AU2003276146A1 - Method for the quality control of connection balls of electronic components - Google Patents

Method for the quality control of connection balls of electronic components

Info

Publication number
AU2003276146A1
AU2003276146A1 AU2003276146A AU2003276146A AU2003276146A1 AU 2003276146 A1 AU2003276146 A1 AU 2003276146A1 AU 2003276146 A AU2003276146 A AU 2003276146A AU 2003276146 A AU2003276146 A AU 2003276146A AU 2003276146 A1 AU2003276146 A1 AU 2003276146A1
Authority
AU
Australia
Prior art keywords
electronic components
quality control
connection balls
balls
connection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003276146A
Inventor
Klaus Neumaier
Gunter Schiebel
Klaus Peter Wershofen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of AU2003276146A1 publication Critical patent/AU2003276146A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
AU2003276146A 2002-10-25 2003-10-22 Method for the quality control of connection balls of electronic components Abandoned AU2003276146A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE10249850.4 2002-10-25
DE10249850A DE10249850A1 (en) 2002-10-25 2002-10-25 Process for quality control of connection balls of electronic components
PCT/EP2003/011711 WO2004038394A1 (en) 2002-10-25 2003-10-22 Method for the quality control of connection balls of electronic components

Publications (1)

Publication Number Publication Date
AU2003276146A1 true AU2003276146A1 (en) 2004-05-13

Family

ID=32103029

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003276146A Abandoned AU2003276146A1 (en) 2002-10-25 2003-10-22 Method for the quality control of connection balls of electronic components

Country Status (3)

Country Link
AU (1) AU2003276146A1 (en)
DE (1) DE10249850A1 (en)
WO (1) WO2004038394A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005005896B4 (en) * 2005-02-09 2011-01-13 Siemens Electronics Assembly Systems Gmbh & Co. Kg Use of a lighting device in a placement machine
EP2322907B1 (en) * 2009-11-14 2018-02-28 VMT Vision Machine Technic Bildverarbeitungssysteme GmbH Method for detecting the front lateral faces of hollow fibres and method for detecting the interior of unstuffed hollow fibres of a bundle of hollow fibres
DE102012106942A1 (en) * 2012-07-30 2014-01-30 Endress + Hauser Flowtec Ag Method for exchanging defective electronic component arranged on carrier against replacement component, involves securing replacement component on carrier by solder deposit which is formed by spraying solder on carrier

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6236747B1 (en) * 1997-02-26 2001-05-22 Acuity Imaging, Llc System and method for image subtraction for ball and bumped grid array inspection
US6598994B1 (en) * 1998-08-24 2003-07-29 Intelligent Reasoning Systems, Inc. Multi-angle inspection of manufactured products
JP3551188B2 (en) * 2002-01-10 2004-08-04 オムロン株式会社 Surface condition inspection method and substrate inspection device

Also Published As

Publication number Publication date
WO2004038394A1 (en) 2004-05-06
DE10249850A1 (en) 2004-05-13

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase