AU2002213109A1 - Automated monitoring system, virtual oven and method for stress testing logically grouped modules - Google Patents
Automated monitoring system, virtual oven and method for stress testing logically grouped modulesInfo
- Publication number
- AU2002213109A1 AU2002213109A1 AU2002213109A AU1310902A AU2002213109A1 AU 2002213109 A1 AU2002213109 A1 AU 2002213109A1 AU 2002213109 A AU2002213109 A AU 2002213109A AU 1310902 A AU1310902 A AU 1310902A AU 2002213109 A1 AU2002213109 A1 AU 2002213109A1
- Authority
- AU
- Australia
- Prior art keywords
- monitoring system
- stress testing
- logically grouped
- automated monitoring
- virtual oven
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2868—Complete testing stations; systems; procedures; software aspects
- G01R31/287—Procedures; Software aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2868—Complete testing stations; systems; procedures; software aspects
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S707/00—Data processing: database and file management or data structures
- Y10S707/99941—Database schema or data structure
- Y10S707/99944—Object-oriented database structure
- Y10S707/99945—Object-oriented database structure processing
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US24059600P | 2000-10-13 | 2000-10-13 | |
US60/240,596 | 2000-10-13 | ||
US60240596 | 2000-10-13 | ||
PCT/US2001/031762 WO2002031519A2 (en) | 2000-10-13 | 2001-10-11 | Automated monitoring system, virtual oven and method for stress testing logically grouped modules |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2002213109A1 true AU2002213109A1 (en) | 2002-04-22 |
Family
ID=22907170
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2002211641A Abandoned AU2002211641A1 (en) | 2000-10-13 | 2001-10-11 | Stress-test information database structure and method of use |
AU2002213109A Abandoned AU2002213109A1 (en) | 2000-10-13 | 2001-10-11 | Automated monitoring system, virtual oven and method for stress testing logically grouped modules |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2002211641A Abandoned AU2002211641A1 (en) | 2000-10-13 | 2001-10-11 | Stress-test information database structure and method of use |
Country Status (3)
Country | Link |
---|---|
US (2) | US6766267B2 (en) |
AU (2) | AU2002211641A1 (en) |
WO (2) | WO2002031519A2 (en) |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003139652A (en) * | 2001-11-01 | 2003-05-14 | Opnext Japan Inc | Method and apparatus for test of optical module |
HK1053587A2 (en) * | 2002-02-19 | 2003-10-10 | Interdigital Tech Corp | Method and apparatus for providing biasing criteria for binary decisions employed by a user equipment (ue) in wireless communications to enhance protection |
DE10229946A1 (en) * | 2002-07-04 | 2004-01-29 | Vibtec Schwingungstechnik Gmbh | Test method for electric/electronic components detects an electrical parameter for the components under preset environmental conditions |
DE10241045B4 (en) * | 2002-08-30 | 2006-07-20 | Infineon Technologies Ag | Method for carrying out test measurements on light-emitting components |
US6859758B1 (en) * | 2002-11-12 | 2005-02-22 | Cisco Technology, Inc. | Stress testing database storage |
US20060167947A1 (en) * | 2003-03-01 | 2006-07-27 | Dunkle Mark V | Communications interface database for electronic diagnostic apparatus |
CN100445912C (en) * | 2003-03-01 | 2008-12-24 | 应用材料有限公司 | Communications interface database for electronic diagnostic apparatus |
US6993446B2 (en) * | 2003-03-17 | 2006-01-31 | Schlumberger Technology Corporation | Method and apparatus for predicting the time to failure of electronic devices at high temperatures |
US8145743B2 (en) * | 2003-04-17 | 2012-03-27 | International Business Machines Corporation | Administering devices in dependence upon user metric vectors |
US20040249912A1 (en) * | 2003-04-17 | 2004-12-09 | International Business Machines Corporation | Method and system for administering devices in dependence upon user metrics |
US7779114B2 (en) * | 2003-04-17 | 2010-08-17 | International Business Machines Corporation | Method and system for administering devices with multiple user metric spaces |
US20040249825A1 (en) * | 2003-06-05 | 2004-12-09 | International Business Machines Corporation | Administering devices with dynamic action lists |
US7437443B2 (en) * | 2003-07-02 | 2008-10-14 | International Business Machines Corporation | Administering devices with domain state objects |
US20050050137A1 (en) * | 2003-08-29 | 2005-03-03 | International Business Machines Corporation | Administering devices in dependence upon metric patterns |
US20050265717A1 (en) * | 2004-05-28 | 2005-12-01 | Yu Zhou | Opto-electronic device testing apparatus and method |
