BR112013029010A2 - estação de inspeção de metrologia óptica portátil - Google Patents

estação de inspeção de metrologia óptica portátil

Info

Publication number
BR112013029010A2
BR112013029010A2 BR112013029010A BR112013029010A BR112013029010A2 BR 112013029010 A2 BR112013029010 A2 BR 112013029010A2 BR 112013029010 A BR112013029010 A BR 112013029010A BR 112013029010 A BR112013029010 A BR 112013029010A BR 112013029010 A2 BR112013029010 A2 BR 112013029010A2
Authority
BR
Brazil
Prior art keywords
inspection station
optical metrology
portable optical
metrology inspection
portable
Prior art date
Application number
BR112013029010A
Other languages
English (en)
Inventor
Scott T Mcafee
William J Green
Original Assignee
Smart Inspection Systems Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Smart Inspection Systems Llc filed Critical Smart Inspection Systems Llc
Publication of BR112013029010A2 publication Critical patent/BR112013029010A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • G01B5/0004—Supports
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D11/00—Component parts of measuring arrangements not specially adapted for a specific variable
    • G01D11/24—Housings ; Casings for instruments

Abstract

abstract not avaible
BR112013029010A 2011-05-09 2012-05-09 estação de inspeção de metrologia óptica portátil BR112013029010A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161484016P 2011-05-09 2011-05-09
PCT/US2012/037080 WO2012154822A1 (en) 2011-05-09 2012-05-09 Portable optical metrology inspection station

Publications (1)

Publication Number Publication Date
BR112013029010A2 true BR112013029010A2 (pt) 2017-01-17

Family

ID=46246175

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112013029010A BR112013029010A2 (pt) 2011-05-09 2012-05-09 estação de inspeção de metrologia óptica portátil

Country Status (6)

Country Link
US (1) US9664508B2 (pt)
EP (1) EP2718664A1 (pt)
KR (1) KR20140034816A (pt)
BR (1) BR112013029010A2 (pt)
CA (1) CA2835457A1 (pt)
WO (1) WO2012154822A1 (pt)

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US9482529B2 (en) 2011-04-15 2016-11-01 Faro Technologies, Inc. Three-dimensional coordinate scanner and method of operation
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US9686532B2 (en) 2011-04-15 2017-06-20 Faro Technologies, Inc. System and method of acquiring three-dimensional coordinates using multiple coordinate measurement devices
US20170249729A1 (en) * 2011-05-09 2017-08-31 Level 3 Inspection, Llc Automated optical metrology computer aided inspection station and method of operation
US20140023996A1 (en) * 2012-07-18 2014-01-23 F3 & Associates, Inc. Three Dimensional Model Objects
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US10067231B2 (en) 2012-10-05 2018-09-04 Faro Technologies, Inc. Registration calculation of three-dimensional scanner data performed between scans based on measurements by two-dimensional scanner
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US9041914B2 (en) 2013-03-15 2015-05-26 Faro Technologies, Inc. Three-dimensional coordinate scanner and method of operation
US10089415B2 (en) 2013-12-19 2018-10-02 Faro Technologies, Inc. Three-dimensional coordinate scanner and method of operation
US9803969B2 (en) 2014-05-14 2017-10-31 Faro Technologies, Inc. Metrology device and method of communicating with portable devices
US9746308B2 (en) 2014-05-14 2017-08-29 Faro Technologies, Inc. Metrology device and method of performing an inspection
US9921046B2 (en) 2014-05-14 2018-03-20 Faro Technologies, Inc. Metrology device and method of servicing
US9829305B2 (en) 2014-05-14 2017-11-28 Faro Technologies, Inc. Metrology device and method of changing operating system
US9903701B2 (en) 2014-05-14 2018-02-27 Faro Technologies, Inc. Articulated arm coordinate measurement machine having a rotary switch
US10656617B2 (en) 2014-07-16 2020-05-19 Faro Technologies, Inc. Measurement device for machining center
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US10310922B2 (en) * 2015-04-13 2019-06-04 University Of Southern California Systems and methods for predicting and improving scanning geometric accuracy for 3D scanners
US10474134B2 (en) 2015-04-29 2019-11-12 University Of Southern California Systems and methods for compensating for 3D shape deviations in additive manufacturing
US9964398B2 (en) 2015-05-06 2018-05-08 Faro Technologies, Inc. Three-dimensional measuring device removably coupled to robotic arm on motorized mobile platform
US10118345B2 (en) 2015-06-17 2018-11-06 Xerox Corporation System and method for evaluation of a three-dimensional (3D) object during formation of the object
US10005229B2 (en) 2015-08-31 2018-06-26 Xerox Corporation System for using optical sensor focus to identify feature heights on objects being produced in a three-dimensional object printer
US9993977B2 (en) 2015-10-01 2018-06-12 Xerox Corporation System for using an optical sensor array to monitor color fidelity in objects produced by a three-dimensional object printer
US10011078B2 (en) 2015-10-01 2018-07-03 Xerox Corporation System for using multiple optical sensor arrays to measure features on objects produced in a three-dimensional object printer
DE202015106843U1 (de) * 2015-12-16 2017-03-17 Kds Holding Gmbh 3D-Scanstation
US10295436B2 (en) * 2016-03-17 2019-05-21 Honeywell International Inc. Structured light measuring apparatus and methods
ES2877499T3 (es) * 2016-04-25 2021-11-17 Alstom Transp Tech Método de inspección de la integridad de un ensamble utilizando el rango activo
US11655992B2 (en) * 2018-02-13 2023-05-23 Advanced Semiconductor Engineering, Inc. Measuring system
US10830889B2 (en) 2018-05-02 2020-11-10 Faro Technologies, Inc. System measuring 3D coordinates and method thereof
KR102039902B1 (ko) * 2018-07-23 2019-11-05 삼성중공업 주식회사 원격 기자재 정도 검사 시스템 및 방법
IT201800011031A1 (it) * 2018-12-12 2020-06-12 Visiorobotics S R L Sistema di validazione di componenti meccanici
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Also Published As

Publication number Publication date
US9664508B2 (en) 2017-05-30
KR20140034816A (ko) 2014-03-20
CA2835457A1 (en) 2012-11-15
EP2718664A1 (en) 2014-04-16
US20120290259A1 (en) 2012-11-15
WO2012154822A1 (en) 2012-11-15

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Legal Events

Date Code Title Description
B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B06U Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette]
B08F Application fees: application dismissed [chapter 8.6 patent gazette]

Free format text: REFERENTE A 8A ANUIDADE.

B11B Dismissal acc. art. 36, par 1 of ipl - no reply within 90 days to fullfil the necessary requirements