AU2003205661A1 - Method and device for detecting a breakdown of a bipolar transistor - Google Patents
Method and device for detecting a breakdown of a bipolar transistorInfo
- Publication number
- AU2003205661A1 AU2003205661A1 AU2003205661A AU2003205661A AU2003205661A1 AU 2003205661 A1 AU2003205661 A1 AU 2003205661A1 AU 2003205661 A AU2003205661 A AU 2003205661A AU 2003205661 A AU2003205661 A AU 2003205661A AU 2003205661 A1 AU2003205661 A1 AU 2003205661A1
- Authority
- AU
- Australia
- Prior art keywords
- breakdown
- detecting
- bipolar transistor
- bipolar
- transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors
- G01R31/261—Circuits therefor for testing bipolar transistors for measuring break-down voltage or punch through voltage therefor
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Amplifiers (AREA)
- Bipolar Integrated Circuits (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10205711.7 | 2002-02-12 | ||
DE2002105711 DE10205711A1 (en) | 2002-02-12 | 2002-02-12 | Method and device for detecting a breakdown of a bipolar transistor |
PCT/EP2003/000672 WO2003069362A1 (en) | 2002-02-12 | 2003-01-23 | Method and device for detecting a breakdown of a bipolar transistor |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2003205661A1 true AU2003205661A1 (en) | 2003-09-04 |
Family
ID=27618553
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2003205661A Abandoned AU2003205661A1 (en) | 2002-02-12 | 2003-01-23 | Method and device for detecting a breakdown of a bipolar transistor |
Country Status (3)
Country | Link |
---|---|
AU (1) | AU2003205661A1 (en) |
DE (1) | DE10205711A1 (en) |
WO (1) | WO2003069362A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110244210B (en) * | 2019-07-04 | 2021-10-15 | 福州丹诺西诚电子科技有限公司 | Breakdown detection method for IGBT unit |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0176771A3 (en) * | 1984-09-28 | 1988-01-13 | Siemens Aktiengesellschaft | Bipolar power transistor with a variable breakdown voltage |
JPH07146722A (en) * | 1993-10-01 | 1995-06-06 | Fuji Electric Co Ltd | Overcurrent protective device for transistor |
JP3400215B2 (en) * | 1995-11-21 | 2003-04-28 | 沖電気工業株式会社 | Semiconductor device |
JP3239849B2 (en) * | 1998-07-16 | 2001-12-17 | 日本電気株式会社 | Measuring method of collector-emitter breakdown voltage of bipolar transistor |
-
2002
- 2002-02-12 DE DE2002105711 patent/DE10205711A1/en not_active Withdrawn
-
2003
- 2003-01-23 WO PCT/EP2003/000672 patent/WO2003069362A1/en not_active Application Discontinuation
- 2003-01-23 AU AU2003205661A patent/AU2003205661A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
WO2003069362A1 (en) | 2003-08-21 |
DE10205711A1 (en) | 2003-08-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |