AU408547B2 - Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base - Google Patents

Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base

Info

Publication number
AU408547B2
AU408547B2 AU42375/68A AU4237568A AU408547B2 AU 408547 B2 AU408547 B2 AU 408547B2 AU 42375/68 A AU42375/68 A AU 42375/68A AU 4237568 A AU4237568 A AU 4237568A AU 408547 B2 AU408547 B2 AU 408547B2
Authority
AU
Australia
Prior art keywords
gauging
coating
base
atomic number
ray fluorescence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
AU42375/68A
Other languages
English (en)
Other versions
AU4237568A (en
Inventor
Curtis Hill Robert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3M Co
Original Assignee
Minnesota Mining and Manufacturing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Minnesota Mining and Manufacturing Co filed Critical Minnesota Mining and Manufacturing Co
Publication of AU4237568A publication Critical patent/AU4237568A/en
Application granted granted Critical
Publication of AU408547B2 publication Critical patent/AU408547B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AU42375/68A 1965-10-28 1968-08-21 Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base Expired AU408547B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US505479A US3417243A (en) 1965-10-28 1965-10-28 Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base
GB40962/68A GB1239797A (en) 1965-10-28 1968-08-27 Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base.

Publications (2)

Publication Number Publication Date
AU4237568A AU4237568A (en) 1970-02-26
AU408547B2 true AU408547B2 (en) 1970-11-27

Family

ID=26264550

Family Applications (1)

Application Number Title Priority Date Filing Date
AU42375/68A Expired AU408547B2 (en) 1965-10-28 1968-08-21 Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base

Country Status (5)

Country Link
US (1) US3417243A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
AU (1) AU408547B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
BE (1) BE719998A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE1798125A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
GB (1) GB1239797A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3525863A (en) * 1967-12-28 1970-08-25 Minnesota Mining & Mfg Differential emission x-ray gauging apparatus and method using two monochromatic x-ray beams of balanced intensity
JPS5847659B2 (ja) * 1975-08-12 1983-10-24 日新製鋼株式会社 ゴウキンカアエンテツバンノ ゴウキンカドノ ソクテイホウホウ
US4085329A (en) * 1976-05-03 1978-04-18 Hughes Aircraft Company Hard X-ray and fluorescent X-ray detection of alignment marks for precision mask alignment
FI59489C (fi) * 1978-11-21 1981-08-10 Enso Gutzeit Oy Foerfarande foer maetning av belaeggningsmaengder
DE10034747A1 (de) * 2000-07-18 2002-02-07 Manfred Liphardt Verfahren und Vorrichtung zur Feststellung der Dicke eines Beschichtungswerkstoffs auf einem Trägerwerkstoff
US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
CN100593116C (zh) * 2006-04-10 2010-03-03 上海爱斯特电子有限公司 X荧光多元素分析仪
US8724774B2 (en) * 2009-08-04 2014-05-13 Rapiscan Systems, Inc. Method and system for extracting spectroscopic information from images and waveforms
WO2012170914A1 (en) 2011-06-09 2012-12-13 Rapiscan Systems, Inc. System and method for x-ray source weight reduction
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
CN108508052B (zh) * 2018-06-11 2023-10-20 西北核技术研究所 基于参考元素的x射线荧光薄层质量厚度测量系统及方法
US11079222B2 (en) * 2019-01-30 2021-08-03 Ndc Technologies Inc. Radiation-based thickness gauge
EP4157093A4 (en) * 2020-06-01 2024-01-24 American Science and Engineering, Inc. SYSTEMS AND METHODS FOR CONTROLLING IMAGE CONTRAST IN AN X-RAY SYSTEM
US11193898B1 (en) 2020-06-01 2021-12-07 American Science And Engineering, Inc. Systems and methods for controlling image contrast in an X-ray system
WO2024026152A1 (en) 2022-07-26 2024-02-01 Rapiscan Holdings, Inc. Methods and systems for performing on-the-fly automatic calibration adjustments of x-ray inspection systems

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2926257A (en) * 1955-05-16 1960-02-23 Friedman Herbert Method of measuring the thickness of thin coatings

Also Published As

Publication number Publication date
US3417243A (en) 1968-12-17
BE719998A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1969-02-27
DE1798125A1 (de) 1972-01-20
AU4237568A (en) 1970-02-26
GB1239797A (en) 1971-07-21

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