AU2005203543B2 - Method and apparatus for detecting wear in components of high voltage electrical equipment - Google Patents
Method and apparatus for detecting wear in components of high voltage electrical equipment Download PDFInfo
- Publication number
- AU2005203543B2 AU2005203543B2 AU2005203543A AU2005203543A AU2005203543B2 AU 2005203543 B2 AU2005203543 B2 AU 2005203543B2 AU 2005203543 A AU2005203543 A AU 2005203543A AU 2005203543 A AU2005203543 A AU 2005203543A AU 2005203543 B2 AU2005203543 B2 AU 2005203543B2
- Authority
- AU
- Australia
- Prior art keywords
- component
- tracer material
- fluorescent tracer
- insulating medium
- irradiating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000000034 method Methods 0.000 title claims description 28
- 239000000463 material Substances 0.000 claims abstract description 125
- 239000000700 radioactive tracer Substances 0.000 claims abstract description 115
- 239000000523 sample Substances 0.000 claims description 34
- 230000001678 irradiating effect Effects 0.000 claims description 16
- 230000005855 radiation Effects 0.000 claims description 14
- 239000000843 powder Substances 0.000 claims description 13
- 239000002159 nanocrystal Substances 0.000 claims description 12
- 238000005070 sampling Methods 0.000 claims description 9
- 238000011065 in-situ storage Methods 0.000 claims description 8
- LGOGWRFWPHMDLS-UHFFFAOYSA-N [S-2].S.[Zn+2].[SeH2] Chemical compound [S-2].S.[Zn+2].[SeH2] LGOGWRFWPHMDLS-UHFFFAOYSA-N 0.000 claims 2
- UCIFCDLTNLEXNI-UHFFFAOYSA-N [S-2].[S-2].S.[Zn+2].[SeH2].[Cd+2] Chemical compound [S-2].[S-2].S.[Zn+2].[SeH2].[Cd+2] UCIFCDLTNLEXNI-UHFFFAOYSA-N 0.000 claims 2
- 230000005670 electromagnetic radiation Effects 0.000 abstract description 37
- 239000000835 fiber Substances 0.000 description 9
- 239000000975 dye Substances 0.000 description 8
- 239000003921 oil Substances 0.000 description 6
- 238000013459 approach Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 230000005284 excitation Effects 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 3
- 239000011810 insulating material Substances 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 229910052744 lithium Inorganic materials 0.000 description 3
- 239000004809 Teflon Substances 0.000 description 2
- 229920006362 Teflon® Polymers 0.000 description 2
- 238000009835 boiling Methods 0.000 description 2
- 229910017052 cobalt Inorganic materials 0.000 description 2
- 239000010941 cobalt Substances 0.000 description 2
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000003628 erosive effect Effects 0.000 description 2
- -1 for example Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000002480 mineral oil Substances 0.000 description 2
- 235000010446 mineral oil Nutrition 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012806 monitoring device Methods 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 229910052758 niobium Inorganic materials 0.000 description 2
- 239000010955 niobium Substances 0.000 description 2
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 2
- 229910052761 rare earth metal Inorganic materials 0.000 description 2
- 150000002910 rare earth metals Chemical class 0.000 description 2
- 241000894007 species Species 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- BFKJFAAPBSQJPD-UHFFFAOYSA-N tetrafluoroethene Chemical compound FC(F)=C(F)F BFKJFAAPBSQJPD-UHFFFAOYSA-N 0.000 description 2
- 229910052727 yttrium Inorganic materials 0.000 description 2
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 2
- WUPHOULIZUERAE-UHFFFAOYSA-N 3-(oxolan-2-yl)propanoic acid Chemical compound OC(=O)CCC1CCCO1 WUPHOULIZUERAE-UHFFFAOYSA-N 0.000 description 1
- 0 C*1C*CCC1 Chemical compound C*1C*CCC1 0.000 description 1
- KDIAMAVWIJYWHN-UHFFFAOYSA-N CCCC1CCCC1 Chemical compound CCCC1CCCC1 KDIAMAVWIJYWHN-UHFFFAOYSA-N 0.000 description 1
- HLTMUYBTNSVOFY-UHFFFAOYSA-N CCCCCC1CCCCC1 Chemical compound CCCCCC1CCCCC1 HLTMUYBTNSVOFY-UHFFFAOYSA-N 0.000 description 1
- 229910018503 SF6 Inorganic materials 0.000 description 1
- 239000005083 Zinc sulfide Substances 0.000 description 1
- 238000007792 addition Methods 0.000 description 1
- 239000000987 azo dye Substances 0.000 description 1
- AQCDIIAORKRFCD-UHFFFAOYSA-N cadmium selenide Chemical compound [Cd]=[Se] AQCDIIAORKRFCD-UHFFFAOYSA-N 0.000 description 1
- 229910052980 cadmium sulfide Inorganic materials 0.000 description 1
