BE543825A - - Google Patents
Info
- Publication number
- BE543825A BE543825A BE543825DA BE543825A BE 543825 A BE543825 A BE 543825A BE 543825D A BE543825D A BE 543825DA BE 543825 A BE543825 A BE 543825A
- Authority
- BE
- Belgium
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67121—Apparatus for making assemblies not otherwise provided for, e.g. package constructions
-
- C—CHEMISTRY; METALLURGY
- C10—PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
- C10K—PURIFYING OR MODIFYING THE CHEMICAL COMPOSITION OF COMBUSTIBLE GASES CONTAINING CARBON MONOXIDE
- C10K1/00—Purifying combustible gases containing carbon monoxide
- C10K1/08—Purifying combustible gases containing carbon monoxide by washing with liquids; Reviving the used wash liquors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2637—Circuits therefor for testing other individual devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Combustion & Propulsion (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Organic Chemistry (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US486073A US2748349A (en) | 1955-02-04 | 1955-02-04 | Fabrication of junction transistors |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BE543825A true BE543825A (de) |
Family
ID=23930493
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BE543825D BE543825A (de) | 1955-02-04 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US2748349A (de) |
| BE (1) | BE543825A (de) |
| FR (1) | FR1147942A (de) |
| GB (1) | GB789712A (de) |
| NL (2) | NL98752C (de) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1165755B (de) * | 1957-09-26 | 1964-03-19 | Philco Corp Eine Ges Nach Den | Verfahren zur Befestigung von Zuleitungen an den Kontaktelektroden von Halbleiterkoerpern und Vorrichtung zur Durchfuehrung des Verfahrens |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2951204A (en) * | 1957-04-08 | 1960-08-30 | Texas Instruments Inc | Method and apparatus for locating the base section of a transistor bar |
| US2956230A (en) * | 1958-08-29 | 1960-10-11 | Texas Instruments Inc | Method for locating p-n junctions in semiconductor bodies |
| US3067387A (en) * | 1959-07-14 | 1962-12-04 | Ibm | P-n junction position determination |
| US3185927A (en) * | 1961-01-31 | 1965-05-25 | Kulicke & Soffa Mfg Co | Probe instrument for inspecting semiconductor wafers including means for marking defective zones |
| US3351733A (en) * | 1963-08-21 | 1967-11-07 | Hitachi Ltd | Welding method |
| US3548491A (en) * | 1967-02-03 | 1970-12-22 | Ibm | Mass production of electronic devices |
-
0
- BE BE543825D patent/BE543825A/xx unknown
- NL NL201406D patent/NL201406A/xx unknown
- NL NL98752D patent/NL98752C/xx active
-
1955
- 1955-02-04 US US486073A patent/US2748349A/en not_active Expired - Lifetime
- 1955-10-11 FR FR1147942D patent/FR1147942A/fr not_active Expired
-
1956
- 1956-01-25 GB GB2470/56A patent/GB789712A/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1165755B (de) * | 1957-09-26 | 1964-03-19 | Philco Corp Eine Ges Nach Den | Verfahren zur Befestigung von Zuleitungen an den Kontaktelektroden von Halbleiterkoerpern und Vorrichtung zur Durchfuehrung des Verfahrens |
Also Published As
| Publication number | Publication date |
|---|---|
| FR1147942A (fr) | 1957-12-02 |
| NL201406A (de) | |
| US2748349A (en) | 1956-05-29 |
| NL98752C (de) | |
| GB789712A (en) | 1958-01-29 |