AU7328800A - Lithography using quantum entangled particles - Google Patents
Lithography using quantum entangled particlesInfo
- Publication number
- AU7328800A AU7328800A AU73288/00A AU7328800A AU7328800A AU 7328800 A AU7328800 A AU 7328800A AU 73288/00 A AU73288/00 A AU 73288/00A AU 7328800 A AU7328800 A AU 7328800A AU 7328800 A AU7328800 A AU 7328800A
- Authority
- AU
- Australia
- Prior art keywords
- lithography
- quantum entangled
- entangled particles
- particles
- quantum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70375—Multiphoton lithography or multiphoton photopolymerization; Imaging systems comprising means for converting one type of radiation into another type of radiation
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0005—Production of optical devices or components in so far as characterised by the lithographic processes or materials used therefor
- G03F7/001—Phase modulating patterns, e.g. refractive index patterns
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2051—Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70408—Interferometric lithography; Holographic lithography; Self-imaging lithography, e.g. utilizing the Talbot effect
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
Applications Claiming Priority (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13531699P | 1999-05-20 | 1999-05-20 | |
US60135316 | 1999-05-20 | ||
US09/393,451 US6252665B1 (en) | 1999-05-20 | 1999-09-10 | Lithography using quantum entangled particles |
US09393200 | 1999-09-10 | ||
US09/393,200 US6480283B1 (en) | 1999-05-20 | 1999-09-10 | Lithography system using quantum entangled photons |
US09393451 | 1999-09-10 | ||
PCT/US2000/013931 WO2000075730A1 (en) | 1999-05-20 | 2000-05-19 | Lithography using quantum entangled particles |
Publications (1)
Publication Number | Publication Date |
---|---|
AU7328800A true AU7328800A (en) | 2000-12-28 |
Family
ID=27384692
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU73288/00A Abandoned AU7328800A (en) | 1999-05-20 | 2000-05-19 | Lithography using quantum entangled particles |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP1203265A4 (en) |
AU (1) | AU7328800A (en) |
WO (1) | WO2000075730A1 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2449290B (en) | 2007-05-17 | 2010-09-22 | Toshiba Res Europ Ltd | An optical system |
GB2451803B (en) | 2007-06-28 | 2010-06-09 | Toshiba Res Europ Ltd | An optical retrieval system, data storage system, data storage medium and method of optical retrieval and data storage |
CN116090569B (en) * | 2023-04-06 | 2023-06-13 | 中国人民解放军军事科学院国防科技创新研究院 | Programmable discrete time quantum strolling simulation chip structure based on integrated optics |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5415835A (en) * | 1992-09-16 | 1995-05-16 | University Of New Mexico | Method for fine-line interferometric lithography |
US6042998A (en) * | 1993-09-30 | 2000-03-28 | The University Of New Mexico | Method and apparatus for extending spatial frequencies in photolithography images |
US5759744A (en) * | 1995-02-24 | 1998-06-02 | University Of New Mexico | Methods and apparatus for lithography of sparse arrays of sub-micrometer features |
US5796477A (en) * | 1997-02-27 | 1998-08-18 | Trustees Of Boston University | Entangled-photon microscopy, spectroscopy, and display |
US5955221A (en) * | 1997-11-21 | 1999-09-21 | The Regents Of The University Of California | Method and apparatus for fabrication of high gradient insulators with parallel surface conductors spaced less than one millimeter apart |
US6037082A (en) * | 1998-10-30 | 2000-03-14 | Advanced Micro Devices, Inc. | Design of a new phase shift mask with alternating chrome/phase structures |
US6111646A (en) * | 1999-01-12 | 2000-08-29 | Naulleau; Patrick | Null test fourier domain alignment technique for phase-shifting point diffraction interferometer |
-
2000
- 2000-05-19 EP EP00961318A patent/EP1203265A4/en not_active Withdrawn
- 2000-05-19 WO PCT/US2000/013931 patent/WO2000075730A1/en active Application Filing
- 2000-05-19 AU AU73288/00A patent/AU7328800A/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
EP1203265A1 (en) | 2002-05-08 |
EP1203265A4 (en) | 2006-08-02 |
WO2000075730A1 (en) | 2000-12-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |