CA1011466A - In-circuit diode tester - Google Patents
In-circuit diode testerInfo
- Publication number
- CA1011466A CA1011466A CA207,706A CA207706A CA1011466A CA 1011466 A CA1011466 A CA 1011466A CA 207706 A CA207706 A CA 207706A CA 1011466 A CA1011466 A CA 1011466A
- Authority
- CA
- Canada
- Prior art keywords
- circuit diode
- diode tester
- tester
- circuit
- diode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19732344015 DE2344015C3 (de) | 1973-08-31 | Einrichtung zur Prüfung von Dioden |
Publications (1)
Publication Number | Publication Date |
---|---|
CA1011466A true CA1011466A (en) | 1977-05-31 |
Family
ID=5891298
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA207,706A Expired CA1011466A (en) | 1973-08-31 | 1974-08-23 | In-circuit diode tester |
Country Status (6)
Country | Link |
---|---|
US (1) | US3975683A (it) |
CA (1) | CA1011466A (it) |
CH (1) | CH574113A5 (it) |
GB (1) | GB1475810A (it) |
IT (1) | IT1020316B (it) |
SE (1) | SE389743B (it) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4156189A (en) * | 1977-09-12 | 1979-05-22 | Honeywell Information Systems Inc. | Power supply fault analyzer |
JP2644579B2 (ja) * | 1988-06-03 | 1997-08-25 | 株式会社東京精密 | 半導体素子の検査方法及び装置 |
JP2969391B2 (ja) * | 1991-05-24 | 1999-11-02 | 株式会社新川 | ボンド点極性設定装置 |
JP2648265B2 (ja) * | 1992-01-17 | 1997-08-27 | 三田工業株式会社 | 画像形成装置 |
US6323535B1 (en) | 2000-06-16 | 2001-11-27 | Infineon Technologies North America Corp. | Electrical fuses employing reverse biasing to enhance programming |
US7687933B2 (en) * | 2007-03-16 | 2010-03-30 | Rennie William A | Accessory power distribution module |
US7868637B2 (en) * | 2007-10-15 | 2011-01-11 | Hamilton Sundstrand Corporation | System and method for automated detection of singular faults in diode or'd power bus circuits |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2584800A (en) * | 1947-07-09 | 1952-02-05 | Overload protection device for electrical instruments | |
SE329648B (it) * | 1968-11-08 | 1970-10-19 | Ericsson Telefon Ab L M |
-
1974
- 1974-07-23 CH CH1013574A patent/CH574113A5/xx not_active IP Right Cessation
- 1974-08-22 US US05/499,777 patent/US3975683A/en not_active Expired - Lifetime
- 1974-08-23 CA CA207,706A patent/CA1011466A/en not_active Expired
- 1974-08-30 IT IT26761/74A patent/IT1020316B/it active
- 1974-08-30 SE SE7411018A patent/SE389743B/xx not_active IP Right Cessation
- 1974-08-30 GB GB3810674A patent/GB1475810A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
SE7411018L (it) | 1975-03-03 |
US3975683A (en) | 1976-08-17 |
CH574113A5 (it) | 1976-03-31 |
IT1020316B (it) | 1977-12-20 |
DE2344015B2 (de) | 1975-07-17 |
DE2344015A1 (de) | 1975-04-03 |
GB1475810A (en) | 1977-06-10 |
SE389743B (sv) | 1976-11-15 |
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