AU2023270259A1 - Temperature testing system and method for explosion-proof lamp under most unfavorable conditions - Google Patents
Temperature testing system and method for explosion-proof lamp under most unfavorable conditions Download PDFInfo
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using thermoelectric elements, e.g. thermocouples
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D21/00—Measuring or testing not otherwise provided for
- G01D21/02—Measuring two or more variables by means not covered by a single other subclass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/0205—Mechanical elements; Supports for optical elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/03—Arrangements for indicating or recording specially adapted for radiation pyrometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/48—Thermography; Techniques using wholly visual means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
- G01K1/02—Means for indicating or recording specially adapted for thermometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
- G01K1/14—Supports; Fastening devices; Arrangements for mounting thermometers in particular locations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
- G01K1/14—Supports; Fastening devices; Arrangements for mounting thermometers in particular locations
- G01K1/143—Supports; Fastening devices; Arrangements for mounting thermometers in particular locations for measuring surface temperatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0423—Input/output
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0428—Safety, monitoring
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- Automation & Control Theory (AREA)
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- Analytical Chemistry (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Circuit Arrangement For Electric Light Sources In General (AREA)
Abstract
OF THE DISCLOSURE
The present invention provides a temperature testing system and method for an
explosion-proof lamp under most unfavorable conditions, and relates to the technical
field of temperature testing of an explosion-proof lamp. The system comprises a PIC
microcontroller, two thermocouple units, a multi-channel power supply device, a
thermal imager, a pressure sensor, a humidity sensor, a voltage transformer, a current
transformer, a display screen, a mobile module, a communication unit, an industrial
computer, a human-computer interaction panel, and a sound and light warning unit,
wherein the PIC microcontroller controls the movement of the mobile module through
the human-computer interaction panel to enable the explosion-proof induction lamp to
be in the full power operation state, thereby ensuring that the temperature testing
process of the explosion-proof induction lamp is always under the most unfavorable
conditions; and when current data, voltage data, pressure data and humidity data are
within the set value range, the PIC microcontroller receives environment temperature
and temperate data of the explosion-proof lamp under most unfavorable conditions,
acquired by the two thermocouple units, processes the environment temperature to
obtain the temperature data of the explosion-proof lamp under the most unfavorable
conditions, and further judges whether temperature testing is qualified.
35
Description
1. Field of the Invention
[0001] The present invention relates to the technical field of temperature testing
of an explosion-proof lamp, in particular to a temperature testing system and method
for an explosion-proof lamp under most unfavorable conditions.
2. The Prior Arts
[0002] An explosion-proof lamp refers to illumination lamps such as explosion
insulation tunnel lights, explosion insulation bracket lights, explosion insulation
illumination signal lights, and explosion insulation emergency lights used in explosive
places, which are widely used in flammable and explosive places such as coal mines,
chemical engineering, and places using petroleum. An explosion insulation housing
structure not only prevents the internal electric spark of the explosion-proof lamp from
igniting external explosive gas, but also avoids damage to the explosion-proof lamp by
external environmental explosion, thereby ensuring safe operation of the explosion
proof lamp in explosive places. However, the explosion insulation housing structure
enables internal heat not to release timely, and besides, there is no natural illumination
underground, so that the explosion-proof lamp is in a 24-hour operating state; and
especially in explosive places, the operating environment temperature is high, and in
coal mine underground working faces, the maximum temperature can reach 40 °C, resulting in the temperature of the explosion-proof lamp being much higher than that of ground illumination equipment.
[0003] The national standard GB/T 3836.1-2021 "Explosive Atmospheres -Part 1:
General Requirements for Equipment" clearly stipulates that the surface temperature of
the explosion-proof lamp shall not exceed 150 °C under the most unfavorable
conditions. At present, during the highest surface temperature testing of the explosion
proof lamp, infrared point thermometers are used to test temperature data, and selection
of testing points is not accurate (the explosion-proof lamp has complex structure and
large maximum surface area, and by using the point thermometers, the testing points
can only be selected based on experience). At the same time, testing data needs to be
manually recorded, and whether the testing is completed needs to be manually judged,
resulting in a large workload in the testing process, low accuracy of testing data, and
poor reliability of testing results, thereby bringing accident hazards to the safe operation
of the explosion-proof lamp in the explosive places. In addition, for energy-saving
explosion-proof induction lights, manual triggering of the light emitting side of the
lamp is required to ensure that the temperature testing process is under the most
unfavorable conditions. Completing temperature testing needs several hours (usually
more than 4 hours), thereby increasing the workload of testing personnel, reducing
testing efficiency, and hindering the intelligent development of the inspecting and
testing industry.
[00041 The technical problem to be solved by the present invention is to provide
a temperature testing system and method for an explosion-proof lamp under most
unfavorable conditions, in response to the shortcomings of the existing technology
mentioned above, to achieve temperature testing for the explosion-proof lamp under
the most unfavorable conditions.
