BRPI0818122A2 - Método e aparelho de medição para o registro sem contato da forma espacial de componentes - Google Patents

Método e aparelho de medição para o registro sem contato da forma espacial de componentes

Info

Publication number
BRPI0818122A2
BRPI0818122A2 BRPI0818122A BRPI0818122A2 BR PI0818122 A2 BRPI0818122 A2 BR PI0818122A2 BR PI0818122 A BRPI0818122 A BR PI0818122A BR PI0818122 A2 BRPI0818122 A2 BR PI0818122A2
Authority
BR
Brazil
Prior art keywords
components
measurement method
spatial form
contactless recording
contactless
Prior art date
Application number
Other languages
English (en)
Inventor
Simon Grigull
Hubert Schill
Original Assignee
Rosenberger Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rosenberger Ag filed Critical Rosenberger Ag
Publication of BRPI0818122A2 publication Critical patent/BRPI0818122A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
BRPI0818122 2007-10-30 2008-10-30 Método e aparelho de medição para o registro sem contato da forma espacial de componentes BRPI0818122A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE200710052033 DE102007052033A1 (de) 2007-10-30 2007-10-30 Verfahren und Messgerät zur berührungslosen Erfassung des räumlichen Formverlaufs von Bauteilen
PCT/EP2008/009149 WO2009056303A1 (de) 2007-10-30 2008-10-30 Verfahren und messgerät zur berührungslosen erfassung des räumlichen formverlaufs von bauteilen

Publications (1)

Publication Number Publication Date
BRPI0818122A2 true BRPI0818122A2 (pt) 2015-03-31

Family

ID=40251545

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0818122 BRPI0818122A2 (pt) 2007-10-30 2008-10-30 Método e aparelho de medição para o registro sem contato da forma espacial de componentes

Country Status (6)

Country Link
EP (1) EP2208014A1 (pt)
BR (1) BRPI0818122A2 (pt)
DE (1) DE102007052033A1 (pt)
MX (1) MX2010004784A (pt)
RU (1) RU2460036C2 (pt)
WO (1) WO2009056303A1 (pt)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009052296A1 (de) 2009-11-09 2011-05-19 Rosenberger Ag Vorrichtung zur Positionsbestimmung
PL2708845T3 (pl) * 2012-09-13 2017-10-31 General Electric Technology Gmbh Sposób i system do określania jakości rur
US9485473B2 (en) 2012-09-13 2016-11-01 Alstom Technology Ltd Method and system for determining quality of tubes

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3944798A (en) * 1974-04-18 1976-03-16 Eaton-Leonard Corporation Method and apparatus for measuring direction
JPS5537919A (en) * 1978-09-11 1980-03-17 Ngk Insulators Ltd Automatic outer configuration measurement device
US4576482A (en) * 1979-09-07 1986-03-18 Diffracto Ltd. Electro-optical inspection
US4849643A (en) * 1987-09-18 1989-07-18 Eaton Leonard Technologies Optical probe with overlapping detection fields
US4880991A (en) * 1987-11-09 1989-11-14 Industrial Technology Institute Non-contact dimensional gage for turned parts
US5008555A (en) 1988-04-08 1991-04-16 Eaton Leonard Technologies, Inc. Optical probe with overlapping detection fields
GB9110570D0 (en) * 1991-05-16 1991-07-03 Cruickshank John S Measuring,inspection and comparative analysis apparatus for moving object profiles
US6480290B1 (en) * 2000-01-31 2002-11-12 Carnegie Mellon University Method and apparatus to measure the cross-sectional area of an object

Also Published As

Publication number Publication date
RU2010117017A (ru) 2011-12-10
WO2009056303A1 (de) 2009-05-07
RU2460036C2 (ru) 2012-08-27
MX2010004784A (es) 2010-07-29
EP2208014A1 (de) 2010-07-21
DE102007052033A1 (de) 2009-05-07

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Legal Events

Date Code Title Description
B11A Dismissal acc. art.33 of ipl - examination not requested within 36 months of filing
B11Y Definitive dismissal - extension of time limit for request of examination expired [chapter 11.1.1 patent gazette]