CA1140333A - Dual sweep laser spotlights and image analyzer for contour and distance mensuration - Google Patents

Dual sweep laser spotlights and image analyzer for contour and distance mensuration

Info

Publication number
CA1140333A
CA1140333A CA000344400A CA344400A CA1140333A CA 1140333 A CA1140333 A CA 1140333A CA 000344400 A CA000344400 A CA 000344400A CA 344400 A CA344400 A CA 344400A CA 1140333 A CA1140333 A CA 1140333A
Authority
CA
Canada
Prior art keywords
beams
workpiece
mirrors
light
determining
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA000344400A
Other languages
French (fr)
Inventor
Hans Richter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HA Schlatter AG
Original Assignee
HA Schlatter AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by HA Schlatter AG filed Critical HA Schlatter AG
Application granted granted Critical
Publication of CA1140333A publication Critical patent/CA1140333A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

METHOD FOR MEASURING DISTANCES AND APPARATUS FOR PERFORMING
THE METHOD
ABSTRACT OF THE DISCLOSURE
A method for measuring distances and for determining the three-dimensional contour of a workpiece, wherein two intersecting light beams are directed onto the workpiece, the light points produced by the beams on the workpiece surface are determined and the angle of inclination of the striking beam in the common plane thereof is measured.

Description

Method for measuring distances and ap~aratus for performin~ the method.
The invention relates to a method for rneasuring distances and for determining the three-dimensional contour of a workpiece and also relates to apparatuses for performing the method.
When measuring distances and when determining the three-dimensional contour of a workpiece it is known to use mechanical calipers, which determine the distance or scan the three-dimensional contour of a workpiece. The scanned values are converted into electrical signals by transducers and these signals are then indicated or stored. These measuring methods are time-consunning and can only be used if the distance to be measured is within the given range or the contour to be determined permits a mechanical scanning. It is also known to measure distances electronically or electron-optically. The microwaves or light waves emitted by a transmitter are reflected and collected by a receiver. The phase difference between the emitted and the received wave serves as a measure for the distance. However, such measuring methods are complicated and are only used when rneasuring long distances.
The problem of the invention is thereforè to so further develop a contactless distance rneasuring method that it is possible in a simple marmer to measure distances and three-dirnensional contours in the range of up to a few metres.
This problern is solved by the features of claim 1. Advantageous further developments can be gathered 3~

01 from the subclaims.
02 The present measuring method .is particularly suitable 03 for operating devices for recognising opticals which are not 04 programmed in and for determining the distance, shape and 05 posi-tion of workpieces, which are to be determined by the 06 operating device and whose contour has previously been 07 electronically stored.
08 In general, the invention is a method for measuring 09 distances and for determining the three-dimensional contour of a workpiece comprising directing two light beams of different 11 wavelengths onto the workpiece, pivoting -the beams in their 12 common plane, pivoting the common plane around an axis which is 13 common to the plane, measuring the angles of inclination of the 14 lightpoints produced by the beams on the workpiece surface in the different wavelengths, determining the position o:E the 16 image of each light point and calculating the distances and the 17 contour using the angles of inclination and the positions of 18 the images.
19 The invention is also an apparatus for measuring distances and for determining the three-dimensional contour of 21 a workpiece comprising apparatus for directing a pair of light 22 beams of different waveleng-ths onto the workpiece, a pair of 23 spaced mirrors, each adapted to reflect one of the beams, 24 apparatus for swivelling -the mirrors to change the angles of the mirrors, a collecting optic Eor collecting the images of 26 the light points produced by the beams on the workpiece 27 surface, a semi-transparen-t mirror arranged behind the 28 collec-ting optic for permitting the passage of a part o:E the 29 light to a first screen, sensi-tive to light of one of the wavelengths and reflecting another part oE -the light to a 31 second screen, sensitive to the light oE the o-ther wavelength, 32 and appara-tus for determining the angles of -the mirrors.

37 ~ 2 -l~V333 01 Embodiments of the invention are explained 02 hereinafter relative to the drawings, wherein show:
03 Fig. 1 a first embodiment of the apparatus for 04 performing the method.
05 Fig. 2 a second preferred embodiment.
06 In the embodimen-t according to Fig. 1 the two laser 07 beam generators 1, 2 generate light beams 3, 4 which have 08 different wavelengths, for example the light beam 3 is blue and 09 the light beam 4 is red. The two light beams 3, 4 are deflected by the mirrors 5, 6 and intersect at point 7. To 11 this end, the two mirrors 5, 6 are slightly inclined towards 12 one another. Mirrors 5, 6 can be rotated about the points 8, 9 13 and are articulated to a common swivel mechanism 10. The 14 swivelling movement of the two mirrors 5, 6 is performed by a motor 11, which is schematically indicated. In this way, the 16 mirrors 5, 6 perform a reciprocating swivelling movement, the 17 particular mirror position being read electrically by a motor 18 11.
19 The two intersecting beams 3, 4 strike the workpiece surface 12 at different points. The impact point of the blue 21 beam 3 is indicated by the reference numeral 13 and that of the 22 red beam by 14.

