BR112017024214A2 - aparelho de inspeção de formação de imagem de retrodifusão portátil, método de formação de imagem, dispositivo de computador, e, meio de armazenamento legível por computador - Google Patents
aparelho de inspeção de formação de imagem de retrodifusão portátil, método de formação de imagem, dispositivo de computador, e, meio de armazenamento legível por computadorInfo
- Publication number
- BR112017024214A2 BR112017024214A2 BR112017024214A BR112017024214A BR112017024214A2 BR 112017024214 A2 BR112017024214 A2 BR 112017024214A2 BR 112017024214 A BR112017024214 A BR 112017024214A BR 112017024214 A BR112017024214 A BR 112017024214A BR 112017024214 A2 BR112017024214 A2 BR 112017024214A2
- Authority
- BR
- Brazil
- Prior art keywords
- imaging
- storage medium
- readable storage
- inspection apparatus
- motion sensor
- Prior art date
Links
- 238000003384 imaging method Methods 0.000 title abstract 5
- 238000007689 inspection Methods 0.000 title 1
- 238000009792 diffusion process Methods 0.000 abstract 1
- 230000000694 effects Effects 0.000 abstract 1
- 230000001788 irregular Effects 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/232—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays having relative motion between the source, detector and object other than by conveyor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
- G01N2223/053—Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/408—Imaging display on monitor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Geophysics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Molecular Biology (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
Abstract
a presente invenção revela um dispositivo de exame de formação de imagem de retrodifusão portátil e um método de formação de imagem. o dispositivo compreende: um alojamento de dispositivo (1), uma fonte de raio x (2), um mecanismo de modulação rotacional (3), um detector de raios (4), um sensor de movimento (5) e um controlador (6). a fonte de raio x (2), o mecanismo de modulação rotacional (3), o detector de raios (4) e o sensor de movimento (5) estão todos dispostos de maneira fixa dentro do alojamento de dispositivo (1). o detector de raios (4) é usado para receber dados de sinal de difusão da superfície de um objeto examinado para formar uma imagem bidimensional. o sensor de movimento (5) é usado para coletar, em um processo de varredura, uma trajetória de movimento espacial tridimensional e um ângulo de varredura do dispositivo. o controlador (6) é usado para combinar múltiplas imagens bidimensionais recebidas pelo detector de raios (4) com a trajetória de movimento espacial tridimensional e o ângulo de varredura para fornecer uma imagem tridimensional da superfície do objeto examinado. portanto, a modalidade implementa um efeito mais desejável de varredura e de formação de imagem para um objeto examinado que tem uma superfície curvada ou múltiplas superfícies irregulares.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201510996664.2A CN105652330B (zh) | 2015-12-25 | 2015-12-25 | 便携式背散射成像检查设备及成像方法 |
CN201510996664.2 | 2015-12-25 | ||
PCT/CN2016/100519 WO2017107607A1 (zh) | 2015-12-25 | 2016-09-28 | 便携式背散射成像检查设备及成像方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
BR112017024214A2 true BR112017024214A2 (pt) | 2018-07-17 |
BR112017024214B1 BR112017024214B1 (pt) | 2021-06-01 |
Family
ID=56476935
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR112017024214-1A BR112017024214B1 (pt) | 2015-12-25 | 2016-09-28 | Aparelho de inspeção de formação de imagem de retrodifusão portátil, método de formação de imagem, dispositivo de computador, e, meio de armazenamento legível por computador |
Country Status (5)
Country | Link |
---|---|
US (1) | US20170184516A1 (pt) |
EP (1) | EP3185046B1 (pt) |
CN (1) | CN105652330B (pt) |
BR (1) | BR112017024214B1 (pt) |
WO (1) | WO2017107607A1 (pt) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9958569B2 (en) | 2002-07-23 | 2018-05-01 | Rapiscan Systems, Inc. | Mobile imaging system and method for detection of contraband |
US10670740B2 (en) | 2012-02-14 | 2020-06-02 | American Science And Engineering, Inc. | Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors |
GB2554566B (en) * | 2015-03-20 | 2021-06-02 | Rapiscan Systems Inc | Hand-held portable backscatter inspection system |
