BE726954A - - Google Patents
Info
- Publication number
- BE726954A BE726954A BE726954DA BE726954A BE 726954 A BE726954 A BE 726954A BE 726954D A BE726954D A BE 726954DA BE 726954 A BE726954 A BE 726954A
- Authority
- BE
- Belgium
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR136735 | 1968-01-19 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BE726954A true BE726954A (id) | 1969-07-16 |
Family
ID=8644824
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BE726954D BE726954A (id) | 1968-01-19 | 1969-01-16 |
Country Status (6)
| Country | Link |
|---|---|
| BE (1) | BE726954A (id) |
| CH (1) | CH488180A (id) |
| DE (1) | DE1901666A1 (id) |
| FR (1) | FR1564558A (id) |
| GB (1) | GB1246410A (id) |
| NL (1) | NL6900671A (id) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2748501C3 (de) * | 1977-10-28 | 1985-05-30 | Born, Eberhard, Dr. | Verfahren und Vorrichtung zur Erstellung von Texturtopogrammen |
| DE2925593A1 (de) * | 1979-06-25 | 1981-01-15 | Siemens Ag | Einrichtung fuer die roentgenfluoreszenzanalyse |
| FR2668262B1 (fr) * | 1990-10-23 | 1994-04-01 | Centre Nal Recherc Scientifique | Procede d'analyse aux rayons x de pieces monocristallines. |
| CN103983650B (zh) * | 2014-05-15 | 2016-04-06 | 重庆大学 | 多自由度、多角度旋转装置 |
| CN105758880B (zh) * | 2016-04-11 | 2019-02-05 | 西北核技术研究所 | 基于闪光x光机的超快x射线衍射成像方法及系统 |
| CN112670200A (zh) * | 2020-12-29 | 2021-04-16 | 杭州中欣晶圆半导体股份有限公司 | 检测氧化堆垛层错的方法 |
-
1968
- 1968-01-19 FR FR1564558D patent/FR1564558A/fr not_active Expired
-
1969
- 1969-01-14 DE DE19691901666 patent/DE1901666A1/de active Pending
- 1969-01-15 NL NL6900671A patent/NL6900671A/xx unknown
- 1969-01-16 BE BE726954D patent/BE726954A/xx unknown
- 1969-01-17 GB GB294769A patent/GB1246410A/en not_active Expired
- 1969-01-17 CH CH65169A patent/CH488180A/fr not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| GB1246410A (en) | 1971-09-15 |
| DE1901666A1 (de) | 1969-09-04 |
| CH488180A (fr) | 1970-03-31 |
| NL6900671A (id) | 1969-07-22 |
| FR1564558A (id) | 1969-04-25 |