- 2a ~4(~33 ~3--These light points are determined by a collecting optics/5 and are projected onto a semi-transparent mirror 16. This sernitransparent mirror separates the light in accordance with the different wavelengths, for example the blue light is permitted to pass through and the red light is reflected. A
photodiode screen 17 is positioned behind the semi-transparent mirror 16 inclined by 45. A further photo-diode screen 18 is positioned at right angles to the first screen.
In this way, the blue light point 13 is irnaged on screen 17 and the red light point 14 on screen 18.
The distance on the workpiece contour 12 between points 13 and 14 can now be calculated through the position of mirrors 5, 6, whose value is read by motor 11 and by the coordinates of the imaging points on screen 18, 17.
If the workpiece contour 12' is more on the measuring device, then in the case of the same mirror position the light points 13', 14' are closer together, so that the coordinates of the imaging points on the screen 17, 18 have changed. In this way, it is possible to completely satisfactorily calculate the distarlce and contour along a coordinate.
The complete measuring apparatus can be pivoted along an axis 19, so that the contours parallel to contour l2 can also be determined. However, it is also possible to provide ~ further swivelling mirror arrangement, as will be described hereinafter in con-conjunction with Fig 2.
In the embodiment of ~ig 2, only one laser beam generator 20 is provided The laser beam generated by it strikes a rigidly arranged semitransparent mirror 21, which permits the passage of part of the beam and reflects a f~lrther part thereof. The reflected beam portion strikes a mirror22, whilst the beam portion which has passed through strikes a mirror 23.
Milror 22 is pivoted at 24 and mirror 23 at 25. By means of lever arms they are connected in each case to separate swivel drives 26, 27. The position of the mirror is read electrically through the position of the swivel drive 26, 27. The measuring apparatus has a collecting optics 28 and a photodiode screen 29.
The swivel drive 27 moves rapidly, whilst swivel drive 26 moves slowly in comparison therewith.
This means that the beam 30 -reciprocates rapidly and beam 31 reciprocates slowly. Thus, beam 30 noves along beam 31. The two beams 30, 31 strike the Material surface 32 where they produce separate light points.
The latter are imaged on screen 29. If the beams 30, 31 intersect on material surface 32 a common impact and intersection point 33 is obtained. Correspondingly, only one imaging point 34 is formed on screen 29. In this case, i.e. if screen 29 only records a single imaging point 34, a call signal is given ~y screen 29 which determines the position of the swivel drives 26, 27 at this moment and consequently the position of mirrors 22, 23. The position o~ rnirrors 22, 23 is a measure of the distance from impact point 33. The con-tour 35 of workpiece surface 32 can be scan-ned with this arrangement.

01 For scanning the adjacent contour 35' a 02 further swivel mirror 36 is provided and the beams 03 reflected by mirrors 22, 23 strike mirror 36 and are 04 then reflected again. The position of mirror 36 is 05 determined by a swivel drive 37.
06 If the semitransparent mirror 16 shown in 07 Figure 1 does not perform a colour separation a red and 08 a blue filter 38, 39 can be positioned in front of the 09 relevant screen 17, 18.
The angular position ~ and ~ of the beam 11 striking the material surface and the coordinates of the 12 imaging points 13, 14 on screen 17, 18 or the 13 coordinates of the imaging points 34 of the intersection 14 point 33 on screen 29 are important for the present method.
16 In the embodiment according to Fig. 1, the 17 angles d and ~ are directly related with one another 18 due to the common swivel mechanism. Thus, a particular 19 angular position ~ and ~ is associated with each swivel mechanism position. Thus, the distance between 21 points 13 and 14 determined by the imaging coordinates 22 on screen 17, 18 is determinative for the distance 23 between the measuring device and contour 12 for a given 24 angular position ~ , ~ . Thus, for distance measurements a given position of the swivel mechanism is 26 determined which corresponds to a given angular position 27 ~ , ~ and the imaging coordinates of points 13, 14 28 are measured. The position oE the swivel mechanism and 29 the imaging coordinates are fed into a computer which, for the particular angular position c~ , ~ calculates 31 the ~4~333 distance between points 13 and 14 and from said distance value and the angular position d,/3 calculates the distance between the measuring device and points 13, 14.
If this is performed for successive angular positions d,f3 the computer calculates the distance of the measuring device from each point of contour 12 and consequently also the course of the contour. This procedure can be performed in punctiform digital or continuous analog manner.
In the embodiment of Fig 2, the particular angular position d , ~ is determined when the beams 30, 31 intersect on contour 35, i.e~ only one point appears on the screen 29. The distance between the measuring device and point 33 is then calculated from the values d and /3 which are supplied to a computer. The processing of the coordinates of imaging points 34 is not necessary, but can be carried out in order to increase the reliability of the rneasurement. If the said distance measurement is performed along the con-tour 35, it is possible to determine the d;stance of each point on contour 35 and consequently also the course of the actual contour.