[0005] In order to solve the technical problem,
[0006] the temperature testing system for the explosion-proof lamp under most
unfavorable conditions is characterized by comprising a PIC microcontroller, a
thermocouple unit A, a thermocouple unit B, a multi-channel power supply device, a
thermal imager, a pressure sensor, a humidity sensor, a voltage transformer, a current
transformer, a display screen, a mobile module, a communication unit, an industrial
computer, a human-computer interaction panel, and a sound and light warning unit,
wherein testing ends of the thermocouple unit A and the thermocouple unit B are
respectively placed on the surface of the explosion-proof lamp and in testing
environment; temperature data output ends of the thermocouple unit A and the
thermocouple unit B are electrically connected with a temperature data input end of the
PIC microcontroller; an input end of the multi-channel power supply device is
connected with electric supply, and an output end is electrically connected with power
input terminals of the PIC microcontroller, the display screen, the industrial computer,
the sound and light warning unit, and the explosion-proof lamp; testing ends of the
pressure sensor and the humidity sensor are both placed in the testing environment; a
pressure signal output end of the pressure sensor and a humidity signal output end of the humidity sensor are electrically connected with a pressure signal input end and a humidity signal input end of the PIC microcontroller respectively; a testing end of the voltage transformer is electrically connected with the power input terminal of the explosion-proof lamp, and a voltage signal output end is electrically connected with a voltage signal input end of the PIC microcontroller; a testing end of the current transformer is connected in series with a power supply line of the explosion-proof lamp, and a current signal output end is electrically connected with a current signal input end of the PIC microcontroller; a signal input end of the display screen is electrically connected with a signal output end of the PIC microcontroller; the industrial computer is electrically connected with the PIC microcontroller through the communication unit so as to store data received by the PIC microcontroller; a control signal output end of the human-computer interaction panel is connected with the multi-channel power supply device and the PIC microcontroller; a signal input end of the sound and light warning unit is electrically connected with a warning signal output end of the PIC microcontroller; and an imaging testing end of the thermal imager faces opposite to the surface of an explosion-proof electrical appliance during testing; and the mobile module operates on the front of a glass cover of the explosion-proof lamp.
[00071 Preferably, the thermocouple unit A and the thermocouple unit B each
comprise two thermocouples which are used to test the temperature of the surface of
the explosion-proof lamp and the temperature of the testing environment; the two
thermocouples of the thermocouple unit A are pasted on the surfaces of two testing
points of a housing and the glass cover of the explosion-proof lamp; and the two thermocouples of the thermocouple unit B are placed on two sides of the explosion proof lamp at a distance of 1 meter from a same horizontal plane to test the temperature of the testing environment.
[0008] Preferably, the voltage transformer and the current transformer are both
passive transformers which are used to test the voltage and the current of the explosion
proof lamp;
[0009] preferably, the pressure sensor and the humidity sensor are respectively
used to test the pressure and the humidity of the testing environment;
[0010] preferably, the display screen is used to display the working status of the
system, the temperature of the testing environment, the humidity of the testing
environment, the pressure of the testing environment, and temperature data of the
housing and the glass cover of the explosion-proof lamp; and
[0011] preferably, the human-computer interaction panel is used for starting,
testing, and stopping a power control and testing system, and comprises a power starting
and stopping button of the multi-channel power supply device, a power starting control
button of the PIC microcontroller, a power starting control button of the explosion
proof lamp, a power starting control button of the display screen, a power starting
control button of the industrial computer, a starting, testing and stopping button of the
testing system, and an emergency stop button.
[0012] On the other hand, the present invention also provides a temperature testing
method for an explosion-proof lamp under most unfavorable conditions, comprising the
following steps:
[00131 Step 1: the power supply of the multi-channel power supply device, the
power supply of the PIC microcontroller, the power supply of the display screen, and
the power supply of the industrial computer are started through the human-computer
interaction panel, the power supply line is selected according to the voltage level of the
explosion-proof lamp, and the power supply of the explosion-proof lamp is started;
[0014] Step 2: the PIC microcontroller controls the movement of the mobile
module through the human-computer interaction panel to enable the explosion-proof
induction lamp to be in the full power operation state, thereby ensuring that the
temperature testing process of the explosion-proof induction lamp is always under the
most unfavorable conditions;
[0015] Step 3: the PIC microcontroller receives electrical signals acquired by the
current transformer, the voltage transformer, the pressure sensor, and the humidity
sensor, converts the electrical signals into corresponding current data, voltage data,
pressure data, and humidity data, stops temperature testing under the most unfavorable
conditions of the explosion-proof lamp when any data exceeds the set value, and
prompts system fault on the display screen, the sound and light warning unit performs
sound and light warnings, when the current data, voltage data, pressure data and
humidity data are all within the set value range, Step 4 is performed, and running the
temperature testing on the explosion-proof lamp under the most unfavorable conditions
is continued;
[0016] Step 4: the PIC microcontroller receives the temperature data acquired by
the thermocouple unit A and the thermocouple unit B, and records the temperature testing time of the explosion-proof lamp under the most unfavorable conditions, and when the testing time reaches the set value, prompting is performed on the display screen;
[00171 Step 5: the thermal imager is used to search for the highest temperature
point on the housing and the glass cover of the explosion-proof lamp, and fixes the
thermocouple unit A at the highest temperature point of the housing and the glass cover
of the explosion-proof lamp;
[0018] Step 6: the PIC microcontroller continues to receive n temperature data ti
2 t t, , acquired by the thermocouple unit A, and calculates the difference value
of the temperature data within the period after 1 hour of temperature data acquisition,
so as to judge whether the temperature testing of the explosion-proof lamp has ended
under the most unfavorable conditions, wherein the calculation method is as follows: At = t. 60 -t (1)
[0019] wherein t' is the temperature data acquired by the thermocouple unit A
for themth time, and m is a positive integer between 1 and n-60; t.+60 is the
