CA1025204A - Methode et dispositif de mesure d'epaisseurs de filaments ou de largeurs de fentes - Google Patents

Methode et dispositif de mesure d'epaisseurs de filaments ou de largeurs de fentes

Info

Publication number
CA1025204A
CA1025204A CA220,037A CA220037A CA1025204A CA 1025204 A CA1025204 A CA 1025204A CA 220037 A CA220037 A CA 220037A CA 1025204 A CA1025204 A CA 1025204A
Authority
CA
Canada
Prior art keywords
filament
slit size
size monitoring
monitoring
slit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA220,037A
Other languages
English (en)
Other versions
CA220037S (en
Inventor
Sandor Holly
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Atlantic Research Corp
Original Assignee
Atlantic Research Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atlantic Research Corp filed Critical Atlantic Research Corp
Application granted granted Critical
Publication of CA1025204A publication Critical patent/CA1025204A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G01B11/046—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring width
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CA220,037A 1974-03-25 1975-02-13 Methode et dispositif de mesure d'epaisseurs de filaments ou de largeurs de fentes Expired CA1025204A (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US45133274A 1974-03-25 1974-03-25
US05/539,198 US3953128A (en) 1974-03-25 1975-01-06 Process and apparatus for filament or slit size monitoring

Publications (1)

Publication Number Publication Date
CA1025204A true CA1025204A (fr) 1978-01-31

Family

ID=27036331

Family Applications (1)

Application Number Title Priority Date Filing Date
CA220,037A Expired CA1025204A (fr) 1974-03-25 1975-02-13 Methode et dispositif de mesure d'epaisseurs de filaments ou de largeurs de fentes

Country Status (6)

Country Link
US (1) US3953128A (fr)
JP (1) JPS50136058A (fr)
CA (1) CA1025204A (fr)
DE (1) DE2512771A1 (fr)
FR (1) FR2266142A1 (fr)
GB (1) GB1493967A (fr)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4030830A (en) * 1976-01-05 1977-06-21 Atlantic Research Corporation Process and apparatus for sensing defects on a smooth surface
US4259009A (en) * 1979-07-30 1981-03-31 The United States Of America As Represented By The Secretary Of The Navy Far field target designators
US4360270A (en) * 1981-02-17 1982-11-23 Jeck Richard K Calibration and testing device for optical, single particle, size spectrometers
US4526471A (en) * 1982-06-17 1985-07-02 Bykov Anatoly P Method for sensing spatial coordinate of article point and apparatus therefor
US4596036A (en) * 1983-08-31 1986-06-17 The United States Of America As Represented By The United States Department Of Energy Method and apparatus for fringe-scanning chromosome analysis
US4764680A (en) * 1987-04-14 1988-08-16 United Technologies Corporation Method of and arrangement for testing cylindrical objects for shape deviations
AT396181B (de) * 1990-12-10 1993-06-25 Sprecher Energie Oesterreich Einrichtung zum erfassen der masse eines gegebenenfalls bewegten gegenstandes
US5383024A (en) * 1992-08-12 1995-01-17 Martin Marietta Energy Systems, Inc. Optical wet steam monitor
US5682236A (en) * 1993-07-02 1997-10-28 Metrolaser Remote measurement of near-surface physical properties using optically smart surfaces
US5432605A (en) * 1993-07-19 1995-07-11 Tsi Incorporated Interferometric cylinder sizing and velocimetry device
US5625453A (en) * 1993-10-26 1997-04-29 Canon Kabushiki Kaisha System and method for detecting the relative positional deviation between diffraction gratings and for measuring the width of a line constituting a diffraction grating
US5513004A (en) * 1994-08-12 1996-04-30 Tsi Incorporated Device for interferometric measurements with compensation for tilt and position of measured cylindrical objects
US5784160A (en) * 1995-10-10 1998-07-21 Tsi Corporation Non-contact interferometric sizing of stochastic particles
US5684587A (en) * 1996-07-05 1997-11-04 Tsi Incorporated Device and process for interferometric sizing of particles using spatial filtering of scattered radiation
US7072051B1 (en) 2002-05-09 2006-07-04 Powerscope Incorporated Laser diffraction process and apparatus for width measurement of elongated objects
DE102006001731A1 (de) * 2006-01-13 2007-07-19 Robert Bosch Gmbh Heterodyninterferometer
DE102006035251A1 (de) * 2006-07-26 2008-01-31 Vienco Gmbh Verfahren und Anordnung zur Bestimmung der Garnqualität und/oder Spulenqualität eines laufenden Fadens auf Basis der Laser-Doppler-Anemometrie
WO2014029038A1 (fr) * 2012-08-20 2014-02-27 Uster Technologies Ag Caractérisation d'une unité de mesure optoélectronique pour un objet d'analyse textile
CN112378356B (zh) * 2020-11-12 2022-02-11 中建八局第三建设有限公司 混凝土内部裂缝宽度测量装置及测量方法
CN112871717B (zh) * 2021-03-24 2022-10-25 长春理工大学 钢球直径高精度分选装置及方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3141057A (en) * 1961-02-15 1964-07-14 Gen Electric Non-contacting measuring apparatus
US3680961A (en) * 1970-06-01 1972-08-01 British Aircraft Corp Ltd Measurement of particle sizes
US3830568A (en) * 1973-05-25 1974-08-20 Texas Instruments Inc Multiple detection volume laser doppler velocimeter

Also Published As

Publication number Publication date
JPS50136058A (fr) 1975-10-28
GB1493967A (en) 1977-12-07
DE2512771A1 (de) 1975-10-09
FR2266142A1 (fr) 1975-10-24
US3953128A (en) 1976-04-27

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