- RPPBZEBXAAZZJH-UHFFFAOYSA-N cadmium telluride Chemical compound [Te]=[Cd] RPPBZEBXAAZZJH-UHFFFAOYSA-N 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000001010 compromised effect Effects 0.000 description 1
- 238000007405 data analysis Methods 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000010891 electric arc Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005562 fading Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000002096 quantum dot Substances 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000004054 semiconductor nanocrystal Substances 0.000 description 1
- 239000000992 solvent dye Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- SFZCNBIFKDRMGX-UHFFFAOYSA-N sulfur hexafluoride Chemical compound FS(F)(F)(F)(F)F SFZCNBIFKDRMGX-UHFFFAOYSA-N 0.000 description 1
- 229960000909 sulfur hexafluoride Drugs 0.000 description 1
- 229910052984 zinc sulfide Inorganic materials 0.000 description 1
- UQMZPFKLYHOJDL-UHFFFAOYSA-N zinc;cadmium(2+);disulfide Chemical compound [S-2].[S-2].[Zn+2].[Cd+2] UQMZPFKLYHOJDL-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
- G01R31/3272—Apparatus, systems or circuits therefor
- G01R31/3274—Details related to measuring, e.g. sensing, displaying or computing; Measuring of variables related to the contact pieces, e.g. wear, position or resistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/0015—Means for testing or for inspecting contacts, e.g. wear indicator
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H33/00—High-tension or heavy-current switches with arc-extinguishing or arc-preventing means
- H01H33/70—Switches with separate means for directing, obtaining, or increasing flow of arc-extinguishing fluid
- H01H33/7015—Switches with separate means for directing, obtaining, or increasing flow of arc-extinguishing fluid characterised by flow directing elements associated with contacts
- H01H33/7076—Switches with separate means for directing, obtaining, or increasing flow of arc-extinguishing fluid characterised by flow directing elements associated with contacts characterised by the use of special materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/0015—Means for testing or for inspecting contacts, e.g. wear indicator
- H01H2001/0026—Means for testing or for inspecting contacts, e.g. wear indicator wherein one or both contacts contain embedded contact wear signal material, e.g. radioactive material being released as soon as the contact wear reaches the embedded layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/0015—Means for testing or for inspecting contacts, e.g. wear indicator
- H01H2001/0031—Means for testing or for inspecting contacts, e.g. wear indicator by analysing radiation emitted by arc or trace material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H9/00—Details of switching devices, not covered by groups H01H1/00 - H01H7/00
- H01H9/0005—Tap change devices
- H01H2009/0061—Monitoring tap change switching devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H33/00—High-tension or heavy-current switches with arc-extinguishing or arc-preventing means
- H01H33/70—Switches with separate means for directing, obtaining, or increasing flow of arc-extinguishing fluid
- H01H33/7015—Switches with separate means for directing, obtaining, or increasing flow of arc-extinguishing fluid characterised by flow directing elements associated with contacts
- H01H33/7023—Switches with separate means for directing, obtaining, or increasing flow of arc-extinguishing fluid characterised by flow directing elements associated with contacts characterised by an insulating tubular gas flow enhancing nozzle
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H9/00—Details of switching devices, not covered by groups H01H1/00 - H01H7/00
- H01H9/0005—Tap change devices
Landscapes
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Arc-Extinguishing Devices That Are Switches (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/917,747 | 2004-08-13 | ||
| US10/917,747 US7053625B2 (en) | 2002-09-11 | 2004-08-13 | Method and apparatus for detecting wear in components of high voltage electrical equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| AU2005203543A1 AU2005203543A1 (en) | 2006-03-02 |
| AU2005203543B2 true AU2005203543B2 (en) | 2008-02-07 |
Family
ID=35311765
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AU2005203543A Ceased AU2005203543B2 (en) | 2004-08-13 | 2005-08-09 | Method and apparatus for detecting wear in components of high voltage electrical equipment |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7053625B2 (enExample) |
