AU2003212557A1 - Resistive cantilever spring for probe microscopy - Google Patents

Resistive cantilever spring for probe microscopy

Info

Publication number
AU2003212557A1
AU2003212557A1 AU2003212557A AU2003212557A AU2003212557A1 AU 2003212557 A1 AU2003212557 A1 AU 2003212557A1 AU 2003212557 A AU2003212557 A AU 2003212557A AU 2003212557 A AU2003212557 A AU 2003212557A AU 2003212557 A1 AU2003212557 A1 AU 2003212557A1
Authority
AU
Australia
Prior art keywords
cantilever spring
probe microscopy
resistive cantilever
resistive
microscopy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003212557A
Inventor
Jacob Nissim Israelachvili
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB0302523A external-priority patent/GB2398633B/en
Application filed by Individual filed Critical Individual
Publication of AU2003212557A1 publication Critical patent/AU2003212557A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/26—Friction force microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/04—Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezoelectric gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
AU2003212557A 2003-02-04 2003-03-13 Resistive cantilever spring for probe microscopy Abandoned AU2003212557A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0302523A GB2398633B (en) 2003-02-04 2003-02-04 Resistive cantilever spring for probe microscopy
EP03250876 2003-02-13
PCT/IB2003/000913 WO2004070765A1 (en) 2003-02-04 2003-03-13 Resistive cantilever spring for probe microscopy

Publications (1)

Publication Number Publication Date
AU2003212557A1 true AU2003212557A1 (en) 2004-08-30

Family

ID=32852246

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003212557A Abandoned AU2003212557A1 (en) 2003-02-04 2003-03-13 Resistive cantilever spring for probe microscopy

Country Status (3)

Country Link
EP (1) EP1609164A4 (en)
AU (1) AU2003212557A1 (en)
WO (1) WO2004070765A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103852600B (en) * 2014-03-27 2016-04-13 上海华力微电子有限公司 Probe unit of microscope with atomic force
GB2623943A (en) * 2022-10-26 2024-05-08 Nano Analytik Gmbh Micromechanical beam

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5444244A (en) * 1993-06-03 1995-08-22 Park Scientific Instruments Corporation Piezoresistive cantilever with integral tip for scanning probe microscope
US5705814A (en) * 1995-08-30 1998-01-06 Digital Instruments, Inc. Scanning probe microscope having automatic probe exchange and alignment
JPH10282130A (en) * 1997-04-01 1998-10-23 Canon Inc Probe and scanning probe microscope using it
US5959200A (en) * 1997-08-27 1999-09-28 The Board Of Trustees Of The Leland Stanford Junior University Micromachined cantilever structure providing for independent multidimensional force sensing using high aspect ratio beams
JP3892198B2 (en) * 2000-02-17 2007-03-14 エスアイアイ・ナノテクノロジー株式会社 Microprobe and sample surface measuring device

Also Published As

Publication number Publication date
WO2004070765A1 (en) 2004-08-19
EP1609164A4 (en) 2010-11-03
EP1609164A1 (en) 2005-12-28

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase