BR112016029829A2 - sistema e método para medição in-situ de propriedades de camadas de material, e, meio legível por computador não transitório. - Google Patents
sistema e método para medição in-situ de propriedades de camadas de material, e, meio legível por computador não transitório.Info
- Publication number
- BR112016029829A2 BR112016029829A2 BR112016029829A BR112016029829A BR112016029829A2 BR 112016029829 A2 BR112016029829 A2 BR 112016029829A2 BR 112016029829 A BR112016029829 A BR 112016029829A BR 112016029829 A BR112016029829 A BR 112016029829A BR 112016029829 A2 BR112016029829 A2 BR 112016029829A2
- Authority
- BR
- Brazil
- Prior art keywords
- ice
- computer readable
- material layer
- readable media
- transient computer
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
- G01B17/02—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
- G01B17/02—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
- G01B17/025—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness for measuring thickness of coating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/211—Ellipsometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/043—Analysing solids in the interior, e.g. by shear waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2462—Probes with waveguides, e.g. SAW devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
- G01N29/46—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/023—Solids
- G01N2291/0237—Thin materials, e.g. paper, membranes, thin films
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
- G01N2291/02854—Length, thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/042—Wave modes
- G01N2291/0423—Surface waves, e.g. Rayleigh waves, Love waves
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Optics & Photonics (AREA)
- Mathematical Physics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Acoustics & Sound (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
os sistemas e os métodos de mediação in situ das propriedades físicas de um dispositivo de elemento computacional integrado (ice) usando a espectroscopia de onda acústica de superfície (saw) durante a fabricação são fornecidos. o sistema inclui um dispositivo de medição que tem uma fonte da bomba que fornece um pulso de excitação que gera uma saw na superfície exterior do ice. o sistema fornece uma radiação de sonda sendo interagida com a superfície exterior do dispositivo de ice e formar uma radiação interagida e um transdutor óptico configurado para receber a radiação interagida e formar um sinal. um analisador recebe o sinal do transdutor óptico e determina uma propriedade de uma camada de material na superfície exterior do dispositivo de ice e um segundo dispositivo de medição usando pelo menos um dentre monitorização óptico, elipsometria e espectroscopia óptica, está configurado para medir uma segunda propriedade no dispositivo ice.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US2014/048791 WO2016018278A1 (en) | 2014-07-30 | 2014-07-30 | In-situ analysis of ice using surface acoustic wave spectroscopy |
Publications (1)
Publication Number | Publication Date |
---|---|
BR112016029829A2 true BR112016029829A2 (pt) | 2017-08-22 |
Family
ID=55217998
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR112016029829A BR112016029829A2 (pt) | 2014-07-30 | 2014-07-30 | sistema e método para medição in-situ de propriedades de camadas de material, e, meio legível por computador não transitório. |
Country Status (5)
Country | Link |
---|---|
US (1) | US20160265910A1 (pt) |
EP (1) | EP3146292A4 (pt) |
BR (1) | BR112016029829A2 (pt) |
MX (1) | MX368144B (pt) |
WO (1) | WO2016018278A1 (pt) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6658406B2 (ja) | 2016-08-31 | 2020-03-04 | 株式会社デンソー | 炭化珪素半導体装置の製造方法 |
DE102018122391A1 (de) * | 2018-09-13 | 2020-03-19 | Sikora Ag | Vorrichtung und Verfahren zum Detektieren eines Gegenstandes |
US20220057368A1 (en) * | 2019-04-08 | 2022-02-24 | Chevron U.S.A. Inc. | Systems and methods for modeling substance characteristics |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5812261A (en) * | 1992-07-08 | 1998-09-22 | Active Impulse Systems, Inc. | Method and device for measuring the thickness of opaque and transparent films |
US6175416B1 (en) * | 1996-08-06 | 2001-01-16 | Brown University Research Foundation | Optical stress generator and detector |
US6217720B1 (en) * | 1997-06-03 | 2001-04-17 | National Research Council Of Canada | Multi-layer reactive sputtering method with reduced stabilization time |
US6795198B1 (en) * | 1998-05-28 | 2004-09-21 | Martin Fuchs | Method and device for measuring thin films and semiconductor substrates using reflection mode geometry |
US6393915B1 (en) * | 1999-07-29 | 2002-05-28 | Koninklijke Philips Electronics N.V. | Method and device for simultaneously measuring multiple properties of multilayer films |
US6381019B1 (en) * | 2000-06-30 | 2002-04-30 | Brown University Research Foundation | Ultrasonic generator and detector using an optical mask having a grating for launching a plurality of spatially distributed, time varying strain pulses in a sample |
US7006221B2 (en) * | 2001-07-13 | 2006-02-28 | Rudolph Technologies, Inc. | Metrology system with spectroscopic ellipsometer and photoacoustic measurements |
US6786099B2 (en) * | 2002-02-14 | 2004-09-07 | Kla-Tencor Technologies Corporation | Surface photo-acoustic film measurement device and technique |
US8960294B2 (en) * | 2011-08-05 | 2015-02-24 | Halliburton Energy Services, Inc. | Methods for monitoring fluids within or produced from a subterranean formation during fracturing operations using opticoanalytical devices |
US9261461B2 (en) * | 2011-08-05 | 2016-02-16 | Halliburton Energy Services, Inc. | Systems and methods for monitoring oil/gas separation processes |
US9575209B2 (en) * | 2012-12-22 | 2017-02-21 | Halliburton Energy Services, Inc. | Remote sensing methods and systems using nonlinear light conversion and sense signal transformation |
-
2014
- 2014-07-30 EP EP14898763.9A patent/EP3146292A4/en not_active Withdrawn
- 2014-07-30 WO PCT/US2014/048791 patent/WO2016018278A1/en active Application Filing
- 2014-07-30 MX MX2016017329A patent/MX368144B/es active IP Right Grant
- 2014-07-30 US US14/772,115 patent/US20160265910A1/en not_active Abandoned
- 2014-07-30 BR BR112016029829A patent/BR112016029829A2/pt not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
MX2016017329A (es) | 2017-05-01 |
WO2016018278A1 (en) | 2016-02-04 |
US20160265910A1 (en) | 2016-09-15 |
EP3146292A4 (en) | 2018-01-17 |
EP3146292A1 (en) | 2017-03-29 |
MX368144B (es) | 2019-09-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
B06U | Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette] | ||
B11B | Dismissal acc. art. 36, par 1 of ipl - no reply within 90 days to fullfil the necessary requirements |