AU8019200A - Real-time interferometric deformation analysis - Google Patents

Real-time interferometric deformation analysis

Info

Publication number
AU8019200A
AU8019200A AU80192/00A AU8019200A AU8019200A AU 8019200 A AU8019200 A AU 8019200A AU 80192/00 A AU80192/00 A AU 80192/00A AU 8019200 A AU8019200 A AU 8019200A AU 8019200 A AU8019200 A AU 8019200A
Authority
AU
Australia
Prior art keywords
real
deformation analysis
interferometric deformation
time interferometric
time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU80192/00A
Inventor
John A. Hanlon
Gregory J. Hayman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hytec Inc
Original Assignee
Hytec Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hytec Inc filed Critical Hytec Inc
Publication of AU8019200A publication Critical patent/AU8019200A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/162—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
    • G01L5/0047—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes measuring forces due to residual stresses

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
AU80192/00A 1999-10-13 2000-10-13 Real-time interferometric deformation analysis Abandoned AU8019200A (en)

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
US15933599P 1999-10-13 1999-10-13
US15947099P 1999-10-13 1999-10-13
US60159470 1999-10-13
US60159335 1999-10-13
US68725500A 2000-10-12 2000-10-12
US68741500A 2000-10-12 2000-10-12
US09687255 2000-10-12
US09687415 2000-10-12
PCT/US2000/028335 WO2001027557A1 (en) 1999-10-13 2000-10-13 Real-time interferometric deformation analysis

Publications (1)

Publication Number Publication Date
AU8019200A true AU8019200A (en) 2001-04-23

Family

ID=27496373

Family Applications (2)

Application Number Title Priority Date Filing Date
AU78796/00A Abandoned AU7879600A (en) 1999-10-13 2000-10-13 Interferometric residual-stress analysis
AU80192/00A Abandoned AU8019200A (en) 1999-10-13 2000-10-13 Real-time interferometric deformation analysis

Family Applications Before (1)

Application Number Title Priority Date Filing Date
AU78796/00A Abandoned AU7879600A (en) 1999-10-13 2000-10-13 Interferometric residual-stress analysis

Country Status (2)

Country Link
AU (2) AU7879600A (en)
WO (2) WO2001027583A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CZ301826B6 (en) 2008-03-21 2010-06-30 Biologické centrum AV CR, v.v.i., Ústav molekulární biologie rostlin Method of investigating dynamics of volume changes of physiologically, particularly photo synthetically active samples and apparatus for making the same
JP6516323B2 (en) * 2015-03-05 2019-05-22 株式会社神戸製鋼所 Residual stress estimation method and residual stress estimation device
CN110487171B (en) * 2019-05-30 2021-08-17 北京工业大学 Multifunctional speckle interference device imaging system
RU205100U1 (en) * 2019-12-24 2021-06-28 Федеральное государственное унитарное предприятие "ВСЕРОССИЙСКИЙ НАУЧНО-ИССЛЕДОВАТЕЛЬСКИЙ ИНСТИТУТ ОПТИКО-ФИЗИЧЕСКИХ ИЗМЕРЕНИЙ" (ФГУП "ВНИИОФИ") DEVICE FOR CONTROL OF ADDITIVE MANUFACTURING OF PARTS
CN113566727B (en) * 2021-07-07 2024-03-19 上海大学 High-precision video extensometer based on phase-shift shearing electronic speckle interference and measuring method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4591996A (en) * 1981-05-18 1986-05-27 Vachon Reginald I Apparatus and method for determining stress and strain in pipes, pressure vessels, structural members and other deformable bodies
US4999681A (en) * 1988-06-24 1991-03-12 Mader David L Real-time halographic interferometry with a pulsed laser and flicker-free viewing
US5426498A (en) * 1994-04-04 1995-06-20 University Of New Mexico Method and apparatus for real-time speckle interferometry for strain or displacement of an object surface
DE19524036C2 (en) * 1995-01-24 2002-04-11 Fraunhofer Ges Forschung Method and device for interferometric detection of the shape and / or shape change of test specimens
GB2298710B (en) * 1995-03-08 1999-05-26 British Aerospace Apparatus and method for non destructive testing of coherent radiation illumin ated material

Also Published As

Publication number Publication date
WO2001027557A1 (en) 2001-04-19
WO2001027583A1 (en) 2001-04-19
AU7879600A (en) 2001-04-23
WO2001027557A9 (en) 2002-08-01

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase