BR112019027945B8 - Previsão de parâmetros de iluminação estruturada - Google Patents

Previsão de parâmetros de iluminação estruturada

Info

Publication number
BR112019027945B8
BR112019027945B8 BR112019027945A BR112019027945A BR112019027945B8 BR 112019027945 B8 BR112019027945 B8 BR 112019027945B8 BR 112019027945 A BR112019027945 A BR 112019027945A BR 112019027945 A BR112019027945 A BR 112019027945A BR 112019027945 B8 BR112019027945 B8 BR 112019027945B8
Authority
BR
Brazil
Prior art keywords
structured lighting
forecast
lighting parameters
parameters
predicting
Prior art date
Application number
BR112019027945A
Other languages
English (en)
Other versions
BR112019027945B1 (pt
BR112019027945A2 (pt
Inventor
J Carney Michael
s hong Stanley
Langlois Robert
Ren Hongji
Wayne Bartig Kevin
Otto Rico
Andreevna Souverneva Olga
Original Assignee
Illumina Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Illumina Inc filed Critical Illumina Inc
Publication of BR112019027945A2 publication Critical patent/BR112019027945A2/pt
Publication of BR112019027945B1 publication Critical patent/BR112019027945B1/pt
Publication of BR112019027945B8 publication Critical patent/BR112019027945B8/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/361—Optical details, e.g. image relay to the camera or image sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/10—Segmentation; Edge detection
    • G06T7/11—Region-based segmentation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10056—Microscopic image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20021—Dividing image into blocks, subimages or windows

Abstract

As implementações da presente divulgação são direcionadas à previsão de parâmetros de iluminação estruturada para um determinado ponto no tempo, espaço e/ou temperatura utilizando estimativas de parâmetros de iluminação estruturada obtidos a partir de imagens de iluminação estruturada capturadas por um sistema de iluminação estruturada. Implementações específicas são direcionadas para prever parâmetros de frequência de iluminação estruturada, fase, orientação e/ou ordem de modulação.
BR112019027945A 2018-06-29 2019-06-20 Previsão de parâmetros de iluminação estruturada BR112019027945B8 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201862692303P 2018-06-29 2018-06-29
US62/692,303 2018-06-29
PCT/US2019/038293 WO2020005718A1 (en) 2018-06-29 2019-06-20 Predicting structured illumination parameters

Publications (3)

Publication Number Publication Date
BR112019027945A2 BR112019027945A2 (pt) 2020-07-14
BR112019027945B1 BR112019027945B1 (pt) 2022-06-21
BR112019027945B8 true BR112019027945B8 (pt) 2022-07-12

Family

ID=68987431

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112019027945A BR112019027945B8 (pt) 2018-06-29 2019-06-20 Previsão de parâmetros de iluminação estruturada

Country Status (17)

Country Link
US (3) US10831012B2 (pt)
EP (1) EP3814824A4 (pt)
JP (2) JP6909315B2 (pt)
KR (2) KR102422076B1 (pt)
CN (2) CN115308893B (pt)
AU (2) AU2019283788B2 (pt)
BR (1) BR112019027945B8 (pt)
CA (1) CA3065029C (pt)
IL (1) IL271419B (pt)
MX (1) MX2019014804A (pt)
MY (1) MY201229A (pt)
NZ (1) NZ760225A (pt)
RU (1) RU2740050C9 (pt)
SA (1) SA520410974B1 (pt)
SG (1) SG11201913694RA (pt)
TW (2) TWI718557B (pt)
WO (1) WO2020005718A1 (pt)

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CN111580260B (zh) * 2020-05-12 2023-08-01 西安交通大学 一种高速光学三维光切片显微系统及方法
CN112730354B (zh) * 2020-12-14 2022-11-01 南方科技大学 一种结构光成像方法、成像图及在生化检测中的应用
CN113433681B (zh) * 2021-06-25 2023-03-24 清华大学 结构光照明显微成像系统、方法
CN114169224A (zh) * 2021-11-15 2022-03-11 歌尔股份有限公司 获取光栅结构数据的方法、装置及可读存储介质
KR102599457B1 (ko) * 2022-08-03 2023-11-08 한국기초과학지원연구원 구조조명을 생성하는 현미경 장치 및 이의 동작 방법
CN116045836B (zh) * 2023-04-03 2023-06-02 成都太科光电技术有限责任公司 一种Φ1200mm极大口径平面光学干涉测试装置
CN116774417B (zh) * 2023-08-25 2023-10-27 长春理工大学 一种基于级联柔性光栅的多点激光扫描显微镜系统

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Also Published As

Publication number Publication date
JP2021177182A (ja) 2021-11-11
RU2740050C1 (ru) 2020-12-31
KR102422076B1 (ko) 2022-07-18
US10831012B2 (en) 2020-11-10
JP2021515255A (ja) 2021-06-17
WO2020005718A1 (en) 2020-01-02
EP3814824A4 (en) 2022-04-27
KR102329661B1 (ko) 2021-11-22
KR20200016893A (ko) 2020-02-17
MY201229A (en) 2024-02-13
NZ760225A (en) 2022-08-26
TW202136709A (zh) 2021-10-01
RU2740050C9 (ru) 2021-06-23
MX2019014804A (es) 2021-04-28
US11525993B2 (en) 2022-12-13
AU2019283788B2 (en) 2021-06-17
CA3065029C (en) 2022-07-12
US20210364773A1 (en) 2021-11-25
BR112019027945B1 (pt) 2022-06-21
CN115308893A (zh) 2022-11-08
JP6909315B2 (ja) 2021-07-28
US11119302B2 (en) 2021-09-14
TW202001183A (zh) 2020-01-01
EP3814824A1 (en) 2021-05-05
AU2021229139A1 (en) 2021-09-30
SA520410974B1 (ar) 2022-11-10
CN111108425A (zh) 2020-05-05
CN115308893B (zh) 2023-10-10
SG11201913694RA (en) 2020-02-27
AU2021229139B2 (en) 2022-06-02
IL271419B (en) 2021-12-01
CA3065029A1 (en) 2019-12-29
CN111108425B (zh) 2022-08-09
US20200004004A1 (en) 2020-01-02
TWI718557B (zh) 2021-02-11
IL271419A (en) 2020-01-30
JP6984065B2 (ja) 2021-12-17
KR20210143332A (ko) 2021-11-26
AU2019283788A1 (en) 2020-01-16
US20210055535A1 (en) 2021-02-25
BR112019027945A2 (pt) 2020-07-14
TWI792150B (zh) 2023-02-11

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