temperature data acquired by the thermocouple unit A for the (m+ 6 0)th time; Atis
difference value of the temperature data which is acquired by the thermocouple unit A
for the (m+ 6 0)thtime and themth time;
[0020] the PIC microcontroller compares At with 1, if At is greater than or
equal to 1, the PIC microcontroller controls the thermocouple unit A and the
thermocouple unit B to continue to acquire the environment temperature and the
temperature data of the explosion-proof lamp under the most unfavorable conditions, and Step 7 is performed; if At is less than 1, the temperature testing on the explosion t proof lamp under the most unfavorable conditions ends; t is actual temperature of the explosion-proof lamp under the most unfavorable conditions;
[0021] Step 7: the PIC microcontroller receives the environment temperature and
the temperature data of the explosion-proof lamp under the most unfavorable
conditions, acquired by the thermocouple unit A and the thermocouple unit B in real
time, processes the environment temperature to obtain the average temperature within
a quarter of the time after the temperature testing, and converts the temperature to obtain
the temperature data of the explosion-proof lamp under the most unfavorable
conditions, as shown in the following formula:
T + T+---+ T,=t. - 1 +40 g (2)
[0022] wherein , is the temperature of the explosion-proof lamp under the most
unfavorable conditions; is the first temperature of the environment within a quarter
of the time after the temperature testing of the explosion-proof lamp under the most
unfavorable conditions; T2 is the second temperature of the environment within a
quarter of the time after the temperature testing of the explosion-proof lamp under the
T most unfavorable conditions; g is the last temperature of the environment within a
quarter of the time after the temperature testing of the explosion-proof lamp under the
most unfavorable conditions; g is the number of environment temperature acquired
within a quarter of the time after the temperature testing of the explosion-proof lamp
under the most unfavorable conditions;
[00231 Step 8: the PIC microcontroller compares the temperature of the explosion
proof lamp under the most unfavorable conditions with data of the explosion-proof
lamp under the most unfavorable conditions, required by a temperature testing standard,
and judges whether the temperature testing of the explosion-proof lamp under the most
unfavorable conditions is qualified; if the data of the explosion-proof lamp under the
most unfavorable conditions, required by the temperature testing standard, is greater
than the temperature of the explosion-proof lamp under the most unfavorable
conditions, the temperature testing of the explosion-proof lamp under the most
unfavorable conditions is qualified; and if the data of the explosion-proof lamp under
the most unfavorable conditions, required by the temperature testing standard, is less
than or equal to the temperature of the explosion-proof lamp under the most unfavorable
conditions, the temperature testing of the explosion-proof lamp under the most
unfavorable conditions is not qualified.
[0024] The PIC microcontroller controls the movement of the mobile module
through the human-computer interaction panel to enable an explosion-proof induction
lamp to be in the full power operation state through the following specific method:
[0025] the explosion-proof induction lamp is triggered in a wireless driving
manner, when the explosion-proof induction lamp is in the low-power operation state,
the PIC microcontroller controls the mobile module to move along a straight line L in
the direction of a tangent of a circle formed by using the explosion-proof induction
lamp as a center 0, two explosion-proof induction light inducing points being
symmetrical with the center 0 are found, and the mobile module moves back and forth within the range of two endpoints at a certain distance from the two explosion-proof induction light inducing points.
[0026] In order to guarantee that the temperature testing process of the explosion
proof induction lamp is under the most unfavorable conditions, the PIC microcontroller
acquires voltage and current signals from the full power operation and temperature
testing process, calculates the maximum power and operating power of the explosion
proof induction lamp, and then judges whether the explosion-proof induction lamp
operates under the most unfavorable conditions, wherein the specific method is as
follows:
[00271 Step SI: the PIC microcontroller receives the voltage and current signals
of the explosion-proof induction lamp in the full power operation state acquired by the
current transformer and the voltage transformer, and calculates the full power of the
explosion-proof induction lamp, wherein the calculation method is as follows:
1Lx =U. xIm (3)
[0028] wherein ax is the full power of the explosion-proof induction lamp;
Umax is voltage of the explosion-proof induction lamp in the full power operation state;
Imax is current of the explosion-proof induction lamp in the full power operation state;
[0029] Step S2: the PIC microcontroller receives voltage data and current data of
the explosion-proof induction lamp under the most unfavorable conditions during the
temperature testing process, acquired by the current transformer and the voltage
transformer, and further obtains the operating power of the explosion-proof induction
lamp, wherein the calculation method is as follows:
P=UxI (4)
[00301 wherein P is the operating power of the explosion-proof induction lamp;
U is operating voltage of the explosion-proof induction lamp; I is operating current
of the explosion-proof induction lamp;
[0031] Step S3, a difference value between the full power "- of the explosion
proof induction lamp and the operating power P of the explosion-proof induction
lamp is obtained, as shown in the following formula:
AP=P . - P (5)
[0032] wherein AP is a difference value between the full power n- of the
explosion-proof induction lamp and the operating power P of the explosion-proof
induction lamp;
[0033] if AP is less than or equal to zero, it is determined that the explosion
proof induction lamp does not operate in the full power condition, and the temperature
testing of the explosion-proof induction lamp under the most unfavorable conditions
ends; and if AP is greater than zero, it is determined that the explosion-proof
induction lamp operates in the full power condition, Step S4 is executed, and the
temperature testing of the explosion-proof induction lamp under the most unfavorable
conditions is continued.
[0034] The beneficial effect of adopting the above technical solution lies in that
the temperature testing system and method for the explosion-proof lamp under the most
unfavorable conditions solve the technical problems of high temperature testing
workload and low testing accuracy of the explosion-proof lamp under the most unfavorable conditions, improve the temperature testing ability and testing level under the most unfavorable conditions, improve testing efficiency, and save power resources, thereby providing testing and verification technical support for the selection of the explosion insulation housing and components in the research and development process of new explosion-proof lamp products, ensuring the quality of explosion-proof lamp products, and promoting continuous and healthy development of the fields of detection and testing and explosion-proof lamps.
