BRPI0816242A2 - ferramenta de fundo de poço de alta temperatura - Google Patents

ferramenta de fundo de poço de alta temperatura

Info

Publication number
BRPI0816242A2
BRPI0816242A2 BRPI0816242A BRPI0816242A BRPI0816242A2 BR PI0816242 A2 BRPI0816242 A2 BR PI0816242A2 BR PI0816242 A BRPI0816242 A BR PI0816242A BR PI0816242 A BRPI0816242 A BR PI0816242A BR PI0816242 A2 BRPI0816242 A2 BR PI0816242A2
Authority
BR
Brazil
Prior art keywords
high temperature
downhole tool
temperature downhole
tool
temperature
Prior art date
Application number
BRPI0816242A
Other languages
English (en)
Inventor
Sebastian Csutak
Original Assignee
Baker Hughes Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Baker Hughes Inc filed Critical Baker Hughes Inc
Publication of BRPI0816242A2 publication Critical patent/BRPI0816242A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V3/00—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation
    • G01V3/18—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation specially adapted for well-logging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00—Prospecting or detecting by optical means
    • G01V8/02—Prospecting
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Optics & Photonics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • Geology (AREA)
  • Environmental & Geological Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Remote Sensing (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Semiconductor Lasers (AREA)
  • Earth Drilling (AREA)
  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
BRPI0816242A 2007-08-13 2008-08-07 ferramenta de fundo de poço de alta temperatura BRPI0816242A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/837,692 US7638761B2 (en) 2007-08-13 2007-08-13 High temperature downhole tool
PCT/US2008/072494 WO2009023526A1 (en) 2007-08-13 2008-08-07 High temperature downhole tool

Publications (1)

Publication Number Publication Date
BRPI0816242A2 true BRPI0816242A2 (pt) 2016-07-19

Family

ID=40351078

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0816242A BRPI0816242A2 (pt) 2007-08-13 2008-08-07 ferramenta de fundo de poço de alta temperatura

Country Status (5)

Country Link
US (1) US7638761B2 (pt)
BR (1) BRPI0816242A2 (pt)
GB (1) GB2464431B (pt)
NO (1) NO344094B1 (pt)
WO (1) WO2009023526A1 (pt)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7720323B2 (en) * 2004-12-20 2010-05-18 Schlumberger Technology Corporation High-temperature downhole devices
US8952319B2 (en) * 2010-03-04 2015-02-10 University Of Utah Research Foundation Downhole deployable tools for measuring tracer concentrations
WO2011109782A1 (en) * 2010-03-04 2011-09-09 Altarock Energy, Inc. Colloidal-crystal quantum dots as tracers in underground formations
US8726725B2 (en) 2011-03-08 2014-05-20 Schlumberger Technology Corporation Apparatus, system and method for determining at least one downhole parameter of a wellsite
CN102900397B (zh) * 2012-10-24 2015-04-08 中国石油天然气股份有限公司 一种井下半导体制冷装置
US9249656B2 (en) 2012-11-15 2016-02-02 Baker Hughes Incorporated High precision locked laser operating at elevated temperatures
US9441480B2 (en) 2013-10-03 2016-09-13 Baker Hughes Incorporated Wavelength-selective, high temperature, near infrared photodetectors for downhole applications
US10126433B2 (en) 2014-11-10 2018-11-13 Halliburton Energy Services, Inc. Energy detection apparatus, methods, and systems
US9885591B2 (en) * 2016-03-18 2018-02-06 Baker Hughes, A Ge Company, Llc Low etendue light source for fiber optic sensors in high temperature environments
US10620429B2 (en) * 2017-08-30 2020-04-14 Abl Ip Holding Llc Electrowetting with compensation for force that may otherwise cause distortion or aberration

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4791636A (en) * 1985-10-30 1988-12-13 Sharp Kabushiki Kaisha Semiconductor laser device and a method for driving the same
US5406574A (en) * 1991-10-23 1995-04-11 Kabushiki Kaisha Toshiba Semiconductor laser device
JPH09318918A (ja) * 1996-05-29 1997-12-12 Nec Corp 半導体光変調器
US5805624A (en) * 1996-07-30 1998-09-08 Hewlett-Packard Company Long-wavelength infra-red vertical cavity surface-emitting laser on a gallium arsenide substrate
US6943235B1 (en) * 1999-04-12 2005-09-13 Agensys, Inc. Transmembrane protein expressed in prostate cancer
EP1509679A1 (en) * 2002-05-31 2005-03-02 Sensor Highway Limited Parameter sensing apparatus and method for subterranean wells
JP3854560B2 (ja) * 2002-09-19 2006-12-06 富士通株式会社 量子光半導体装置
US7782460B2 (en) * 2003-05-06 2010-08-24 Baker Hughes Incorporated Laser diode array downhole spectrometer
US7196786B2 (en) * 2003-05-06 2007-03-27 Baker Hughes Incorporated Method and apparatus for a tunable diode laser spectrometer for analysis of hydrocarbon samples
US20070081157A1 (en) * 2003-05-06 2007-04-12 Baker Hughes Incorporated Apparatus and method for estimating filtrate contamination in a formation fluid
US7282732B2 (en) * 2003-10-24 2007-10-16 Stc. Unm Quantum dot structures
US7279678B2 (en) * 2005-08-15 2007-10-09 Schlumber Technology Corporation Method and apparatus for composition analysis in a logging environment
US20080245960A1 (en) * 2007-04-09 2008-10-09 Baker Hughes Incorporated Method and Apparatus to Determine Characteristics of an Oil-Based Mud Downhole

Also Published As

Publication number Publication date
GB2464431A (en) 2010-04-21
NO344094B1 (no) 2019-09-02
GB201002586D0 (en) 2010-03-31
GB2464431B (en) 2011-11-09
NO20100345L (no) 2010-05-14
US20090045814A1 (en) 2009-02-19
WO2009023526A1 (en) 2009-02-19
US7638761B2 (en) 2009-12-29

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Legal Events

Date Code Title Description
B08F Application fees: dismissal - article 86 of industrial property law
B08K Lapse as no evidence of payment of the annual fee has been furnished to inpi (acc. art. 87)

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2474 DE 05-06-2018 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.