BR102015004272A2 - método e sistema para analisar dados de monitoramento de processo - Google Patents

método e sistema para analisar dados de monitoramento de processo Download PDF

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Publication number
BR102015004272A2
BR102015004272A2 BR102015004272A BR102015004272A BR102015004272A2 BR 102015004272 A2 BR102015004272 A2 BR 102015004272A2 BR 102015004272 A BR102015004272 A BR 102015004272A BR 102015004272 A BR102015004272 A BR 102015004272A BR 102015004272 A2 BR102015004272 A2 BR 102015004272A2
Authority
BR
Brazil
Prior art keywords
measurement
inspection
monitoring
data
subset
Prior art date
Application number
BR102015004272A
Other languages
English (en)
Portuguese (pt)
Inventor
Jordi Edo Abella
Tal Vagman
Original Assignee
Hexagon Metrology Israel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hexagon Metrology Israel Ltd filed Critical Hexagon Metrology Israel Ltd
Publication of BR102015004272A2 publication Critical patent/BR102015004272A2/pt

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Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/10—Scanning
    • G01N2201/102—Video camera
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Automation & Control Theory (AREA)
  • Geometry (AREA)
  • Signal Processing (AREA)
  • Image Analysis (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Image Processing (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
BR102015004272A 2014-02-28 2015-02-26 método e sistema para analisar dados de monitoramento de processo BR102015004272A2 (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP14157229.7A EP2913148B8 (en) 2014-02-28 2014-02-28 Method and system for analyzing process monitoring data

Publications (1)

Publication Number Publication Date
BR102015004272A2 true BR102015004272A2 (pt) 2015-12-22

Family

ID=50184807

Family Applications (1)

Application Number Title Priority Date Filing Date
BR102015004272A BR102015004272A2 (pt) 2014-02-28 2015-02-26 método e sistema para analisar dados de monitoramento de processo

Country Status (5)

Country Link
US (1) US9582870B2 (https=)
EP (1) EP2913148B8 (https=)
CN (1) CN104881863B (https=)
BR (1) BR102015004272A2 (https=)
IN (1) IN2015DE00209A (https=)

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* Cited by examiner, † Cited by third party
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US10197394B2 (en) * 2013-11-06 2019-02-05 Hexagon Metrology (Israel) Ltd. Method and system for analyzing spatial measuring data
JP6628539B2 (ja) * 2015-10-06 2020-01-08 株式会社日立製作所 生産計画指示装置、生産計画指示システム、及び生産計画指示方法
US20170228440A1 (en) * 2016-02-10 2017-08-10 Virdree BURNS Method of facilitating pattern recognition through organizing data based on their sequencing relationship
US10783397B2 (en) 2016-06-29 2020-09-22 Intel Corporation Network edge device with image thresholding
US10666909B2 (en) 2016-06-29 2020-05-26 Intel Corporation Methods and apparatus to perform remote monitoring
EP3339801B1 (en) * 2016-12-20 2021-11-24 Hexagon Technology Center GmbH Self-monitoring manufacturing system, production monitoring unit and use of production monitoring unit
EP3364374A1 (en) * 2017-02-20 2018-08-22 My Virtual Reality Software AS Method for visualizing three-dimensional data
GB201708730D0 (en) 2017-06-01 2017-07-19 Renishaw Plc Production and measurement of work workpieces
EP3459713A1 (en) 2017-09-26 2019-03-27 Siemens Aktiengesellschaft Method for computer-aided processing of quality information of an object and a respective assistance apparatus
EP3467430B1 (en) * 2017-10-06 2023-02-15 Bayerische Motoren Werke Aktiengesellschaft Method and system for optically scanning and measuring objects
JP7025266B2 (ja) * 2018-03-29 2022-02-24 パナソニック デバイスＳｕｎｘ株式会社 画像検査システム
CN109003326B (zh) * 2018-06-05 2021-07-23 湖北亿咖通科技有限公司 一种基于虚拟世界的虚拟激光雷达数据生成方法
FR3090088B1 (fr) * 2018-12-12 2021-06-18 Saint Gobain Procédé de mesure des écarts géométriques entre les surfaces incurvées d'une pluralité de matériaux à évaluer et une surface incurvée d’un matériau de référence
CN117651977A (zh) * 2021-07-14 2024-03-05 西门子股份公司 用于调试基于人工智能的检验系统的方法和装置
DE112022004981T5 (de) * 2022-03-23 2024-08-08 Mitsubishi Electric Corporation Anzeigedaten-Erzeugungsprogramm, Anzeigedaten-Erzeugungsgerät und Anzeigedaten-Erzeugungsverfahren
EP4290322B1 (en) * 2022-06-07 2026-04-01 Dassault Systèmes Inference of emerging problems in product manufacturing
CN116447972B (zh) * 2023-03-28 2026-01-23 一汽丰田汽车有限公司 一种整车零部件的尺寸参数检测方法、装置和存储介质
CN118706838B (zh) * 2024-02-18 2025-12-05 宁德时代新能源科技股份有限公司 产品质量检测设备的检测方法、装置和电子设备

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Publication number Priority date Publication date Assignee Title
US5105183A (en) * 1989-04-27 1992-04-14 Digital Equipment Corporation System for displaying video from a plurality of sources on a display
DE19544240A1 (de) 1994-12-01 1996-06-05 Volkswagen Ag Verfahren und Vorrichtung zur Ermittlung der räumlichen Koordinaten von Objektpunkten und Verfahren zur Herstellung einer Karosserie
JP3295733B2 (ja) * 1996-11-14 2002-06-24 松下電工株式会社 制御動作の解析方法及びこれを用いた解析装置
JP4096533B2 (ja) * 2001-08-31 2008-06-04 松下電工株式会社 画像処理検査システム
DE602004019537D1 (de) * 2003-07-24 2009-04-02 Cognitens Ltd System und verfahren zur überwachung und visualisierung der ausgabe eines produktionsprozesses
KR20070040786A (ko) * 2004-06-09 2007-04-17 코그넥스 테크놀로지 앤드 인베스트먼트 코포레이션 물체의 시각적 검출 및 검사를 위한 방법 및 장치
US9052294B2 (en) * 2006-05-31 2015-06-09 The Boeing Company Method and system for two-dimensional and three-dimensional inspection of a workpiece
EP2535781A1 (en) * 2011-06-17 2012-12-19 ABB Research Ltd. Collecting data in an industrial plant
EP2700570A1 (en) 2012-08-20 2014-02-26 Hexagon Metrology S.p.A. Mechanical positioning device and method

Also Published As

Publication number Publication date
US9582870B2 (en) 2017-02-28
CN104881863A (zh) 2015-09-02
EP2913148B8 (en) 2020-03-25
EP2913148A1 (en) 2015-09-02
CN104881863B (zh) 2019-04-30
US20150248755A1 (en) 2015-09-03
IN2015DE00209A (https=) 2015-09-04
EP2913148B1 (en) 2020-02-12

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Legal Events

Date Code Title Description
B03A Publication of a patent application or of a certificate of addition of invention [chapter 3.1 patent gazette]
B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B06U Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette]
B11B Dismissal acc. art. 36, par 1 of ipl - no reply within 90 days to fullfil the necessary requirements