[0035] Fig. 1 shows a structural block diagram of a temperature testing system for
an explosion-proof lamp under most unfavorable conditions provided by the
embodiment of the present invention;
[0036] Fig.2 shows a flowchart of a temperature testing method for the explosion
proof lamp under most unfavorable conditions provided by the embodiment of the
present invention;
[00371 Fig.3 shows a schematic diagram of a movement trajectory of a mobile
module provided by the embodiment of the present invention.
[0038] The following will provide a further detailed description of the specific
embodiments of the present invention in conjunction with the accompanying drawings and embodiments. The following embodiments are used to illustrate the present invention, but are not intended to limit its scope.
[0039] In the embodiments, the temperature testing system for an explosion-proof
lamp under most unfavorable conditions, as shown in Fig. 1, comprises a PIC
microcontroller, a thermocouple unit A, a thermocouple unit B, a multi-channel power
supply device, a thermal imager, a pressure sensor, a humidity sensor, a voltage
transformer, a current transformer, a display screen, a mobile module, a communication
unit, an industrial computer, a human-computer interaction panel, and a sound and light
warning unit, wherein testing ends of the thermocouple unit A and the thermocouple
unit B are respectively placed on the surface of the explosion-proof lamp and in testing
environment; temperature data output ends of the thermocouple unit A and the
thermocouple unit B are electrically connected with a temperature data input end of the
PIC microcontroller; an input end of the multi-channel power supply device is
connected with electric supply through a three-pin plug, and an output end is electrically
connected with power input terminals of the PIC microcontroller, the display screen,
the industrial computer, the sound and light warning unit, and the explosion-proof lamp
so as to supply power for electrical equipment; the pressure sensor and the humidity
sensor are respectively used for testing the pressure and the humidity of the testing
environment; testing ends of the pressure sensor and the humidity sensor are both
placed in the testing environment; a pressure signal output end of the pressure sensor
and a humidity signal output end of the humidity sensor are electrically connected with
a pressure signal input end and a humidity signal input end of the PIC microcontroller respectively; a testing end of the voltage transformer is electrically connected with the power input terminal of the explosion-proof lamp, and a voltage signal output end is electrically connected with a voltage signal input end of the PIC microcontroller; a testing end of the current transformer is connected in series with a power supply line of the explosion-proof lamp, and a current signal output end is electrically connected with a current signal input end of the PIC microcontroller; the voltage transformer and the current transformer are both high-accuracy passive transformers which are used to test the voltage and the current of the explosion-proof lamp; a signal input end of the display screen is electrically connected with a signal output end of the PIC microcontroller so as to display the working status (normal operation, fault and stop) of the system, the temperature of the testing environment, the humidity of the testing environment, the pressure of the testing environment, and temperature data of the housing and the glass cover of the explosion-proof lamp;
[0040] the industrial computer is electrically connected with the PIC
microcontroller through the communication unit so as to store data received by the PIC
microcontroller; a control signal output end of the human-computer interaction panel is
connected with the multi-channel power supply device and the PIC microcontroller; a
signal input end of the sound and light warning unit is electrically connected with a
warning signal output end of the PIC microcontroller; an imaging testing end of the
thermal imager faces opposite to the surface of an explosion-proof electrical appliance
during testing; and the mobile module operates on the front of the glass cover of the explosion-proof lamp under the control of the PIC microcontroller, so as to enable the explosion-proof induction lamp to be in full power operation state.
[0041] The human-computer interaction panel is used for starting, testing, and
stopping a power control and testing system, and comprises a power starting and
stopping button of the multi-channel power supply device, a power starting control
button of the PIC microcontroller, a power starting control button of the explosion
proof lamp, a power starting control button of the display screen, a power starting
control button of the industrial computer, a starting, testing and stopping button of the
testing system, and an emergency stop button.
[0042] In the embodiments, the thermocouple unit A and the thermocouple unit B
each comprise two thermocouples which are used to test the temperature of the surface
of the explosion-proof lamp and the temperature of the testing environment; the two
thermocouples of the thermocouple unit A are pasted on the surfaces of two testing
points of the housing and the glass cover of the explosion-proof lamp with insulating
tapes; and the two thermocouples of the thermocouple unit B are placed on two sides
of the explosion-proof lamp at a distance of 1 meter from a same horizontal plane to
test the temperature of the testing environment.
