BR0311244A - Dispositivo e processo para a medição espectrocópica de uma concentração de gás através da determinação de uma única linha de absorção - Google Patents

Dispositivo e processo para a medição espectrocópica de uma concentração de gás através da determinação de uma única linha de absorção

Info

Publication number
BR0311244A
BR0311244A BR0311244-6A BR0311244A BR0311244A BR 0311244 A BR0311244 A BR 0311244A BR 0311244 A BR0311244 A BR 0311244A BR 0311244 A BR0311244 A BR 0311244A
Authority
BR
Brazil
Prior art keywords
absorption line
gas
measuring
spectrocopically
determining
Prior art date
Application number
BR0311244-6A
Other languages
English (en)
Inventor
Andreas Dietrich
Peter Kasperson
Karl Henrik Haugholt
Original Assignee
Linde Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Linde Ag filed Critical Linde Ag
Publication of BR0311244A publication Critical patent/BR0311244A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
    • G01N2021/151—Gas blown
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N2021/3129—Determining multicomponents by multiwavelength light
    • G01N2021/3133—Determining multicomponents by multiwavelength light with selection of wavelengths before the sample
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G01N2021/396—Type of laser source
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/09—Cuvette constructions adapted to resist hostile environments or corrosive or abrasive materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/02—Mechanical
    • G01N2201/023—Controlling conditions in casing
    • G01N2201/0233—Gas purge

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Measuring Cells (AREA)

Abstract

"DISPOSITIVO E PROCESSO PARA A MEDIçãO ESPECTROSCóPICA DE UMA CONCENTRAçãO DE GáS ATRAVéS DA DETERMINAçãO DE UMA úNICA LINHA DE ABSORçãO". A presente invenção refere-se a um dispositivo e a um processo para a medição de uma concentração de pelo menos um componente de um gás processado por meio de um laser (2a), sendo que a trajetória de raio laser (2a) atravessa um volume (1) contendo o gás processado. A invenção é caracterizada pelo fato de que a trajetória do raio conduz, de modo parcialmente livre, através do gás processado e evolui parcialmente protegida em relação ao gás processado, sendo que apenas a parte da trajetória do raio que conduz livremente através do gás processado é que é considerada como trecho a ser medido (4) e é usada para uma medição espectroscópica da concentração, na qual uma linha de absorção é determinada com exatidão.
BR0311244-6A 2002-05-24 2003-05-20 Dispositivo e processo para a medição espectrocópica de uma concentração de gás através da determinação de uma única linha de absorção BR0311244A (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10223239A DE10223239A1 (de) 2002-05-24 2002-05-24 Vorrichtung und Verfahren zur spektroskopischen Messung einer Gaskonzentration durch Bestimmung einer einzelnen Absorptionslinie
PCT/EP2003/005296 WO2003100392A1 (de) 2002-05-24 2003-05-20 Vorrichtung und verfahren zur spektroskopischen messung einer gaskonzentration durch bestimmung einer einzelnen absorptionslinie

Publications (1)

Publication Number Publication Date
BR0311244A true BR0311244A (pt) 2005-03-15

Family

ID=29414146

Family Applications (1)

Application Number Title Priority Date Filing Date
BR0311244-6A BR0311244A (pt) 2002-05-24 2003-05-20 Dispositivo e processo para a medição espectrocópica de uma concentração de gás através da determinação de uma única linha de absorção

Country Status (9)

Country Link
EP (1) EP1508030A1 (pt)
JP (1) JP2005526978A (pt)
KR (1) KR20050013552A (pt)
AU (1) AU2003238366A1 (pt)
BR (1) BR0311244A (pt)
DE (1) DE10223239A1 (pt)
RU (1) RU2004138074A (pt)
WO (1) WO2003100392A1 (pt)
ZA (1) ZA200410367B (pt)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5972760B2 (ja) * 2012-11-09 2016-08-17 三菱重工業株式会社 排ガス脱硝システム、排ガス脱硝装置の再生方法及び排ガス脱硝装置の触媒交換方法
JP6000083B2 (ja) * 2012-11-16 2016-09-28 三菱重工業株式会社 排ガス脱硝システム

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2340747A1 (de) * 1972-10-26 1974-05-09 Bailey Meter Co Gasanalysengeraet
US3838925A (en) * 1972-12-07 1974-10-01 Baldwin Electronics Inc Photoelectric opacity measuring system
US4076425A (en) * 1976-02-17 1978-02-28 Julian Saltz Opacity measuring apparatus
US4225243A (en) * 1978-06-26 1980-09-30 Measurex Corporation Gas measuring apparatus with standardization means, and method therefor
US4247205A (en) * 1979-02-02 1981-01-27 Measurex Corporation Gas measuring apparatus with standardization means, and method therefor
GB2066947B (en) * 1980-01-09 1984-06-20 Measurex Corp Gas measuring apparatus with adjustable path length and method for operation and standardization therefor

Also Published As

Publication number Publication date
AU2003238366A1 (en) 2003-12-12
JP2005526978A (ja) 2005-09-08
WO2003100392A1 (de) 2003-12-04
KR20050013552A (ko) 2005-02-04
DE10223239A1 (de) 2003-12-04
ZA200410367B (en) 2006-06-28
EP1508030A1 (de) 2005-02-23
RU2004138074A (ru) 2005-09-10

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Legal Events

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B08F Application fees: application dismissed [chapter 8.6 patent gazette]

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B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 2055 DE 25/05/2010.