BE651551A - - Google Patents

Info

Publication number
BE651551A
BE651551A BE651551DA BE651551A BE 651551 A BE651551 A BE 651551A BE 651551D A BE651551D A BE 651551DA BE 651551 A BE651551 A BE 651551A
Authority
BE
Belgium
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of BE651551A publication Critical patent/BE651551A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2637—Circuits therefor for testing other individual devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
BE651551D 1963-08-09 1964-08-07 BE651551A (xx)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES0086651 1963-08-09

Publications (1)

Publication Number Publication Date
BE651551A true BE651551A (xx) 1965-02-08

Family

ID=7513180

Family Applications (1)

Application Number Title Priority Date Filing Date
BE651551D BE651551A (xx) 1963-08-09 1964-08-07

Country Status (4)

Country Link
US (1) US3315156A (xx)
BE (1) BE651551A (xx)
CH (1) CH408202A (xx)
GB (1) GB1019685A (xx)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3490036A (en) * 1968-01-15 1970-01-13 Western Electric Co Method for testing a crystal wherein the crystal is connected in series with a conductive core to form a single current conducting loop
US3524130A (en) * 1968-09-10 1970-08-11 Atomic Energy Commission Non-contact spark-gap current tool-setting device
NL7106853A (xx) * 1971-05-19 1972-11-21
US3953796A (en) * 1973-06-05 1976-04-27 Siemens Aktiengesellschaft Method and apparatus for measuring electrical conductivity
US4208624A (en) * 1978-08-09 1980-06-17 Bell Telephone Laboratories, Incorporated Method and apparatus for investigating dielectric semiconductor materials
DE3036734A1 (de) * 1980-09-29 1982-05-06 Siemens AG, 1000 Berlin und 8000 München Verfahren zur messung von widerstaenden und kapazitaeten von elektronischen bauelementen
IL77207A (en) * 1985-12-03 1990-11-29 Benjamin Gavish Device and method for monitoring small displacements of a peak in a frequency spectrum

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1976904A (en) * 1931-03-27 1934-10-16 Frederick E Terman Loss metering circuit
US1960168A (en) * 1933-03-28 1934-05-22 Light Sensitive Apparatus Corp Oil tester using radio frequency
US2358462A (en) * 1943-07-30 1944-09-19 Standard Telephones Cables Ltd Measuring device
US2603754A (en) * 1945-03-17 1952-07-15 Univ Leland Stanford Junior High-frequency apparatus
US2567587A (en) * 1945-12-10 1951-09-11 Zigmond W Wilchinsky Method and apparatus for measuring capacitance
US2614153A (en) * 1948-05-18 1952-10-14 Tesla Nat Corp Method of and device for measuring and controlling the quality factor and damping factor of electric circuits and components thereof
US2939073A (en) * 1958-08-14 1960-05-31 Magnaflux Corp Conductivity measuring instrument

Also Published As

Publication number Publication date
CH408202A (de) 1966-02-28
GB1019685A (en) 1966-02-09
US3315156A (en) 1967-04-18

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