[0043] In the embodiments, the temperature testing method for an explosion-proof
lamp under most unfavorable conditions, as shown in Fig.2, comprises the following
steps:
[0044] Step 1: the power supply of the multi-channel power supply device, the
power supply of the PIC microcontroller, the power supply of the display screen, and the power supply of the industrial computer are started through the human-computer interaction panel, the appropriate power supply line is selected according to the voltage level of the explosion-proof lamp, the power supply of the explosion-proof lamp is started;
[0045] Step 2: the PIC microcontroller controls the movement of the mobile
module through the human-computer interaction panel to enable the explosion-proof
induction lamp to be in the full power operation state, thereby ensuring that the
temperature testing process of the explosion-proof induction lamp is always under the
most unfavorable conditions;
[0046] Step 3: the PIC microcontroller receives electrical signals acquired by the
current transformer, the voltage transformer, the pressure sensor, and the humidity
sensor, converts the electrical signals into corresponding current data, voltage data,
pressure data, and humidity data, stops temperature testing under the most unfavorable
conditions of the explosion-proof lamp when any data exceeds the set value, and
prompts system fault on the display screen, the sound and light warning unit performs
sound and light warnings, when the current data, voltage data, pressure data and
humidity data are all within the set value range, Step 4 is performed, and running the
temperature testing on the explosion-proof lamp under the most unfavorable conditions
is continued;
[00471 Step 4: the PIC microcontroller receives the temperature data acquired by
the thermocouple unit A and the thermocouple unit B (acquisition is performed once
per minute), and records the temperature testing time of the explosion-proof lamp under the most unfavorable conditions, and when the testing time reaches the set value, prompting is performed on the display screen;
[0048] Step 5: the thermal imager is used by testers to search for the highest
temperature point on the housing and the glass cover of the explosion-proof lamp, and
the thermocouple unit A is fixed at the highest temperature point of the housing and the
glass cover of the explosion-proof lamp with the insulating tapes;
[0049] Step 6: the PIC microcontroller continues to receive n temperature data ti
t2, _ t ,acquired by the thermocouple unit A, to is actual temperature of the
explosion-proof lamp under the most unfavorable conditions, and the difference value
of the temperature data within the period after 1 hour of temperature data acquisition is
calculated, so as to judge whether the temperature testing of the explosion-proof lamp
has ended under the most unfavorable conditions, wherein the calculation method is as
follows: At=t,,160 -- t(
[0050] wherein t. is the temperature data acquired by the thermocouple unit A
for themthtime, and m is a positive integer between 1 and n-60, with the unit of Celsius
degree (°C); t.+60 is the temperature data acquired by the thermocouple unit A for the
(m+ 6 0)th time, with the unit of Celsius degree (°C); At is a difference value of the
temperature data which is acquired between the (m+ 6 0)th time and themth time by the
thermocouple unit A, with the unit of Celsius degree (°C);
[0051] the PIC microcontroller compares At with 1, if At is greater than or
equal to 1, the PIC microcontroller controls the thermocouple unit A and the thermocouple unit B to continue to acquire the environment temperature and the temperature data of the explosion-proof lamp under the most unfavorable conditions, and Step 7 is performed; and if At is less than 1, the temperature testing on the explosion-proof lamp under the most unfavorable conditions ends.
[0052] Step 7: the PIC microcontroller receives the environment temperature and
the temperature data of the explosion-proof lamp under the most unfavorable
conditions, acquired by the thermocouple unit A and the thermocouple unit B in real
time, processes the environment temperature to obtain the average temperature (the
temperature data within a quarter of the time after the temperature testing is , T2,
T ...... , within ,) a quarter of the time after the temperature testing, and converts the
temperature to obtain the temperature data of the explosion-proof lamp under the most
unfavorable conditions (+ 40 °C), as shown in the following formula:
T +T+--+T T,=-t. - 1 +40 g (2)
[0053] wherein , is the temperature of the explosion-proof lamp under the most
unfavorable conditions, with the unit of Celsius degree (°C); is the first temperature
of the environment within a quarter of the time after the temperature testing of the
explosion-proof lamp under the most unfavorable conditions, with the unit of Celsius
degree (°C); 2 is the second temperature of the environment within a quarter of the
time after the temperature testing of the explosion-proof lamp under the most
T unfavorable conditions, with the unit of Celsius degree (°C); g is the last temperature
of the environment within a quarter of the time after the temperature testing of the
explosion-proof lamp under the most unfavorable conditions, with the unit of Celsius degree (°C); g is the number of environment temperature acquired within a quarter of the time after the temperature testing of the explosion-proof lamp under the most unfavorable conditions, without dimension;
[0054] Step 8: the PIC microcontroller compares the temperature of the explosion
proof lamp under the most unfavorable conditions with data of the explosion-proof
lamp under the most unfavorable conditions, required by a temperature testing standard,
and judges whether the temperature testing of the explosion-proof lamp under the most
unfavorable conditions is qualified; if the data of the explosion-proof lamp under the
most unfavorable conditions, required by the temperature testing standard, is greater
than the temperature of the explosion-proof lamp under the most unfavorable
conditions, the temperature testing of the explosion-proof lamp under the most
unfavorable conditions is qualified; and if the data of the explosion-proof lamp under
the most unfavorable conditions, required by the temperature testing standard, is less
than or equal to the temperature of the explosion-proof lamp under the most unfavorable
conditions, the temperature testing of the explosion-proof lamp under the most
unfavorable conditions is not qualified.
[0055] The explosion-proof induction lamp belongs to an energy-saving special
explosion-proof lamp. The explosion-proof induction lamp operates in two power
consumption ranges. Before induction, the explosion-proof induction lamp operates in
low-power and energy-saving mode, and after induction, the explosion-proof induction
lamp operates in full power mode. Under the most unfavorable conditions, temperature
testing should be performed during the maximum power stage. Therefore, it is necessary to trigger the induction function of the explosion-proof induction lamp in real time, and calculate the power of the explosion-proof induction lamp based on voltage and current, thereby ensuring that the explosion-proof induction lamp operates under the most unfavorable conditions.
