AU2531600A - Goniometer - Google Patents

Goniometer

Info

Publication number
AU2531600A
AU2531600A AU25316/00A AU2531600A AU2531600A AU 2531600 A AU2531600 A AU 2531600A AU 25316/00 A AU25316/00 A AU 25316/00A AU 2531600 A AU2531600 A AU 2531600A AU 2531600 A AU2531600 A AU 2531600A
Authority
AU
Australia
Prior art keywords
goniometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU25316/00A
Inventor
Daniel Baumann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MEIER MARKUS INSTITUT fur MECHANISCHE SYSTEME
Original Assignee
MEIER MARKUS INST fur MECHANIS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MEIER MARKUS INST fur MECHANIS filed Critical MEIER MARKUS INST fur MECHANIS
Publication of AU2531600A publication Critical patent/AU2531600A/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/202—Movement
    • H01J2237/20242—Eucentric movement
AU25316/00A 1999-02-27 2000-02-24 Goniometer Abandoned AU2531600A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CH35299 1999-02-27
CH352/99 1999-02-27
PCT/CH2000/000099 WO2000052731A2 (en) 1999-02-27 2000-02-24 Goniometer

Publications (1)

Publication Number Publication Date
AU2531600A true AU2531600A (en) 2000-09-21

Family

ID=4185072

Family Applications (1)

Application Number Title Priority Date Filing Date
AU25316/00A Abandoned AU2531600A (en) 1999-02-27 2000-02-24 Goniometer

Country Status (2)

Country Link
AU (1) AU2531600A (en)
WO (1) WO2000052731A2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113906536A (en) * 2019-05-20 2022-01-07 埃尔迪科科学股份有限公司 Diffractometer for charged particle crystallography
CN113906536B (en) * 2019-05-20 2024-04-19 埃尔迪科科学股份有限公司 Diffractometer for charged particle crystallography

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2908235B1 (en) * 2006-11-07 2009-01-16 Inst Nat Sciences Appliq EQUIPMENT FOR THE TOMOGRAPHY OF A SAMPLE
CA2718546A1 (en) * 2008-03-15 2009-09-24 University Of Sheffield Specimen holder assembly

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4727278A (en) * 1985-10-04 1988-02-23 Micro Pulse Systems, Inc. Piezoelectric multiaxis micropositioner
EP0457317B1 (en) * 1990-05-18 1997-11-05 Hitachi, Ltd. Electron microscope, electron microscope specimen actuator and method for observing microscopic image
IL113291A0 (en) * 1995-04-06 1995-07-31 Nanomotion Ltd A multi-axis rotation device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113906536A (en) * 2019-05-20 2022-01-07 埃尔迪科科学股份有限公司 Diffractometer for charged particle crystallography
CN113906536B (en) * 2019-05-20 2024-04-19 埃尔迪科科学股份有限公司 Diffractometer for charged particle crystallography

Also Published As

Publication number Publication date
WO2000052731A2 (en) 2000-09-08
WO2000052731A3 (en) 2000-12-28

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase