CA1073552A - Constant modulation index technique for measuring the derivatives of device parameters - Google Patents
Constant modulation index technique for measuring the derivatives of device parametersInfo
- Publication number
- CA1073552A CA1073552A CA278,370A CA278370A CA1073552A CA 1073552 A CA1073552 A CA 1073552A CA 278370 A CA278370 A CA 278370A CA 1073552 A CA1073552 A CA 1073552A
- Authority
- CA
- Canada
- Prior art keywords
- current
- laser
- signal
- generating
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000034 method Methods 0.000 title claims abstract description 28
- 230000004044 response Effects 0.000 claims abstract description 17
- 238000005259 measurement Methods 0.000 abstract description 6
- 238000001514 detection method Methods 0.000 description 5
- 230000008901 benefit Effects 0.000 description 4
- 238000011835 investigation Methods 0.000 description 3
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 241000155250 Iole Species 0.000 description 1
- 238000005481 NMR spectroscopy Methods 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000001579 optical reflectometry Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/0014—Measuring characteristics or properties thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/068—Stabilisation of laser output parameters
- H01S5/06812—Stabilisation of laser output parameters by monitoring or fixing the threshold current or other specific points of the L-I or V-I characteristics
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Semiconductor Lasers (AREA)
- Led Devices (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/698,185 US4062632A (en) | 1976-06-21 | 1976-06-21 | Constant modulation index technique for measuring the derivatives of device parameters |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1073552A true CA1073552A (en) | 1980-03-11 |
Family
ID=24804242
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA278,370A Expired CA1073552A (en) | 1976-06-21 | 1977-05-13 | Constant modulation index technique for measuring the derivatives of device parameters |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US4062632A (cg-RX-API-DMAC7.html) |
| JP (1) | JPS52156589A (cg-RX-API-DMAC7.html) |
| CA (1) | CA1073552A (cg-RX-API-DMAC7.html) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4106096A (en) * | 1976-08-30 | 1978-08-08 | Bell Telephone Laboratories, Incorporated | Derivative measurement by frequency mixing |
| JPS61135175A (ja) * | 1984-12-05 | 1986-06-23 | Fujitsu Ltd | 半導体レ−ザの発振しきい値電流測定方法 |
| US4680810A (en) * | 1985-06-28 | 1987-07-14 | American Telephone And Telegraph Company, At&T Bell Labs | Means for controlling a semiconductor device and communication system comprising the means |
| US4795976A (en) * | 1987-01-15 | 1989-01-03 | American Telephone And Telegraph Company At&T Bell Laboratories | Apparatus and derivative technique for testing devices |
| US4870352A (en) * | 1988-07-05 | 1989-09-26 | Fibertek, Inc. | Contactless current probe based on electron tunneling |
| US5034334A (en) * | 1989-10-13 | 1991-07-23 | At&T Bell Laboratories | Method of producing a semiconductor laser adapted for use in an analog optical communications system |
| US6043872A (en) * | 1994-06-22 | 2000-03-28 | Nec Corporation | Method and apparatus for determining defectiveness/non-defectiveness of a semiconductor laser by examining an optical output from the semiconductor laser |
| GB9421329D0 (en) * | 1994-10-22 | 1994-12-07 | Bt & D Technologies Ltd | Laser bias control system |
| JP3535002B2 (ja) * | 1998-02-09 | 2004-06-07 | 日本電信電話株式会社 | 半導体レ―ザの良否判別法 |
| JP2001033513A (ja) * | 1999-07-19 | 2001-02-09 | Nippon Telegr & Teleph Corp <Ntt> | 半導体光素子の特性測定方法及び特性測定プログラムを記録した記録媒体 |
| GB2525187B (en) * | 2014-04-14 | 2020-02-12 | Univ Cranfield | Wavelength control of laser diodes |
-
1976
- 1976-06-21 US US05/698,185 patent/US4062632A/en not_active Expired - Lifetime
-
1977
- 1977-05-13 CA CA278,370A patent/CA1073552A/en not_active Expired
- 1977-06-21 JP JP7292577A patent/JPS52156589A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| US4062632A (en) | 1977-12-13 |
| JPS52156589A (en) | 1977-12-27 |
| JPS6126240B2 (cg-RX-API-DMAC7.html) | 1986-06-19 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MKEX | Expiry |