[0056] In the embodiment, the PIC microcontroller controls the movement of the
mobile module through the human-computer interaction panel to enable the explosion
proof induction lamp to be in the full power operation state through the following
specific method:
[00571 the explosion-proof induction lamp is triggered in a wireless driving
manner, and the PIC microcontroller controls the mobile module to move through the
human-computer interaction panel to guarantee the explosion-proof induction lamp to
be in the full power operation state; when the explosion-proof induction lamp is in the
low-power operation state, the PIC microcontroller controls the mobile module to move
along a straight line L in the direction of a tangent of a circle formed by using the
explosion-proof induction lamp as a center 0 (if the mobile module is extremely near
the explosion-proof induction lamp, the temperature testing results are affected, if the
mobile module is extremely far away from the explosion-proof induction lamp, it is not
guaranteed that the explosion-proof induction lamp is always in full power operation
state, so that after comprehensively considering the effect on the temperature testing
results of the explosion-proof induction lamp and guaranteeing that the explosion-proof
induction lamp is always in the full power operation state, the vertical distance of L to
the explosion-proof induction lamp is 2 m), two explosion-proof induction light inducing points symmetrical with the center 0 are found, and the mobile module moves back and forth within the range of two endpoints at a certain distance from the two explosion-proof induction light inducing points.
[00581 In the embodiments, a determination method for two explosion-proof
induction light inducing points and the two endpoints, as shown in Fig. 3, specially
comprises:
[0059] the mobile module moves on the straight line L, and when the mobile
module reaches a point A on the straight line L, the explosion-proof induction light
switches from the low power consumption state to the full power operation state, and
the point A is the explosion-proof induction light inducing point; and in the same
method, an explosion-proof induction light inducing point D on the other side of the
straight line L corresponding to the point A is found(opposite to the direction of the
same line as the point A and the center of the circle). The operating trajectory points B
and C of the mobile module are marked on the straight line L, wherein BO=0.6AO and
CO=0.6DO, then B and C are the two endpoints of the operating trajectory of the mobile
module, and the mobile module moves back and forth between B and C.
[00601 In the embodiments, in order to guarantee that the temperature testing
process of the explosion-proof induction lamp is under the most unfavorable conditions,
the PIC microcontroller acquires voltage and current signals from the full power
operation and temperature testing process, calculates the maximum power and
operating power of the explosion-proof induction lamp, and then judges whether the explosion-proof induction lamp operates under the most unfavorable conditions, wherein the specific method is as follows:
[0061] Step SI: the PIC microcontroller receives the voltage and current signals
of the explosion-proof induction lamp in the full power operation state acquired by the
current transformer and the voltage transformer, and calculates the full power of the
explosion-proof induction lamp, wherein the calculation method is as follows:
1Lx =U. xIm (3)
[0062] wherein - is the full power of the explosion-proof induction lamp,
with the unit of Watt (w); Umax is voltage during the full power operation of the
explosion-proof induction lamp, with the unit of volt (V); and Imax is current during
the full power operation of the explosion-proof induction lamp, with the unit of ampere
(A). In the embodiments, the voltage and the current of the explosion-proof induction
lamp in the full power operation state are obtained by taking the average of multiple
measurements of the voltage and the current. Generally, the voltage data and current
data of the explosion-proof induction lamp during full power operation are measured 5
times.
[0063] Step S2: the PIC microcontroller receives voltage data and current data of
the explosion-proof induction lamp under the most unfavorable conditions during the
temperature testing process, acquired by the current transformer and the voltage
transformer, and further obtains the operating power of the explosion-proof induction
lamp, wherein the calculation method is as follows: P=UxI (4)
[00641 wherein P is the operating power of the explosion-proof induction lamp,
with the unit of Watt (w); U is operating voltage of the explosion-proof induction
lamp, with the unit of volt (V); I is operating current of the explosion-proof induction
lamp, with the unit of ampere (A);
[0065] Step S3, a difference value between the full power "- of the explosion
proof induction lamp and the operating power P of the explosion-proof induction
lamp is obtained, as shown in the following formula:
AP=J. -P (5)
[0066] wherein AP is a difference value between the full power na of the
explosion-proof induction lamp and the operating power P of the explosion-proof
induction lamp, with the unit of Watt (w);
[00671 if AP is less than or equal to zero, it is determined that the explosion
proof induction lamp does not operate in the full power condition, and the temperature
testing of the explosion-proof induction lamp under the most unfavorable conditions
ends; and if AP is greater than zero, it is determined that the explosion-proof
induction lamp operates in the full power condition, Step S4 is executed, and the
temperature testing of the explosion-proof induction lamp under the most unfavorable
conditions is continued.
[0068] Finally, it should be noted that the embodiments are only used to illustrate
the technical solution of the present invention, but not to limit it; although the present
invention has been described in detail with reference to the aforementioned
embodiments, ordinary skilled in the art should understand that they can still modify the technical solution recorded in the aforementioned embodiments, or equivalently replace some or all of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solution deviate from the scope limited by the claims of the present invention.
