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Publication date
Publication of BE448873ApublicationCriticalpatent/BE448873A/xx
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
G01R31/26—Testing of individual semiconductor devices
G01R31/2607—Circuits therefor
G01R31/2608—Circuits therefor for testing bipolar transistors
G01R31/261—Circuits therefor for testing bipolar transistors for measuring break-down voltage or punch through voltage therefor