AU2002356476A1 - Fast simulation of circuitry having soi transistors - Google Patents
Fast simulation of circuitry having soi transistorsInfo
- Publication number
- AU2002356476A1 AU2002356476A1 AU2002356476A AU2002356476A AU2002356476A1 AU 2002356476 A1 AU2002356476 A1 AU 2002356476A1 AU 2002356476 A AU2002356476 A AU 2002356476A AU 2002356476 A AU2002356476 A AU 2002356476A AU 2002356476 A1 AU2002356476 A1 AU 2002356476A1
- Authority
- AU
- Australia
- Prior art keywords
- circuitry
- soi transistors
- fast simulation
- simulation
- fast
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/36—Circuit design at the analogue level
- G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/32—Circuit design at the digital level
- G06F30/33—Design verification, e.g. functional simulation or model checking
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Evolutionary Computation (AREA)
- Geometry (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/RU2002/000397 WO2004021252A1 (en) | 2002-08-27 | 2002-08-27 | Fast simulation of circuitry having soi transistors |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2002356476A1 true AU2002356476A1 (en) | 2004-03-19 |
Family
ID=31974190
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2002356476A Abandoned AU2002356476A1 (en) | 2002-08-27 | 2002-08-27 | Fast simulation of circuitry having soi transistors |
Country Status (3)
Country | Link |
---|---|
US (1) | US7127384B2 (en) |
AU (1) | AU2002356476A1 (en) |
WO (1) | WO2004021252A1 (en) |
Families Citing this family (44)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1799053A (en) * | 2003-05-30 | 2006-07-05 | 加利福尼亚大学董事会 | Circuit network analysis using algebraic multigrid approach |
US7263477B2 (en) * | 2003-06-09 | 2007-08-28 | Cadence Design Systems, Inc. | Method and apparatus for modeling devices having different geometries |
US7444604B2 (en) * | 2003-09-26 | 2008-10-28 | Nascentric, Inc. | Apparatus and methods for simulation of electronic circuitry |
US7089512B2 (en) * | 2004-03-15 | 2006-08-08 | International Business Machines Corporation | Method for optimal use of direct fit and interpolated models in schematic custom design of electrical circuits |
FR2868181B1 (en) * | 2004-03-29 | 2006-05-26 | Soisic Sa | METHOD FOR SIMULATING A CIRCUIT AT THE STATIONARY STATE |
WO2006017286A2 (en) * | 2004-07-12 | 2006-02-16 | Mentor Graphics Corp. | Software state replay |
US20060015302A1 (en) | 2004-07-19 | 2006-01-19 | Fang Gang P | Method for generating and evaluating a table model for circuit simulation |
US20060069537A1 (en) * | 2004-09-29 | 2006-03-30 | Lihui Cao | Method for simulating noise in an integrated circuit system |
FR2880710B1 (en) * | 2005-01-11 | 2007-04-20 | St Microelectronics Sa | METHOD AND DEVICE FOR CHARACTERIZING A CELL INTENDED IN A SILICON-TYPE CMOS TECHNOLOGY ON PARTIALLY DEPLETED INSULATION |
US20060161413A1 (en) * | 2005-01-14 | 2006-07-20 | Legend Design Technology, Inc. | Methods for fast and large circuit simulation |
WO2006078302A1 (en) * | 2005-01-14 | 2006-07-27 | The Regents Of The University Of California | Efficient transistor-level circuit simulation |
US7325210B2 (en) * | 2005-03-10 | 2008-01-29 | International Business Machines Corporation | Hybrid linear wire model approach to tuning transistor widths of circuits with RC interconnect |
US8020122B2 (en) * | 2005-06-07 | 2011-09-13 | The Regents Of The University Of California | Circuit splitting in analysis of circuits at transistor level |
US8063713B2 (en) * | 2005-06-29 | 2011-11-22 | The Regents Of The University Of California | Differential transmission line having a plurality of leakage resistors spaced between the transmission line |
US7581199B1 (en) * | 2005-08-08 | 2009-08-25 | National Semiconductor Corporation | Use of state nodes for efficient simulation of large digital circuits at the transistor level |
US7412695B1 (en) * | 2005-08-08 | 2008-08-12 | National Semiconductor Corporation | Transient state nodes and a method for their identification |
US20070136044A1 (en) * | 2005-12-13 | 2007-06-14 | Beattie Michael W | Efficient simulation of dominantly linear circuits |
US20070234253A1 (en) * | 2006-03-29 | 2007-10-04 | International Business Machines Corporation | Multiple mode approach to building static timing models for digital transistor circuits |