Claims (4)
- WHAT IS CLAIMED IS:1 A temperature testing system for an explosion-proof lamp under most unfavorableconditions, characterized by comprising a PIC microcontroller, a thermocoupleunit A, a thermocouple unit B, a multi-channel power supply device, a thermalimager, a pressure sensor, a humidity sensor, a voltage transformer, a currenttransformer, a display screen, a mobile module, a communication unit, anindustrial computer, a human-computer interaction panel, and a sound and lightwarning unit, wherein testing ends of the thermocouple unit A and thethermocouple unit B are respectively placed on the surface of the explosion-prooflamp and in testing environment; temperature data output ends of thethermocouple unit A and the thermocouple unit B are electrically connected witha temperature data input end of the PIC microcontroller; an input end of the multichannel power supply device is connected with electric supply, and an output endis electrically connected with power input terminals of the PIC microcontroller,the display screen, the industrial computer, the sound and light warning unit, andthe explosion-proof lamp; testing ends of the pressure sensor and the humiditysensor are both placed in the testing environment; a pressure signal output end ofthe pressure sensor and a humidity signal output end of the humidity sensor areelectrically connected with a pressure signal input end and a humidity signal inputend of the PIC microcontroller respectively; a testing end of the voltagetransformer is electrically connected with the power input terminal of theexplosion-proof lamp, and a voltage signal output end is electrically connected with a voltage signal input end of the PIC microcontroller; a testing end of the current transformer is connected in series with a power supply line of the explosion-proof lamp, and a current signal output end is electrically connected with a current signal input end of the PIC microcontroller; a signal input end of the display screen is electrically connected with a signal output end of the PIC microcontroller; the industrial computer is electrically connected with the PIC microcontroller through the communication unit so as to store data received by thePIC microcontroller; a control signal output end of the human-computerinteraction panel is connected with the multi-channel power supply device and thePIC microcontroller; a signal input end of the sound and light warning unit iselectrically connected with a warning signal output end of the PIC microcontroller;an imaging testing end of the thermal imager faces opposite to the surface of anexplosion-proof electrical appliance during testing; and the mobile moduleoperates on the front of a glass cover of the explosion-proof lamp.
- 2 The temperature testing system for an explosion-proof lamp under mostunfavorable conditions according to claim 1, characterized in that thethermocouple unit A and the thermocouple unit B each comprise twothermocouples which are used to test the temperature of the surface of theexplosion-proof lamp and the temperature of the testing environment; the twothermocouples of the thermocouple unit Aare pasted on the surfaces of two testingpoints of a housing and the glass cover of the explosion-proof lamp; and the twothermocouples of the thermocouple unit B are placed on two sides of the explosion-proof lamp at a distance of 1 meter from a same horizontal plane to test the temperature of the environment.
- 3 The temperature testing system for an explosion-proof lamp under mostunfavorable conditions according to claim 1, characterized in that the voltagetransformer and the current transformer are both passive transformers which areused to test the voltage and the current of the explosion-proof lamp.
- 4 The temperature testing system for an explosion-proof lamp under mostunfavorable conditions according to claim 1, characterized in that the pressuresensor and the humidity sensor are respectively used to test the pressure and thehumidity of the environment.The temperature testing system for an explosion-proof lamp under mostunfavorable conditions according to claim 1, characterized in that the displayscreen is used to display the working status of the system, the temperature of thetesting environment, the humidity of the testing environment, the pressure of thetesting environment, and temperature data of the housing and the glass cover ofthe explosion-proof lamp.6 The temperature testing system for an explosion-proof lamp under mostunfavorable conditions according to claim 1, characterized in that the humancomputer interaction panel is used for starting, testing, and stopping a powercontrol and testing system, and comprises a power starting and stopping button ofthe multi-channel power supply device, a power starting control button of the PICmicrocontroller, a power starting control button of the explosion-proof lamp, a power starting control button of the display screen, a power starting control button of the industrial computer, a starting, testing and stopping button of the testing system, and an emergency stop button.7 A temperature testing method for an explosion-proof lamp under most unfavorableconditions, based on the temperature testing system according to claim 1,comprising the following steps:Step 1: the power supply of the multi-channel power supply device, the powersupply of the PIC microcontroller, the power supply of the display screen, and thepower supply of the industrial computer are started through the human-computerinteraction panel, the power supply line is selected according to the voltage levelof the explosion-proof lamp, and the power supply of the explosion-proof lamp isstarted;Step 2: the PIC microcontroller controls the movement of the mobile modulethrough the human-computer interaction panel to enable the explosion-proofinduction lamp to be in the full power operation state, thereby ensuring that thetemperature testing process of the explosion-proof induction lamp is always underthe most unfavorable conditions;Step 3: the PIC microcontroller receives electrical signals acquired by the currenttransformer, the voltage transformer, the pressure sensor, and the humidity sensor,converts the electrical signals into corresponding current data, voltage data,pressure data, and humidity data, stops temperature testing under the mostunfavorable conditions of the explosion-proof lamp when any data exceeds the set value, and prompts system fault on the display screen, the sound and light warning unit performs sound and light warnings, when the current data, voltage data, pressure data and humidity data are all within the set value range, Step 4 is performed, and running the temperature testing on the explosion-proof lamp under the most unfavorable conditions is continued;Step 4: the PIC microcontroller receives the temperature data acquired by thethermocouple unit A and the thermocouple unit B, and records the temperaturetesting time of the explosion-proof lamp under the most unfavorable conditions,and when the testing time reaches the set value, prompting is performed on thedisplay screen;Step 5: the thermal imager is used to search for the highest temperature point onthe housing and the glass cover of the explosion-proof lamp, and fixes thethermocouple unit A at the highest temperature point of the housing and the glasscover of the explosion-proof lamp;Step 6: the PIC microcontroller continues to receive n temperature data t t2...... ,I ti, acquired by the thermocouple unit A, and calculates the difference valueof the temperature data within the period after 1 hour of temperature dataacquisition, so as to judge whether the temperature testing of the explosion-prooflamp has ended under the most unfavorable conditions, wherein the calculationmethod is as follows:At= t,, 6 0 -- t,, wherein t. is the temperature data acquired by the thermocouple unit A for the mth time, and m is a positive integer between 1 and n-60; ".