.

Claims (11)

The embodiments of the invention in which an exclusive property or privilege is claimed are defined as follows:
1. A method for measuring distances and for determining the three-dimensional contour of a workpiece comprising directing two light beams of different wavelengths onto the workpiece, pivoting the beams in their common plane, pivoting the common plane around an axis which is common to said plane, measuring the angles of inclination of the lightpoints produced by the beams on the workpiece surface in the different wavelengths, determining the position of the image of each lightpoint and calculating the distances and the contour using the angles of inclination and the postions of the images.
2. A method for measuring distances and for determining the three-dimensional contour of a workpiece comprising directing two light beams onto the workpiece, pivoting the beams in their common plane with different velocities, pivoting the common plane around an axis which is common to said plane, measuring the angles of inclination of each beam in the common plane when the beams intersect on the workpiece surface, determining the position of the image of the intersection lightpoint produced by the beams on the workpiece surface and calculating the distances and the contour using the angles of inclination and the position of the image of the intersection lightpoint.
3. An apparatus for measuring distances and for determining the three-dimensional contour of a workpiece comprising means for directing a pair of light beams of different wavelengths onto the workpiece, a pair of spaced mirrors, each adapted to reflect one of the beams, means for swivelling the mirrors to change the angles of the mirrors, a collecting optic for collecting the images of the light points produced by said beams on the workpiece surface, a semi-transparent mirror arranged behind the collecting optic for permitting the passage of a part of the light to a first screen, sensitive to light of one of the wavelengths and reflecting another part of the light to a second screen, sensitive to the light of the other wavelength, and means for determining the angles of the mirrors.
4. An apparatus for measuring distances and for determining the three-dimensional contour of a workpiece comprising means for directing a pair of lightbeams onto the workpiece, a pair of spaced mirrors, each adapted to reflect one of the beams, separate swivelling mechanisms for swivelling the mirrors to change the angles of the mirrors with different velocities, a collecting optic for collecting the images of the lightpoints produced by said beams on the workpiece surface, a screen arranged behind the collecting optic and means for determining the angles of the mirrors when a single lightpoint is imaged on the screen.
5. An apparatus according to claim 3, wherein said means for swivelling is a common mechanism for swivelling the mirrors.
6. An apparatus according to one of the claims 3 or 4, including a further swivelling mirror for deflecting the beams from said pair of mirrors, and means for measuring the position of the further mirror.
7. An apparatus according to one of the claims 3 or 4 in which the beams are laser beams.
8. An apparatus according to claim 3 further including two laser beam generators for generating said light beams, each with a different wavelength.
9. An apparatus according to claim 4 further including one laser beam generator for generating a single source beam, and a fixed semitransparent mirror for splitting the source beam into said pair of light beams located between the generator and two other mirrors.
10. An apparatus according to one of the claims 3 or 4, in which the screen is a photodiode array.
11. An apparatus according to claim 3 further including a filter in front of each of the screens, one filter permitting the passage of light of one wavelength and the other permitting the passage of light of the over wavelength.
CA000344400A 1979-01-31 1980-01-25 Dual sweep laser spotlights and image analyzer for contour and distance mensuration Expired CA1140333A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19792903529 DE2903529A1 (en) 1979-01-31 1979-01-31 METHOD FOR MEASURING DISTANCES AND DEVICE FOR CARRYING OUT THE METHOD
DEP2903529.8 1979-01-31

Publications (1)

Publication Number Publication Date
CA1140333A true CA1140333A (en) 1983-02-01

Family

ID=6061748

Family Applications (1)

Application Number Title Priority Date Filing Date
CA000344400A Expired CA1140333A (en) 1979-01-31 1980-01-25 Dual sweep laser spotlights and image analyzer for contour and distance mensuration

Country Status (8)

