CA1102579A - Method of measuring the amount of substance associated with a material in the presence of a contaminant - Google Patents

Method of measuring the amount of substance associated with a material in the presence of a contaminant

Info

Publication number
CA1102579A
CA1102579A CA320,074A CA320074A CA1102579A CA 1102579 A CA1102579 A CA 1102579A CA 320074 A CA320074 A CA 320074A CA 1102579 A CA1102579 A CA 1102579A
Authority
CA
Canada
Prior art keywords
band
absorption
lies
intensity
substance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA320,074A
Other languages
English (en)
French (fr)
Inventor
Lee M. Chase
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honeywell Measurex Corp
Original Assignee
Measurex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Measurex Corp filed Critical Measurex Corp
Application granted granted Critical
Publication of CA1102579A publication Critical patent/CA1102579A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CA320,074A 1978-02-03 1979-01-22 Method of measuring the amount of substance associated with a material in the presence of a contaminant Expired CA1102579A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US87477778A 1978-02-03 1978-02-03
US874,777 1978-02-03

Publications (1)

Publication Number Publication Date
CA1102579A true CA1102579A (en) 1981-06-09

Family

ID=25364556

Family Applications (1)

Application Number Title Priority Date Filing Date
CA320,074A Expired CA1102579A (en) 1978-02-03 1979-01-22 Method of measuring the amount of substance associated with a material in the presence of a contaminant

Country Status (5)

Country Link
JP (1) JPS54114294A (enrdf_load_stackoverflow)
CA (1) CA1102579A (enrdf_load_stackoverflow)
FR (1) FR2416466A1 (enrdf_load_stackoverflow)
GB (1) GB2013881B (enrdf_load_stackoverflow)
SE (1) SE7900926L (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4602160A (en) * 1983-09-28 1986-07-22 Sentrol Systems Ltd. Infrared constituent analyzer and control system
JPS6242035A (ja) * 1985-08-19 1987-02-24 Yunisoku:Kk 葉たばこの乾燥度検出装置
JPH0372346U (enrdf_load_stackoverflow) * 1989-11-20 1991-07-22
DE19520035C1 (de) * 1995-03-31 1996-11-07 Gta Sensorik Gmbh Verfahren zur berührungslosen Messung der Oberflächenfeuchte von Objekten
JP2014016373A (ja) * 2013-10-30 2014-01-30 Fujifilm Corp 塗布膜中の成分量の測定方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3614450A (en) * 1969-02-17 1971-10-19 Measurex Corp Apparatus for measuring the amount of a substance that is associated with a base material
CA1000406A (en) * 1972-10-27 1976-11-23 Measurex Corporation Moisture gauge with opacity type compensation
US3851175A (en) * 1972-10-27 1974-11-26 Measurex Corp Moisture gauge with opacity type compensation
US4006358A (en) * 1975-06-12 1977-02-01 Measurex Corporation Method and apparatus for measuring the amount of moisture that is associated with a web of moving material

Also Published As

Publication number Publication date
GB2013881A (en) 1979-08-15
GB2013881B (en) 1982-06-16
JPS54114294A (en) 1979-09-06
FR2416466A1 (fr) 1979-08-31
SE7900926L (sv) 1979-08-04
FR2416466B1 (enrdf_load_stackoverflow) 1983-06-24

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Legal Events

Date Code Title Description
MKEX Expiry