-60 is the temperature data acquired by the thermocouple unit A for the (m+ 6 0)th time; Atis difference value of the temperature data which is acquired by the thermocouple unit A for the(m+ 6 0)th time and the mth time;the PIC microcontroller compares At with 1, if At is greater than or equal to 1,the PIC microcontroller controls the thermocouple unit A and the thermocoupleunit B to continue to acquire environment temperature and the temperature data ofthe explosion-proof lamp under the most unfavorable conditions, and Step 7 isperformed; if At is less than 1, the temperature testing on the explosion-prooflamp under the most unfavorable conditions ends; t, is actual temperature of theexplosion-proof lamp under the most unfavorable conditions;Step 7: the PIC microcontroller receives the environment temperature and thetemperature data of the explosion-proof lamp under the most unfavorableconditions, acquired by the thermocouple unit A and the thermocouple unit B inreal time, processes the environment temperature to obtain the averagetemperature within a quarter of the time after the temperature testing, and convertsthe temperature to obtain the temperature data of the explosion-proof lamp underthe most unfavorable conditions, as shown in the following formula: T +T +--+T T,=-t. - 1 2 +40 g (2)T wherein ,, is the temperature of the explosion-proof lamp under the mostunfavorable conditions; is the first temperature of the environment within a quarter of the time after the temperature testing of the explosion-proof lamp under the most unfavorable conditions; is the second temperature of the environment within a quarter of the time after the temperature testing of the explosion-proof lamp under the most unfavorable conditions; 7 is the last temperature of the environment within a quarter of the time after the temperature testing of the explosion-proof lamp under the most unfavorable conditions; g is the number of environment temperature acquired within a quarter of the time after the temperature testing of the explosion-proof lamp under the most unfavorable conditions;Step 8: the PIC microcontroller compares the temperature of the explosion-prooflamp under the most unfavorable conditions with data of the explosion-proof lampunder the most unfavorable conditions, required by a temperature testing standard,and judges whether the temperature testing of the explosion-proof lamp under themost unfavorable conditions is qualified; if the data of the explosion-proof lampunder the most unfavorable conditions, required by the temperature testingstandard, is greater than the temperature of the explosion-proof lamp under themost unfavorable conditions, the temperature testing of the explosion-proof lampunder the most unfavorable conditions is qualified; and if the data of the explosionproof lamp under the most unfavorable conditions, required by the temperaturetesting standard, is less than or equal to the temperature of the explosion-prooflamp under the most unfavorable conditions, the temperature testing of theexplosion-proof lamp under the most unfavorable conditions is not qualified.8 The temperature testing method for an explosion-proof lamp under mostunfavorable conditions according to claim 7, characterized in that the PICmicrocontroller controls the movement of the mobile module through the humancomputer interaction panel to enable an explosion-proof induction lamp to be inthe full power operation state through the following specific method:the explosion-proof induction lamp is triggered in a wireless driving manner, whenthe explosion-proof induction lamp is in the low-power operation state, the PICmicrocontroller controls the mobile module to move along a straight line L in thedirection of a tangent of a circle formed by using the explosion-proof inductionlamp as a center 0, two explosion-proof induction light inducing points beingsymmetrical with the center 0 are found, and the mobile module moves back andforth within the range of two endpoints at a certain distance from the twoexplosion-proof induction light inducing points.9 The temperature testing method for an explosion-proof lamp under mostunfavorable conditions according to claim 7, characterized in that the specificmethod for ensuring that the temperature testing process of the explosion-proofinduction lamp is always under the most unfavorable conditions in step 2 is asfollows: the PIC microcontroller acquires voltage and current signals from the fullpower operation and temperature testing process, calculates the maximum powerand operating power of the explosion-proof induction lamp, and then judgeswhether the explosion-proof induction lamp operates under the most unfavorableconditions, wherein the specific judgment method is as follows:Step SI: the PIC microcontroller receives the voltage and current signals of theexplosion-proof induction lamp in the full power operation state acquired by thecurrent transformer and the voltage transformer, and calculates the full power ofthe explosion-proof induction lamp, as shown in the following formula:ax =U. xIm (3)wherein ax is the full power of the explosion-proof induction lamp; Uax isvoltage of the explosion-proof induction lamp in the full power operation state;Imax is current of the explosion-proof induction lamp in the full power operationstate;Step S2: the PIC microcontroller receives voltage data and current data of theexplosion-proof induction lamp under the most unfavorable conditions during thetemperature testing process, acquired by the current transformer and the voltagetransformer, and further obtains the operating power of the explosion-proofinduction lamp, wherein the calculation method is as follows: P=UxI (4)wherein P is the operating power of the explosion-proof induction lamp; U isoperating voltage of the explosion-proof induction lamp; I is operating currentof the explosion-proof induction lamp;Step S3, a difference value between the full power -ax of the explosion-proofinduction lamp and the operating power P of the explosion-proof induction lampis obtained, as shown in the following formula:AP=J -3 (5) wherein AP is a difference value between the full power "- of the explosion proof induction lamp and the operating power P of the explosion-proof induction lamp; if AP is less than or equal to zero, it is determined that the explosion-proof induction lamp does not operate in the full power condition, and the temperature testing of the explosion-proof induction lamp under the most unfavorable conditions ends; and if AP is greater than zero, it is determined that the explosion-proof induction lamp operates in the full power condition, Step S4 is executed, and the temperature testing of the explosion-proof induction lamp under the most unfavorable conditions is continued.
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CN202211013459.6A CN115389045A (en) | 2022-08-23 | 2022-08-23 | Temperature test system and test method for explosion-proof lamp under worst condition |
PCT/CN2023/114347 WO2024041552A1 (en) | 2022-08-23 | 2023-08-23 | Temperature test system and method under most unfavorable condition for explosion-proof light |
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