BRPI0817759A2 - Analisador por difração de raios x por dispersão de energia em linha - Google Patents

Analisador por difração de raios x por dispersão de energia em linha

Info

Publication number
BRPI0817759A2
BRPI0817759A2 BRPI0817759A BRPI0817759A2 BR PI0817759 A2 BRPI0817759 A2 BR PI0817759A2 BR PI0817759 A BRPI0817759 A BR PI0817759A BR PI0817759 A2 BRPI0817759 A2 BR PI0817759A2
Authority
BR
Brazil
Prior art keywords
ray diffraction
energy dispersion
line energy
diffraction analyzer
analyzer
Prior art date
Application number
Other languages
English (en)
Inventor
Joel O'dwyer
James Tickner
Original Assignee
Commw Scient Ind Res Org
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from AU2007905416A external-priority patent/AU2007905416A0/en
Application filed by Commw Scient Ind Res Org filed Critical Commw Scient Ind Res Org
Publication of BRPI0817759A2 publication Critical patent/BRPI0817759A2/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20091Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
BRPI0817759 2007-10-03 2008-10-03 Analisador por difração de raios x por dispersão de energia em linha BRPI0817759A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AU2007905416A AU2007905416A0 (en) 2007-10-03 An online energy dispersive X-ray diffraction analyser
PCT/AU2008/001456 WO2009043095A1 (en) 2007-10-03 2008-10-03 An online energy dispersive x-ray diffraction analyser

Publications (1)

Publication Number Publication Date
BRPI0817759A2 true BRPI0817759A2 (pt) 2015-03-24

Family

ID=40525762

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0817759 BRPI0817759A2 (pt) 2007-10-03 2008-10-03 Analisador por difração de raios x por dispersão de energia em linha

Country Status (8)

Country Link
US (1) US8311183B2 (pt)
EP (1) EP2203736A4 (pt)
CN (1) CN101849178B (pt)
AU (1) AU2008307135B2 (pt)
BR (1) BRPI0817759A2 (pt)
CA (1) CA2701670C (pt)
WO (1) WO2009043095A1 (pt)
ZA (1) ZA201002520B (pt)

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Publication number Priority date Publication date Assignee Title
JP5832892B2 (ja) 2008-03-31 2015-12-16 サザン イノヴェーション インターナショナル プロプライアトリー リミテッド 孔内検層のための方法および装置
WO2010132124A1 (en) * 2009-05-15 2010-11-18 Aspex Corporation Electron microscope with integrated detector(s)
RU2509298C1 (ru) * 2012-11-07 2014-03-10 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Национальный исследовательский Томский политехнический университет" Способ рентгенометрической оценки температурных условий эксплуатации трубных элементов котлов
US9086496B2 (en) * 2013-11-15 2015-07-21 Varian Medical Systems, Inc. Feedback modulated radiation scanning systems and methods for reduced radiological footprint
JP6084993B2 (ja) * 2015-01-07 2017-02-22 株式会社リガク X線回折方法及びそれを用いた可搬型x線回折装置
JP6477166B2 (ja) * 2015-03-31 2019-03-06 住友大阪セメント株式会社 鉱物の組成評価方法
CN105738391A (zh) * 2016-03-09 2016-07-06 王利晨 具有磁分析功能的x射线衍射装置
US9972474B2 (en) 2016-07-31 2018-05-15 Fei Company Electron microscope with multiple types of integrated x-ray detectors arranged in an array
US10775323B2 (en) * 2016-10-18 2020-09-15 Kla-Tencor Corporation Full beam metrology for X-ray scatterometry systems
EP3571495B1 (en) * 2017-02-25 2023-07-19 The Nottingham Trent University Sample inspection apparatus employing a diffraction detector
CN107228871B (zh) * 2017-07-21 2023-07-04 中国地质大学(武汉) 一种便携式x射线分析装置
CN107703168A (zh) * 2017-10-13 2018-02-16 中国工程物理研究院材料研究所 一种晶体衍射信号获取方法
US20190145916A1 (en) * 2017-11-16 2019-05-16 XRD by Design LLC Compact, Low Cost Apparatus for Testing of Production and Counterfeit Pharmaceuticals and Other Crystalline Materials
EP3553507A1 (en) * 2018-04-13 2019-10-16 Malvern Panalytical B.V. X-ray analysis apparatus
US11614414B2 (en) * 2018-10-19 2023-03-28 Commonwealth Scientific And Industrial Research Organisation Energy-dispersive X-ray diffraction analyser comprising a substantially X-ray transparent member having an improved reflection geometry
CN113125480A (zh) * 2019-12-27 2021-07-16 科德尔科股份公司 铜精矿的矿物分析系统
GB2592684B (en) * 2020-03-06 2022-04-27 Halo X Ray Tech Limited A sample inspection system

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3909147A1 (de) * 1988-09-22 1990-09-27 Philips Patentverwaltung Anordnung zur messung des impulsuebertrages
DE4034602A1 (de) 1990-06-20 1992-05-07 Philips Patentverwaltung Anordnung zur messung des impulsuebertragsspektrums von roentgenquanten
EP0556887B1 (de) * 1992-02-06 1998-07-08 Philips Patentverwaltung GmbH Anordnung zum Messen des Impulsübertragsspektrums von elastisch gestreuten Röntgenquanten
US5510644A (en) * 1992-03-23 1996-04-23 Martin Marietta Corporation CDTE x-ray detector for use at room temperature
US6118850A (en) * 1997-02-28 2000-09-12 Rutgers, The State University Analysis methods for energy dispersive X-ray diffraction patterns
US20050058242A1 (en) * 2003-09-15 2005-03-17 Peschmann Kristian R. Methods and systems for the rapid detection of concealed objects
US20050117700A1 (en) * 2003-08-08 2005-06-02 Peschmann Kristian R. Methods and systems for the rapid detection of concealed objects
JP2007513667A (ja) 2003-12-12 2007-05-31 ティシュオミクス リミテッド 例示的な乳房組織についての体組織の特徴付けにおけるコンプトン散乱の利用、又はxrf(x線蛍光)及びedxrd(エネルギ分散型x線回折)の組み合わせの利用

Also Published As

Publication number Publication date
US8311183B2 (en) 2012-11-13
CN101849178B (zh) 2014-03-05
CA2701670A1 (en) 2009-04-09
EP2203736A1 (en) 2010-07-07
WO2009043095A1 (en) 2009-04-09
CA2701670C (en) 2018-01-16
EP2203736A4 (en) 2016-07-27
US20100303206A1 (en) 2010-12-02
AU2008307135B2 (en) 2014-02-20
ZA201002520B (en) 2012-09-26
AU2008307135A1 (en) 2009-04-09
CN101849178A (zh) 2010-09-29

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Legal Events

Date Code Title Description
B11A Dismissal acc. art.33 of ipl - examination not requested within 36 months of filing
B11Y Definitive dismissal - extension of time limit for request of examination expired [chapter 11.1.1 patent gazette]