CA1023858A - Cellule de memoire capacitive et remanente - Google Patents

Cellule de memoire capacitive et remanente

Info

Publication number
CA1023858A
CA1023858A CA163,491A CA163491A CA1023858A CA 1023858 A CA1023858 A CA 1023858A CA 163491 A CA163491 A CA 163491A CA 1023858 A CA1023858 A CA 1023858A
Authority
CA
Canada
Prior art keywords
nonvolatile
memory cell
capacitive memory
capacitive
cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA163,491A
Other languages
English (en)
Other versions
CA163491S (en
Inventor
Nicholas E. Aneshansley
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NCR Voyix Corp
Original Assignee
NCR Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NCR Corp filed Critical NCR Corp
Application granted granted Critical
Publication of CA1023858A publication Critical patent/CA1023858A/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/356—Bistable circuits
    • H03K3/356008—Bistable circuits ensuring a predetermined initial state when the supply voltage has been applied; storing the actual state when the supply voltage fails
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/403—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh
    • G11C11/404—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh with one charge-transfer gate, e.g. MOS transistor, per cell
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C14/00—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0466—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS]

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Read Only Memory (AREA)
  • Dram (AREA)
  • Static Random-Access Memory (AREA)
  • Non-Volatile Memory (AREA)
  • Semiconductor Memories (AREA)
CA163,491A 1972-03-31 1973-02-12 Cellule de memoire capacitive et remanente Expired CA1023858A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US24025972A 1972-03-31 1972-03-31

Publications (1)

Publication Number Publication Date
CA1023858A true CA1023858A (fr) 1978-01-03

Family

ID=22905811

Family Applications (1)

Application Number Title Priority Date Filing Date
CA163,491A Expired CA1023858A (fr) 1972-03-31 1973-02-12 Cellule de memoire capacitive et remanente

Country Status (10)

Country Link
US (1) US3771148A (fr)
JP (1) JPS544579B2 (fr)
AU (1) AU465721B2 (fr)
BE (1) BE797581A (fr)
CA (1) CA1023858A (fr)
CH (1) CH563055A5 (fr)
DE (1) DE2313476C2 (fr)
FR (1) FR2178935B1 (fr)
GB (1) GB1371491A (fr)
IT (1) IT981567B (fr)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2309192C3 (de) * 1973-02-23 1975-08-14 Siemens Ag, 1000 Berlin Und 8000 Muenchen Regenerierschaltung nach Art eines getasteten Flipflops und Verfahren zum Betrieb einer solchen Regenerierschaltung
US3859638A (en) * 1973-05-31 1975-01-07 Intersil Inc Non-volatile memory unit with automatic standby power supply
US3858185A (en) * 1973-07-18 1974-12-31 Intel Corp An mos dynamic memory array & refreshing system
US3906461A (en) * 1974-03-29 1975-09-16 Sperry Rand Corp Integrated MNOS memory with decoder
US3979603A (en) * 1974-08-22 1976-09-07 Texas Instruments Incorporated Regenerative charge detector for charged coupled devices
JPS5756155B2 (fr) * 1974-10-03 1982-11-27
US4675841A (en) * 1974-12-23 1987-06-23 Pitney Bowes Inc. Micro computerized electronic postage meter system
JPS5539073B2 (fr) * 1974-12-25 1980-10-08
US3916390A (en) * 1974-12-31 1975-10-28 Ibm Dynamic memory with non-volatile back-up mode
US4025907A (en) * 1975-07-10 1977-05-24 Burroughs Corporation Interlaced memory matrix array having single transistor cells
US4158891A (en) * 1975-08-18 1979-06-19 Honeywell Information Systems Inc. Transparent tri state latch
US4094008A (en) * 1976-06-18 1978-06-06 Ncr Corporation Alterable capacitor memory array
US4175291A (en) * 1976-08-16 1979-11-20 Ncr Corporation Non-volatile random access memory cell
DE2736715C2 (de) * 1976-08-16 1985-03-14 Ncr Corp., Dayton, Ohio Speichervorrichtung mit wahlfreiem Zugriff
US4218764A (en) * 1978-10-03 1980-08-19 Matsushita Electric Industrial Co., Ltd. Non-volatile memory refresh control circuit
US4285050A (en) * 1979-10-30 1981-08-18 Pitney Bowes Inc. Electronic postage meter operating voltage variation sensing system
US4375086A (en) * 1980-05-15 1983-02-22 Ncr Corporation Volatile/non-volatile dynamic RAM system
JPS57208691A (en) * 1981-06-15 1982-12-21 Mitsubishi Electric Corp Semiconductor memory
KR100215866B1 (ko) * 1996-04-12 1999-08-16 구본준 커패시터가 없는 디램 및 그의 제조방법
US5796670A (en) * 1996-11-07 1998-08-18 Ramax Semiconductor, Inc. Nonvolatile dynamic random access memory device
US6882200B2 (en) * 2001-07-23 2005-04-19 Intel Corporation Controlling signal states and leakage current during a sleep mode
TWI349855B (en) * 2007-11-30 2011-10-01 Sunplus Technology Co Ltd Method for recording data using non-volatile memory and electronic apparatus thereof
US8853833B2 (en) * 2011-06-13 2014-10-07 Micron Technology, Inc. Electromagnetic shield and associated methods

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3428875A (en) * 1966-10-03 1969-02-18 Fairchild Camera Instr Co Variable threshold insulated gate field effect device
US3387286A (en) * 1967-07-14 1968-06-04 Ibm Field-effect transistor memory
US3518635A (en) * 1967-08-22 1970-06-30 Bunker Ramo Digital memory apparatus
US3631408A (en) * 1968-09-13 1971-12-28 Hitachi Ltd Condenser memory circuit with regeneration means
US3576571A (en) * 1969-01-07 1971-04-27 North American Rockwell Memory circuit using storage capacitance and field effect devices
US3533089A (en) * 1969-05-16 1970-10-06 Shell Oil Co Single-rail mosfet memory with capacitive storage
US3614753A (en) * 1969-11-10 1971-10-19 Shell Oil Co Single-rail solid-state memory with capacitive storage
US3593037A (en) * 1970-03-13 1971-07-13 Intel Corp Cell for mos random-acess integrated circuit memory
US3676717A (en) * 1970-11-02 1972-07-11 Ncr Co Nonvolatile flip-flop memory cell

Also Published As

Publication number Publication date
FR2178935A1 (fr) 1973-11-16
JPS544579B2 (fr) 1979-03-08
DE2313476A1 (de) 1973-10-04
AU465721B2 (en) 1975-10-02
IT981567B (it) 1974-10-10
AU5291673A (en) 1974-09-05
DE2313476C2 (de) 1981-12-03
JPS4917143A (fr) 1974-02-15
GB1371491A (en) 1974-10-23
BE797581A (fr) 1973-07-16
FR2178935B1 (fr) 1979-10-05
US3771148A (en) 1973-11-06
CH563055A5 (fr) 1975-06-13

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