BE767117A - Tete de mesure pour composants electroniques - Google Patents

Tete de mesure pour composants electroniques

Info

Publication number
BE767117A
BE767117A BE767117A BE767117A BE767117A BE 767117 A BE767117 A BE 767117A BE 767117 A BE767117 A BE 767117A BE 767117 A BE767117 A BE 767117A BE 767117 A BE767117 A BE 767117A
Authority
BE
Belgium
Prior art keywords
electronic components
measuring head
measuring
head
electronic
Prior art date
Application number
BE767117A
Other languages
English (en)
French (fr)
Original Assignee
Cit Alcatel
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cit Alcatel filed Critical Cit Alcatel
Publication of BE767117A publication Critical patent/BE767117A/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433Sockets for IC's or transistors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433Sockets for IC's or transistors
    • G01R1/0441Details
    • G01R1/045Sockets or component fixtures for RF or HF testing

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
BE767117A 1970-05-20 1971-05-13 Tete de mesure pour composants electroniques BE767117A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7018352A FR2088118A1 (enrdf_load_stackoverflow) 1970-05-20 1970-05-20

Publications (1)

Publication Number Publication Date
BE767117A true BE767117A (fr) 1971-11-16

Family

ID=9055792

Family Applications (1)

Application Number Title Priority Date Filing Date
BE767117A BE767117A (fr) 1970-05-20 1971-05-13 Tete de mesure pour composants electroniques

Country Status (5)

Country Link
BE (1) BE767117A (enrdf_load_stackoverflow)
DE (1) DE2124967A1 (enrdf_load_stackoverflow)
FR (1) FR2088118A1 (enrdf_load_stackoverflow)
GB (1) GB1348805A (enrdf_load_stackoverflow)
NL (1) NL7106963A (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2139019A (en) * 1983-04-29 1984-10-31 Gen Electric Co Plc Printed circuit board testers
GB2156532B (en) * 1984-03-24 1988-07-20 Plessey Co Plc Apparatus for testing a printed circuit board
US4683423A (en) * 1985-10-30 1987-07-28 Precision Monolithics, Inc. Leadless chip test socket
FR2771180B1 (fr) * 1997-11-18 2000-01-07 Samsung Electronics Co Ltd Carte de controle pour tester une puce de circuit integre

Also Published As

Publication number Publication date
DE2124967A1 (de) 1971-12-09
NL7106963A (enrdf_load_stackoverflow) 1971-11-23
FR2088118A1 (enrdf_load_stackoverflow) 1972-01-07
GB1348805A (en) 1974-03-27

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