US8060355B2 (en) * | 2007-07-27 | 2011-11-15 | Synopsys, Inc. | Automatic, hierarchy-independent partitioning method for transistor-level circuit simulation |
US9405870B2 (en) * | 2007-09-06 | 2016-08-02 | Globalfoundries Inc. | Generating coverage data for a switch frequency of HDL or VHDL signals |
US8245165B1 (en) * | 2008-04-11 | 2012-08-14 | Cadence Design Systems, Inc. | Methods and apparatus for waveform based variational static timing analysis |
US8499230B2 (en) | 2008-05-07 | 2013-07-30 | Lsi Corporation | Critical path monitor for an integrated circuit and method of operation thereof |
US8868395B2 (en) * | 2008-10-27 | 2014-10-21 | Synopsys, Inc. | Fast simulation method for integrated circuits with power management circuitry |
US8594989B2 (en) * | 2009-04-09 | 2013-11-26 | International Business Machines Corporation | Compensating for variations in device characteristics in integrated circuit simulation |
US8093916B2 (en) * | 2009-06-05 | 2012-01-10 | United Microelectronics Corp, | Method of characterizing a semiconductor device and semiconductor device |
US8239805B2 (en) * | 2009-07-27 | 2012-08-07 | Lsi Corporation | Method for designing integrated circuits employing a partitioned hierarchical design flow and an apparatus employing the method |
US8463587B2 (en) * | 2009-07-28 | 2013-06-11 | Synopsys, Inc. | Hierarchical order ranked simulation of electronic circuits |
FR2949564B1 (en) * | 2009-08-28 | 2012-01-06 | Commissariat Energie Atomique | METHOD AND DEVICE FOR EVALUATING THE ELECTRIC PERFORMANCES OF AN FDSOI TRANSISTOR |
US8327302B2 (en) * | 2009-10-16 | 2012-12-04 | International Business Machines Corporation | Techniques for analysis of logic designs with transient logic |
CN102147828B (en) * | 2011-03-24 | 2013-06-26 | 中国科学院上海微系统与信息技术研究所 | Equivalent electrical model of SOI field effect transistor of body leading-out structure and modeling method |
US8849643B2 (en) * | 2011-05-13 | 2014-09-30 | International Business Machines Corporation | Table-lookup-based models for yield analysis acceleration |
US9002692B2 (en) * | 2012-03-13 | 2015-04-07 | Synopsys, Inc. | Electronic circuit simulation method with adaptive iteration |
US8645883B2 (en) * | 2012-05-08 | 2014-02-04 | Oracle International Corporation | Integrated circuit simulation using fundamental and derivative circuit runs |
US8464199B1 (en) * | 2012-05-16 | 2013-06-11 | International Business Machines Corporation | Circuit design using design variable function slope sensitivity |
US8990739B2 (en) * | 2012-12-04 | 2015-03-24 | The Mathworks, Inc. | Model-based retiming with functional equivalence constraints |
US9779195B2 (en) | 2012-12-04 | 2017-10-03 | The Mathworks, Inc. | Model-based retiming with functional equivalence constraints |
US9081927B2 (en) | 2013-10-04 | 2015-07-14 | Jasper Design Automation, Inc. | Manipulation of traces for debugging a circuit design |
US9898564B2 (en) * | 2014-01-15 | 2018-02-20 | Sage Software, Inc. | SSTA with non-gaussian variation to second order for multi-phase sequential circuit with interconnect effect |
US10599881B1 (en) * | 2014-03-25 | 2020-03-24 | Mentor Graphics Corporation | Circuit simulation waveform generation and display |
US10346573B1 (en) * | 2015-09-30 | 2019-07-09 | Cadence Design Systems, Inc. | Method and system for performing incremental post layout simulation with layout edits |
US9754058B2 (en) | 2015-11-05 | 2017-09-05 | International Business Machines Corporation | Cross-current power modelling using logic simulation |
US10394999B2 (en) | 2015-11-18 | 2019-08-27 | International Business Machines Corporation | Analysis of coupled noise for integrated circuit design |
US11100268B1 (en) * | 2017-08-29 | 2021-08-24 | Cadence Design Systems, Inc. | Fast and accurate simulation for power delivery networks with integrated voltage regulators |
CN108549620B (en) * | 2018-03-07 | 2021-10-15 | 广东省科学院生态环境与土壤研究所 | Estimation method, system and device for biological effectiveness of heavy metals in soil |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2028010C1 (en) * | 1987-11-30 | 1995-01-27 | Московский Институт Инженеров Железнодорожного Транспорта | Device for modelling parameters of transistors |
JP2763985B2 (en) | 1992-04-27 | 1998-06-11 | 三菱電機株式会社 | Logic simulation equipment |
US5446676A (en) | 1993-03-29 | 1995-08-29 | Epic Design Technology Inc. | Transistor-level timing and power simulator and power analyzer |
