AU2002361410A1 - Test probe system and method for the production thereof - Google Patents

Test probe system and method for the production thereof

Info

Publication number
AU2002361410A1
AU2002361410A1 AU2002361410A AU2002361410A AU2002361410A1 AU 2002361410 A1 AU2002361410 A1 AU 2002361410A1 AU 2002361410 A AU2002361410 A AU 2002361410A AU 2002361410 A AU2002361410 A AU 2002361410A AU 2002361410 A1 AU2002361410 A1 AU 2002361410A1
Authority
AU
Australia
Prior art keywords
production
test probe
probe system
test
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2002361410A
Inventor
Stephan Ertl
Peter Gluche
Joachim Kusterer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GFD Gesellschaft fuer Diamantprodukte mbH
Original Assignee
GFD Gesellschaft fuer Diamantprodukte mbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GFD Gesellschaft fuer Diamantprodukte mbH filed Critical GFD Gesellschaft fuer Diamantprodukte mbH
Publication of AU2002361410A1 publication Critical patent/AU2002361410A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755—Material aspects
AU2002361410A 2002-01-16 2002-12-13 Test probe system and method for the production thereof Abandoned AU2002361410A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE10201491.4 2002-01-16
DE2002101491 DE10201491C1 (en) 2002-01-16 2002-01-16 Probe system and method for its production
PCT/EP2002/014218 WO2003060529A1 (en) 2002-01-16 2002-12-13 Test probe system and method for the production thereof

Publications (1)

Publication Number Publication Date
AU2002361410A1 true AU2002361410A1 (en) 2003-07-30

Family

ID=7712295

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2002361410A Abandoned AU2002361410A1 (en) 2002-01-16 2002-12-13 Test probe system and method for the production thereof

Country Status (3)

Country Link
AU (1) AU2002361410A1 (en)
DE (1) DE10201491C1 (en)
WO (1) WO2003060529A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2793314A1 (en) 2013-04-16 2014-10-22 GFD Gesellschaft für Diamantprodukte mbH Contact spring and its use

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4697143A (en) * 1984-04-30 1987-09-29 Cascade Microtech, Inc. Wafer probe
DE3822766A1 (en) * 1987-07-02 1989-01-12 Morche Dirk Walter Method for producing printed circuit boards, device for producing printed circuit boards, and a printed circuit board
GB8818445D0 (en) * 1988-08-03 1988-09-07 Jones B L Stm probe
NL9101169A (en) * 1991-07-05 1993-02-01 Drukker Int Bv ELECTRONIC PROBE NEEDLE AND METHOD FOR MANUFACTURING IT.
US5475318A (en) * 1993-10-29 1995-12-12 Robert B. Marcus Microprobe
US5561378A (en) * 1994-07-05 1996-10-01 Motorola, Inc. Circuit probe for measuring a differential circuit
US5506515A (en) * 1994-07-20 1996-04-09 Cascade Microtech, Inc. High-frequency probe tip assembly
US5508630A (en) * 1994-09-09 1996-04-16 Board Of Regents, University Of Texas Systems Probe having a power detector for use with microwave or millimeter wave device
US5763879A (en) * 1996-09-16 1998-06-09 Pacific Western Systems Diamond probe tip
CA2336531A1 (en) * 1998-07-08 2000-01-20 Capres Aps Multi-point probe
JP2001004698A (en) * 1999-06-18 2001-01-12 Mitsubishi Electric Corp Socket for test, manufacture of its contact terminal, and electronic apparatus or semiconductor package
DE19945178C2 (en) * 1999-09-21 2003-05-28 Rosenberger Hochfrequenztech Measuring tip for high-frequency measurement and method for its production

Also Published As

Publication number Publication date
DE10201491C1 (en) 2003-08-28
WO2003060529A1 (en) 2003-07-24

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase