 1984-07-11 |
| JPS56133667A (en) | 1981-10-19 |
| DE3111351A1 (en) | 1982-05-13 |
| FR2478821B1 (en) | 1985-09-27 |
| GB2072862A (en) | 1981-10-07 |
| DE3111351C2 (en) | 1993-08-05 |
| FR2478821A1 (en) | 1981-09-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MKEX | Expiry |