US5761481A (en) | 1995-05-04 | 1998-06-02 | Advanced Micro Devices, Inc. | Semiconductor simulator tool for experimental N-channel transistor modeling |
US5770881A (en) * | 1996-09-12 | 1998-06-23 | International Business Machines Coproration | SOI FET design to reduce transient bipolar current |
US6055460A (en) * | 1997-08-06 | 2000-04-25 | Advanced Micro Devices, Inc. | Semiconductor process compensation utilizing non-uniform ion implantation methodology |
US6141632A (en) | 1997-09-26 | 2000-10-31 | International Business Machines Corporation | Method for use in simulation of an SOI device |
US6023577A (en) | 1997-09-26 | 2000-02-08 | International Business Machines Corporation | Method for use in simulation of an SOI device |
US6249898B1 (en) * | 1998-06-30 | 2001-06-19 | Synopsys, Inc. | Method and system for reliability analysis of CMOS VLSI circuits based on stage partitioning and node activities |
US6298467B1 (en) | 1998-11-10 | 2001-10-02 | International Business Machines Corporation | Method and system for reducing hysteresis effect in SOI CMOS circuits |
US6268630B1 (en) * | 1999-03-16 | 2001-07-31 | Sandia Corporation | Silicon-on-insulator field effect transistor with improved body ties for rad-hard applications |
US6480816B1 (en) * | 1999-06-14 | 2002-11-12 | Sanjay Dhar | Circuit simulation using dynamic partitioning and on-demand evaluation |
US6397172B1 (en) * | 1999-06-14 | 2002-05-28 | David J. Gurney | Adaptive integrated circuit design simulation transistor modeling and evaluation |
WO2001020648A2 (en) * | 1999-09-17 | 2001-03-22 | Ise Integrated Systems Engineering Ag | Quantum corrections for modeling semiconductor behavior |
US6567773B1 (en) * | 1999-11-17 | 2003-05-20 | International Business Machines Corporation | Use of static noise analysis for integrated circuits fabricated in a silicon-on-insulator process technology |
US6442735B1 (en) * | 2000-03-15 | 2002-08-27 | International Business Machines Corp. | SOI circuit design method |
US7188072B2 (en) * | 2000-06-13 | 2007-03-06 | Intergraph Software Technologies Company | Systems and methods for the collaborative design, construction, and maintenance of fluid processing plants |
TW548596B (en) | 2000-08-05 | 2003-08-21 | Ibm | Automatic check for cyclic operating conditions for SOI circuit simulation |
-
2002
- 2002-08-27 AU AU2002356476A patent/AU2002356476A1/en not_active Abandoned
- 2002-08-27 WO PCT/RU2002/000397 patent/WO2004021252A1/en not_active Application Discontinuation
- 2002-08-27 US US10/333,432 patent/US7127384B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
WO2004021252A1 (en) | 2004-03-11 |
US7127384B2 (en) | 2006-10-24 |
US20040044510A1 (en) | 2004-03-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
AU2002356476A1 (en) | Fast simulation of circuitry having soi transistors | |
AU2003247951A1 (en) | Compositions and methods for controlling parasitic nematodes | |
AU2003286806A1 (en) | Novel field effect transistor and method of fabrication | |
AU2003205950A1 (en) | Placement of alternative advertisements | |
AU2003262770A1 (en) | Tri-gate devices and methods of fabrication | |
AU2003221927A1 (en) | Authentication of integrated circuits | |
AU2002341194A1 (en) | Organic field effect transistors | |
AU2003234718A1 (en) | Instrument introducer | |
AU2002310268A1 (en) | Synchronization of multiple simulation domains in an eda simulation environment | |
AU2002952700A0 (en) | Simulation player | |
AU2003248770A1 (en) | Integrated circuit including field effect transistor and method of manufacture | |
AUPS032202A0 (en) | Teether | |
AU2002238814A1 (en) | Provision of location information | |
AU2003277596A1 (en) | Method of deuterization | |
AU2003249439A1 (en) | Field effect transistor | |
AU2003240570A1 (en) | Dopen region in an soi substrate | |
AU2003291104A1 (en) | Uncaging devices | |
AU2003252289A1 (en) | Field effect transistor | |
AU2003282646A1 (en) | Isolation circuit | |
AU2003214609A1 (en) | Derivatives of isoflavones | |
AU2003206210A1 (en) | Educational block set | |
AU2003267765A1 (en) | Thin film transistors and methods of manufacture thereof | |
AU2003216848A1 (en) | Deracemisation of amines | |
AU2003231271A1 (en) | Method of producing an soi wafer | |
AU2003226240A1 (en) | High speed soi transistors |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MK6 | Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase |