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Priority claimed from DE19702043139external-prioritypatent/DE2043139C3/de
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Publication of BG22859A3publicationCriticalpatent/BG22859A3/xx
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
G01R1/02—General constructional details
G01R1/04—Housings; Supporting members; Arrangements of terminals
G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
G—PHYSICS
G01—MEASURING; TESTING
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
G01R1/02—General constructional details
G01R1/06—Measuring leads; Measuring probes
G01R1/067—Measuring probes
G01R1/073—Multiple probes
G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers