AU2003287923A1 - Method and apparatus for automatic optical inspection - Google Patents

Method and apparatus for automatic optical inspection

Info

Publication number
AU2003287923A1
AU2003287923A1 AU2003287923A AU2003287923A AU2003287923A1 AU 2003287923 A1 AU2003287923 A1 AU 2003287923A1 AU 2003287923 A AU2003287923 A AU 2003287923A AU 2003287923 A AU2003287923 A AU 2003287923A AU 2003287923 A1 AU2003287923 A1 AU 2003287923A1
Authority
AU
Australia
Prior art keywords
optical inspection
automatic optical
automatic
inspection
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003287923A
Inventor
Preben Knipp Hjornet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
LK AS
Original Assignee
LK AS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by LK AS filed Critical LK AS
Publication of AU2003287923A1 publication Critical patent/AU2003287923A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/08—Testing mechanical properties
    • G01M11/081—Testing mechanical properties by using a contact-less detection method, i.e. with a camera
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G01N21/455—Schlieren methods, e.g. for gradient index determination; Shadowgraph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Geometry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
AU2003287923A 2002-12-19 2003-12-19 Method and apparatus for automatic optical inspection Abandoned AU2003287923A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US43440102P 2002-12-19 2002-12-19
US60/434,401 2002-12-19
PCT/DK2003/000910 WO2004057297A1 (en) 2002-12-19 2003-12-19 Method and apparatus for automatic optical inspection

Publications (1)

Publication Number Publication Date
AU2003287923A1 true AU2003287923A1 (en) 2004-07-14

Family

ID=32682041

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003287923A Abandoned AU2003287923A1 (en) 2002-12-19 2003-12-19 Method and apparatus for automatic optical inspection

Country Status (2)

Country Link
AU (1) AU2003287923A1 (en)
WO (1) WO2004057297A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7663742B2 (en) 2005-11-24 2010-02-16 Novartis Ag Lens inspection system using phase contrast imaging
EP3016368A1 (en) * 2014-10-27 2016-05-04 Thomson Licensing Method and apparatus for handling a defect object in an image
CN113984790B (en) * 2021-09-28 2024-08-30 歌尔光学科技有限公司 Lens quality detection method and device

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GR1002072B (en) * 1992-12-21 1995-11-30 Johnson & Johnson Vision Prod Illumination system for opthalmic lens inspection.
US6201600B1 (en) * 1997-12-19 2001-03-13 Northrop Grumman Corporation Method and apparatus for the automatic inspection of optically transmissive objects having a lens portion
US6153873A (en) * 1998-05-20 2000-11-28 E. I. Dupont De Numours And Company Optical probe having an imaging apparatus
EP1248092B1 (en) * 2001-03-09 2010-09-15 Novartis AG Lens inspection

Also Published As

Publication number Publication date
WO2004057297A1 (en) 2004-07-08

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase