BE646014A - - Google Patents

Info

Publication number
BE646014A
BE646014A BE646014A BE646014A BE646014A BE 646014 A BE646014 A BE 646014A BE 646014 A BE646014 A BE 646014A BE 646014 A BE646014 A BE 646014A BE 646014 A BE646014 A BE 646014A
Authority
BE
Belgium
Application number
BE646014A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to BE646014A priority Critical patent/BE646014A/xx
Publication of BE646014A publication Critical patent/BE646014A/xx
Priority to LU48050A priority patent/LU48050A1/xx
Priority to DEC12880U priority patent/DE1960083U/de
Priority to US443822A priority patent/US3400265A/en
Priority to NL6504158A priority patent/NL6504158A/xx
Priority to SE4236/65A priority patent/SE306436B/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
BE646014A 1964-04-01 1964-04-01 BE646014A (cs)

Priority Applications (6)

Application Number Priority Date Filing Date Title
BE646014A BE646014A (cs) 1964-04-01 1964-04-01
LU48050A LU48050A1 (cs) 1964-04-01 1965-02-23
DEC12880U DE1960083U (de) 1964-04-01 1965-03-23 Universal-spektrometer hoher empfindlichkeit fuer elektromagnetische wellen.
US443822A US3400265A (en) 1964-04-01 1965-03-30 X-ray spectrometry apparatus having both interchangeable specimens and radiation sources
NL6504158A NL6504158A (cs) 1964-04-01 1965-04-01
SE4236/65A SE306436B (cs) 1964-04-01 1965-04-01

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
BE646014A BE646014A (cs) 1964-04-01 1964-04-01

Publications (1)

Publication Number Publication Date
BE646014A true BE646014A (cs) 1964-10-01

Family

ID=3846261

Family Applications (1)

Application Number Title Priority Date Filing Date
BE646014A BE646014A (cs) 1964-04-01 1964-04-01

Country Status (6)

Country Link
US (1) US3400265A (cs)
BE (1) BE646014A (cs)
DE (1) DE1960083U (cs)
LU (1) LU48050A1 (cs)
NL (1) NL6504158A (cs)
SE (1) SE306436B (cs)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4008683A (en) * 1973-07-16 1977-02-22 Varian Associates Machine for treating wafer-form items
US4033904A (en) * 1974-03-22 1977-07-05 Varian Associates, Inc. Interchangeable specimen trays and apparatus for a vacuum type testing system
DK135257B (da) * 1975-07-09 1977-03-21 Danfysik As Apparat til ion-implantation i emner, især skiver af halvledermateriale.

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3073951A (en) * 1960-07-28 1963-01-15 Combustion Eng Vacuum lock
US3099743A (en) * 1961-07-07 1963-07-30 Ichinokawa Takeo Combined electron probe microanalyzer and x-ray diffraction instrument

Also Published As

Publication number Publication date
DE1960083U (de) 1967-05-11
SE306436B (cs) 1968-11-25
US3400265A (en) 1968-09-03
LU48050A1 (cs) 1965-04-23
NL6504158A (cs) 1965-10-04

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