Country Link
JP (1) JPS55103403A (en)
CA (1) CA1140333A (en)
DE (1) DE2903529A1 (en)
ES (1) ES488053A1 (en)
FR (1) FR2448125A1 (en)
GB (1) GB2041690B (en)
NL (1) NL8000561A (en)
SE (1) SE8000727L (en)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3207382C2 (en) * 1982-03-02 1986-10-16 Messerschmitt-Bölkow-Blohm GmbH, 8000 München Scanning laser range finder
DE3244358C2 (en) * 1982-12-01 1984-10-04 Daimler-Benz Ag, 7000 Stuttgart Device for detecting obstacles as a maneuvering aid when parking or turning a motor vehicle
DE3342675A1 (en) * 1983-11-25 1985-06-05 Fa. Carl Zeiss, 7920 Heidenheim METHOD AND DEVICE FOR CONTACTLESS MEASUREMENT OF OBJECTS
US4687325A (en) * 1985-03-28 1987-08-18 General Electric Company Three-dimensional range camera
FR2589242B1 (en) * 1985-10-25 1988-11-25 Oreal PROCESS FOR EXAMINING THE SURFACE OF A SAMPLE AND APPARATUS FOR IMPLEMENTING SAME
NL8503182A (en) * 1985-11-19 1987-06-16 Philips Nv DEVICE FOR MEASURING A SURFACE PROFILE ALONG OPTICAL ROAD.
FR2621999A1 (en) * 1987-10-20 1989-04-21 Annoni Henri Method for determining the coordinates of the points of the outline of an object in space
AU598418B2 (en) * 1988-06-04 1990-06-21 Fujitsu Limited Optical system for detecting three-dimensional shape
US5061062A (en) * 1990-07-02 1991-10-29 General Electric Company Focus spot size controller for a variable depth range camera
DE4112009A1 (en) * 1991-04-12 1992-10-22 Diehl Gmbh & Co MEASURING SYSTEM FOR CONTACT-FREE DETECTION OF THE CONTOUR OF LONG OBJECTS WITH DIFFUSING REFLECTING SURFACE
DE4212438A1 (en) * 1992-04-14 1993-10-21 Dirk Prof Dr Ing Jansen Lateral beam offset generator for trigonometrical distance measurement of workpiece - has laser diode providing point illumination of workpiece, and planar parallel glass plate between workpiece and measuring head, with rotatable axis
DE4218219C2 (en) * 1992-06-03 1998-05-07 Geyer Medizin Und Fertigungste Device for the contactless measurement of a difficult to access, three-dimensional medical or dental object
US5708498A (en) * 1996-03-04 1998-01-13 National Research Council Of Canada Three dimensional color imaging
GB9713680D0 (en) 1997-06-27 1997-09-03 Keymed Medicals & Ind Equip Improvements in or relating to optical scopes with measuring systems
EP2778601A1 (en) * 2013-03-15 2014-09-17 Siemens Healthcare Diagnostics Inc. Optical metrology by light beam analysis

Also Published As

Publication number Publication date
GB2041690B (en) 1983-05-25
DE2903529A1 (en) 1980-08-07
ES488053A1 (en) 1980-09-16
FR2448125A1 (en) 1980-08-29
GB2041690A (en) 1980-09-10
SE8000727L (en) 1980-08-01
NL8000561A (en) 1980-08-04
JPS55103403A (en) 1980-08-07

Similar Documents

Publication Publication Date Title
CA1140333A (en) Dual sweep laser spotlights and image analyzer for contour and distance mensuration
US4325639A (en) Method for measuring distances and apparatus for performing the method
US6480269B2 (en) Angle detection method for bending machine, angle detection apparatus and angle sensor
US4873449A (en) Process and apparatus for three-dimensional surveying
US4171917A (en) Determining the profile of a surface of an object
JPH061249B2 (en) Panel surface inspection method and device
JPS626108A (en) Sweep type flying-spot contour determining device
WO1995013520A1 (en) Determination of the surface properties of an object
JPH04232580A (en) Method and apparatus for forming three-dimensional color image
AU637125B2 (en) Collision-protection device for conveying appliances
US4981353A (en) Position locating apparatus for an underwater moving body
EP0877225A2 (en) Optical surface measurement apparatus and methods
US4790660A (en) Shape measuring instrument
US5568258A (en) Method and device for measuring distortion of a transmitting beam or a surface shape of a three-dimensional object
US4192612A (en) Device for contact-free thickness measurement
US4227812A (en) Method of determining a dimension of an article
JP3377820B2 (en) Surface curvature measurement device
JPH0694417A (en) Pointing device for spot light and measuring device for three-dimensional position
US4296333A (en) Method and apparatus for detecting surface defects in a workpiece
JPH09505883A (en) Equipment for measuring the dimensions of large objects
JP5487920B2 (en) Optical three-dimensional shape measuring apparatus and optical three-dimensional shape measuring method
JP2642459B2 (en) Ultrasonic inspection image processing equipment
JPS62247203A (en) Noncontact type surface irregularity measurement method
GB1364269A (en) Apparatus for examining reflecting surfaces
EP0415405B1 (en) Device for obtaining distance information from an object by instantaneously illuminating the object by a light beam

Legal Events

Date Code Title Description
MKEX Expiry