BE653103A - - Google Patents

Info

Publication number
BE653103A
BE653103A BE653103DA BE653103A BE 653103 A BE653103 A BE 653103A BE 653103D A BE653103D A BE 653103DA BE 653103 A BE653103 A BE 653103A
Authority
BE
Belgium
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of BE653103A publication Critical patent/BE653103A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2204—Specimen supports therefor; Sample conveying means therefore
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
BE653103D 1961-01-13 BE653103A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US82439A US3027456A (en) 1961-01-13 1961-01-13 X-ray fluorescent analysis sample presenting means

Publications (1)

Publication Number Publication Date
BE653103A true BE653103A (fr)

Family

ID=22171225

Family Applications (1)

Application Number Title Priority Date Filing Date
BE653103D BE653103A (fr) 1961-01-13

Country Status (2)

Country Link
US (1) US3027456A (fr)
BE (1) BE653103A (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3148275A (en) * 1962-02-08 1964-09-08 Philips Corp Specimen holder for X-ray powder analysis
DE1267443B (de) * 1962-11-03 1968-05-02 Basf Ag Probenwechseleinrichtung fuer Roentgenstrahlen-Analysengeraete, insbesondere fuer reihenmaessig ausgefuehrte Roentgen-Fluoreszenz-Analysen
US8374673B2 (en) * 2007-01-25 2013-02-12 Warsaw Orthopedic, Inc. Integrated surgical navigational and neuromonitoring system having automated surgical assistance and control

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2500926A (en) * 1947-07-11 1950-03-21 Thomas F Boyd X-ray spectrometer holder and method
US2829261A (en) * 1953-12-31 1958-04-01 Philips Corp Rotating flat specimen device for the geiger counter x-ray spectrometer
US2837656A (en) * 1956-01-31 1958-06-03 Philips Corp X-ray analysis system and radiation detector for use in such system

Also Published As

Publication number Publication date
US3027456A (en) 1962-03-27

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