CN105652330B (zh) * | 2015-12-25 | 2018-06-26 | 同方威视技术股份有限公司 | 便携式背散射成像检查设备及成像方法 |
CN106094048A (zh) * | 2016-07-26 | 2016-11-09 | 华讯方舟科技有限公司 | 基于毫米波成像的便携式安检设备 |
EP3746816A1 (en) * | 2018-02-02 | 2020-12-09 | Viken Detection Corporation | System and kit for x-ray backscatter imaging with removable detector |
US10830911B2 (en) | 2018-06-20 | 2020-11-10 | American Science And Engineering, Inc. | Wavelength-shifting sheet-coupled scintillation detectors |
TWI803716B (zh) * | 2019-11-27 | 2023-06-01 | 廣達電腦股份有限公司 | 掃描裝置及透過特定運動軌跡而自動觸發掃描裝置之方法 |
CN113331769A (zh) * | 2020-03-02 | 2021-09-03 | 卡普索影像公司 | 用于在内窥镜检查期间检测漏检区域的方法和装置 |
US20210374525A1 (en) * | 2020-05-28 | 2021-12-02 | International Business Machines Corporation | Method and system for processing data records |
US11175245B1 (en) | 2020-06-15 | 2021-11-16 | American Science And Engineering, Inc. | Scatter X-ray imaging with adaptive scanning beam intensity |
US11340361B1 (en) | 2020-11-23 | 2022-05-24 | American Science And Engineering, Inc. | Wireless transmission detector panel for an X-ray scanner |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
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US5763886A (en) * | 1996-08-07 | 1998-06-09 | Northrop Grumman Corporation | Two-dimensional imaging backscatter probe |
US20090067706A1 (en) * | 2007-09-12 | 2009-03-12 | Artec Ventures | System and Method for Multiframe Surface Measurement of the Shape of Objects |
CN201173903Y (zh) * | 2008-03-14 | 2008-12-31 | 王经瑾 | 跳点扫描辐射成像装置 |
CN201242531Y (zh) * | 2008-04-17 | 2009-05-20 | 清华大学 | 一种直线轨迹扫描成像系统 |
US8094781B1 (en) * | 2009-08-12 | 2012-01-10 | The Boeing Company | Portable X-ray back scattering imaging systems |
US8743199B2 (en) * | 2010-03-09 | 2014-06-03 | Physical Optics Corporation | Omnidirectional imaging optics with 360°-seamless telescopic resolution |
CN103063691B (zh) * | 2011-10-18 | 2014-11-12 | 北京睿思厚德辐射信息科技开发有限公司 | 双飞线多缝扫描背散射平面成像立体成像和自扫描成像装置 |
PL70150Y1 (pl) * | 2012-01-27 | 2018-08-31 | American Science & Eng Inc | Ręczne urządzenie obrazujące z wykorzystaniem wstecznie rozproszonego promieniowania rentgenowskiego |
US9003880B2 (en) * | 2012-12-31 | 2015-04-14 | General Electric Company | Reference speed measurement for a non-destructive testing system |
CN103018263A (zh) * | 2013-01-04 | 2013-04-03 | 合肥希贝爱斯光电科技有限公司 | 一种dr+ls复合型x射线通道式安检机 |
CN103076350A (zh) * | 2013-01-04 | 2013-05-01 | 公安部第一研究所 | 一种移动背散射x射线安全检查方法及装置 |
DE102014103833B3 (de) * | 2014-03-20 | 2015-07-09 | Bundesrepublik Deutschland, Vertreten Durch Den Bundesminister Für Wirtschaft Und Energie, Dieser Vertreten Durch Den Präsidenten Der Bundesanstalt Für Materialforschung Und -Prüfung (Bam) | Schlitzblende für Anwendungen in der Radiographie |
CN203811818U (zh) * | 2014-04-24 | 2014-09-03 | 北京君和信达科技有限公司 | 一种速通式移动目标辐射检查系统 |
GB2554566B (en) * | 2015-03-20 | 2021-06-02 | Rapiscan Systems Inc | Hand-held portable backscatter inspection system |
CN105652330B (zh) * | 2015-12-25 | 2018-06-26 | 同方威视技术股份有限公司 | 便携式背散射成像检查设备及成像方法 |
CN205449836U (zh) * | 2015-12-25 | 2016-08-10 | 同方威视技术股份有限公司 | 便携式背散射成像检查设备 |
-
2015
- 2015-12-25 CN CN201510996664.2A patent/CN105652330B/zh active Active
-
2016
- 2016-09-28 WO PCT/CN2016/100519 patent/WO2017107607A1/zh active Application Filing
- 2016-09-28 BR BR112017024214-1A patent/BR112017024214B1/pt active IP Right Grant
- 2016-10-05 US US15/285,850 patent/US20170184516A1/en not_active Abandoned
- 2016-10-05 EP EP16192332.1A patent/EP3185046B1/en active Active
Also Published As
Publication number | Publication date |
---|---|
EP3185046A1 (en) | 2017-06-28 |
EP3185046B1 (en) | 2020-12-02 |
US20170184516A1 (en) | 2017-06-29 |
CN105652330B (zh) | 2018-06-26 |
CN105652330A (zh) | 2016-06-08 |
WO2017107607A1 (zh) | 2017-06-29 |
BR112017024214B1 (pt) | 2021-06-01 |
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Legal Events
Date | Code | Title | Description |
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B06U | Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette] | ||
B09A | Decision: intention to grant [chapter 9.1 patent gazette] | ||
B16A | Patent or certificate of addition of invention granted [chapter 16.1 patent gazette] |
Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 28/09/2016, OBSERVADAS AS CONDICOES LEGAIS. |