BE719998A - - Google Patents

Info

Publication number
BE719998A
BE719998A BE719998DA BE719998A BE 719998 A BE719998 A BE 719998A BE 719998D A BE719998D A BE 719998DA BE 719998 A BE719998 A BE 719998A
Authority
BE
Belgium
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of BE719998A publication Critical patent/BE719998A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
BE719998D 1965-10-28 1968-08-27 BE719998A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US505479A US3417243A (en) 1965-10-28 1965-10-28 Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base
GB40962/68A GB1239797A (en) 1965-10-28 1968-08-27 Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base.

Publications (1)

Publication Number Publication Date
BE719998A true BE719998A (ja) 1969-02-27

Family

ID=26264550

Family Applications (1)

Application Number Title Priority Date Filing Date
BE719998D BE719998A (ja) 1965-10-28 1968-08-27

Country Status (5)

Country Link
US (1) US3417243A (ja)
AU (1) AU408547B2 (ja)
BE (1) BE719998A (ja)
DE (1) DE1798125A1 (ja)
GB (1) GB1239797A (ja)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3525863A (en) * 1967-12-28 1970-08-25 Minnesota Mining & Mfg Differential emission x-ray gauging apparatus and method using two monochromatic x-ray beams of balanced intensity
JPS5847659B2 (ja) * 1975-08-12 1983-10-24 日新製鋼株式会社 ゴウキンカアエンテツバンノ ゴウキンカドノ ソクテイホウホウ
US4085329A (en) * 1976-05-03 1978-04-18 Hughes Aircraft Company Hard X-ray and fluorescent X-ray detection of alignment marks for precision mask alignment
FI59489C (fi) * 1978-11-21 1981-08-10 Enso Gutzeit Oy Foerfarande foer maetning av belaeggningsmaengder
DE10034747A1 (de) * 2000-07-18 2002-02-07 Manfred Liphardt Verfahren und Vorrichtung zur Feststellung der Dicke eines Beschichtungswerkstoffs auf einem Trägerwerkstoff
US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
CN100593116C (zh) * 2006-04-10 2010-03-03 上海爱斯特电子有限公司 X荧光多元素分析仪
EP2462431B1 (en) * 2009-08-04 2017-10-11 Rapiscan Laboratories, Inc. Method and system for extracting spectroscopic information from images and waveforms
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
CA2863382C (en) 2011-06-09 2017-06-27 Rapiscan Systems, Inc. System and method for x-ray source weight reduction
CN108508052B (zh) * 2018-06-11 2023-10-20 西北核技术研究所 基于参考元素的x射线荧光薄层质量厚度测量系统及方法
KR102609389B1 (ko) * 2019-01-30 2023-12-01 노드슨 코포레이션 복사선-기반의 두께 게이지
US11193898B1 (en) 2020-06-01 2021-12-07 American Science And Engineering, Inc. Systems and methods for controlling image contrast in an X-ray system
GB2609588A (en) * 2020-06-01 2023-02-08 American Science & Eng Inc Systems and methods for controlling image contrast in an X-ray system

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2926257A (en) * 1955-05-16 1960-02-23 Friedman Herbert Method of measuring the thickness of thin coatings

Also Published As

Publication number Publication date
GB1239797A (en) 1971-07-21
AU4237568A (en) 1970-02-26
US3417243A (en) 1968-12-17
DE1798125A1 (de) 1972-01-20
AU408547B2 (en) 1970-11-27

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