| EP (1) | EP1626268B1 (enExample) |
| JP (1) | JP2006054188A (enExample) |
| AT (1) | ATE430307T1 (enExample) |
| AU (1) | AU2005203543B2 (enExample) |
| CA (1) | CA2515618A1 (enExample) |
| DE (1) | DE602005014178D1 (enExample) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7038201B2 (en) * | 2002-12-13 | 2006-05-02 | Nichols Applied Technology, Llc | Method and apparatus for determining electrical contact wear |
| JP5032091B2 (ja) * | 2006-10-12 | 2012-09-26 | 株式会社東芝 | ガス絶縁開閉装置及びガス絶縁開閉装置用部品のアーク損傷検出方法 |
| EP2279548B1 (en) * | 2008-04-21 | 2015-09-16 | ABB Research Ltd. | Arc detector and associated method for detecting undesired arcs |
| JP2013105007A (ja) * | 2011-11-14 | 2013-05-30 | Ricoh Co Ltd | 感光体、プロセスカートリッジ及び画像形成装置 |
| CN102735976B (zh) * | 2012-07-05 | 2014-07-02 | 金施特·尼古拉·弗拉基米罗维奇 | 高压电力设备元件状态的监测方法 |
| US9329238B1 (en) * | 2014-11-14 | 2016-05-03 | Schneider Electric USA, Inc. | Contact wear detection by spectral analysis shift |
| CN104827490B (zh) * | 2015-05-21 | 2016-07-06 | 大连理工大学 | 基于摩擦或静电感应控制的机器人触觉系统及方法 |
| US9885659B1 (en) | 2016-10-04 | 2018-02-06 | International Business Machines Corporation | Method to determine connector metal wear via flouresence |
| US11181462B2 (en) | 2018-11-30 | 2021-11-23 | International Business Machines Corporation | Non-destructive method to determine porosity in metallic coatings |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3164006A (en) * | 1962-04-16 | 1965-01-05 | James R Alburger | Evaluation performance of liquid penetrant tracer materials |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3715598A (en) | 1969-06-12 | 1973-02-06 | G Tomlin | Integral fault detection system for operating electronics equipment |
| US5389792A (en) | 1993-01-04 | 1995-02-14 | Grumman Aerospace Corporation | Electron microprobe utilizing thermal detector arrays |
| US5453591A (en) | 1994-04-05 | 1995-09-26 | Abb Power T&D Company Inc. | Sensing structure for component wear in high voltage circuit interrupters |
| JPH07333369A (ja) * | 1994-06-13 | 1995-12-22 | Hitachi Ltd | 核融合装置 |
| DE59502186D1 (de) | 1994-10-27 | 1998-06-18 | Siemens Ag | Schaltgerät mit überwachung des abbrandes wenigstens eines kontaktstückes |
| US5941370A (en) | 1996-09-10 | 1999-08-24 | Nichols; Bruce W. | Electrical contact wear |
| DE19936868A1 (de) * | 1999-08-05 | 2001-02-15 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Verfahren und Vorrichtung zur Herstellung von oxidischen Nanokristallen |
| US6448758B1 (en) * | 2000-01-07 | 2002-09-10 | General Electric Company | Method for determining wear and other characteristics of electrodes in high voltage equipment |
| US6777948B2 (en) * | 2002-09-11 | 2004-08-17 | Electric Power Research Institute, Inc. | Method and apparatus for detecting wear in components of high voltage electrical equipment |
| US6884998B2 (en) * | 2002-12-13 | 2005-04-26 | Nichols Applied Technology, Llc | Method and apparatus for determining electrical contact wear |
-
2004
- 2004-08-13 US US10/917,747 patent/US7053625B2/en not_active Expired - Fee Related
-
2005
- 2005-08-06 EP EP05254930A patent/EP1626268B1/en not_active Expired - Lifetime
- 2005-08-06 AT AT05254930T patent/ATE430307T1/de not_active IP Right Cessation
- 2005-08-06 DE DE602005014178T patent/DE602005014178D1/de not_active Expired - Lifetime
- 2005-08-08 CA CA002515618A patent/CA2515618A1/en not_active Abandoned
- 2005-08-09 AU AU2005203543A patent/AU2005203543B2/en not_active Ceased
- 2005-08-15 JP JP2005235462A patent/JP2006054188A/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3164006A (en) * | 1962-04-16 | 1965-01-05 | James R Alburger | Evaluation performance of liquid penetrant tracer materials |
Also Published As
| Publication number | Publication date |
|---|---|
| US7053625B2 (en) | 2006-05-30 |
| AU2005203543A1 (en) | 2006-03-02 |
| DE602005014178D1 (de) | 2009-06-10 |
| EP1626268A3 (en) | 2007-12-26 |
| EP1626268B1 (en) | 2009-04-29 |
| CA2515618A1 (en) | 2006-02-13 |
| JP2006054188A (ja) | 2006-02-23 |
| US20050104598A1 (en) | 2005-05-19 |
| EP1626268A2 (en) | 2006-02-15 |
| ATE430307T1 (de) | 2009-05-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FGA | Letters patent sealed or granted (standard patent) | ||
| MK14 | Patent ceased section 143(a) (annual fees not paid) or expired |