US7599618B2 (en) * | 2005-01-06 | 2009-10-06 | Circadiant Systems, Inc. | Method and apparatus for self-testing of test equipment |
US20070005996A1 (en) * | 2005-06-30 | 2007-01-04 | Nalawadi Rajeev K | Collecting thermal, acoustic or power data about a computing platform and deriving characterization data for use by a driver |
US20070101214A1 (en) * | 2005-10-28 | 2007-05-03 | Stauffer Titus D | Self-testing apparatus with controllable environmental stress screening (ESS) |
DE102006052746A1 (en) * | 2006-08-16 | 2008-02-21 | Rohde & Schwarz Gmbh & Co. Kg | Method for analyzing effects of external influences on electrical circuits and analysis device |
US7519481B2 (en) * | 2006-09-11 | 2009-04-14 | Tetra Tech | System and method for predicting compatibility of fluids with metals |
US7915902B2 (en) * | 2006-10-18 | 2011-03-29 | Mongtage Technology Group Limited | Dynamic burn-in systems and apparatuses |
US7991663B1 (en) | 2007-10-26 | 2011-08-02 | United Services Automobile Association (Usaa) | System for volume and stress testing bank debit card processing systems |
US7653502B2 (en) * | 2007-11-05 | 2010-01-26 | Electronic Controls Design, Inc. | Data logger with pass/fail analysis |
US8875101B2 (en) * | 2008-09-29 | 2014-10-28 | International Business Machines Corporation | Reduction of the number of interoperability test candidates and the time for interoperability testing |
US9103874B2 (en) * | 2012-01-09 | 2015-08-11 | International Business Machines Corporation | Concurrent test instrumentation |
RU2513504C1 (en) * | 2013-05-07 | 2014-04-20 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Тихоокеанский государственный университет" | Method of searching for faulty unit in continuous dynamic system |
EP2999999A4 (en) | 2013-05-23 | 2017-03-29 | Duke Manufacturing Co. | Food preparation apparatus and methods |
US10918112B2 (en) | 2013-05-23 | 2021-02-16 | Duke Manufacturing Co. | Dough preparation apparatus and methods |
US9607717B2 (en) * | 2014-06-06 | 2017-03-28 | Texas Instruments Incorporated | Reliability screening of ferroelectric memories in integrated circuits |
CN106909131B (en) * | 2015-12-22 | 2020-10-16 | 上海西门子线路保护系统有限公司 | Management system of experimental instrument |
CN108564224B (en) * | 2018-04-24 | 2021-02-09 | 华中科技大学 | Environmental stress screening time optimization method and equipment |
US10425068B1 (en) * | 2018-06-14 | 2019-09-24 | Nxp B.V. | Self-testing of an analog mixed-signal circuit using pseudo-random noise |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3761808A (en) * | 1970-07-08 | 1973-09-25 | Aai Corp | Testing arrangement |
US4542341A (en) * | 1982-01-04 | 1985-09-17 | Artronics Corporation | Electronic burn-in system |
US4866714A (en) * | 1987-10-15 | 1989-09-12 | Westinghouse Electric Corp. | Personal computer-based dynamic burn-in system |
WO1991008543A1 (en) * | 1989-11-30 | 1991-06-13 | Seer Technologies, Inc. | Computer-aided software engineering facility |
US5504879A (en) * | 1992-07-16 | 1996-04-02 | International Business Machines Corporation | Resolution of relationship source and target in a versioned database management system |
GB2278213A (en) * | 1993-05-18 | 1994-11-23 | Ibm | Test program generator. |
US5570032A (en) * | 1993-08-17 | 1996-10-29 | Micron Technology, Inc. | Wafer scale burn-in apparatus and process |
US5600576A (en) | 1994-03-11 | 1997-02-04 | Northrop Grumman Corporation | Time stress measurement device |
US5610866A (en) * | 1994-10-31 | 1997-03-11 | Sgs-Thomson Microelectronics, Inc. | Circuit structure and method for stress testing of bit lines |
US5539652A (en) * | 1995-02-07 | 1996-07-23 | Hewlett-Packard Company | Method for manufacturing test simulation in electronic circuit design |
US5745767A (en) * | 1995-03-28 | 1998-04-28 | Microsoft Corporation | Method and system for testing the interoperability of application programs |
US5740429A (en) * | 1995-07-07 | 1998-04-14 | Advanced Micro Devices, Inc. | E10 reporting tool |
US5966021A (en) | 1996-04-03 | 1999-10-12 | Pycon, Inc. | Apparatus for testing an integrated circuit in an oven during burn-in |
US5870407A (en) * | 1996-05-24 | 1999-02-09 | Advanced Micro Devices, Inc. | Method of screening memory cells at room temperature that would be rejected during hot temperature programming tests |
US5936719A (en) | 1996-07-16 | 1999-08-10 | Johnson; Robert W. | Test unit and method for simultaneous testing of multiple optical fibers |
KR100234377B1 (en) * | 1997-04-10 | 1999-12-15 | 윤종용 | Redundancy memory cell control circuit and method for memory device |
US6137830A (en) * | 1998-01-16 | 2000-10-24 | Motorola | Measuring bit error rate performance of a receiver by the receiver and conveying measurement acoustically |
US6119255A (en) * | 1998-01-21 | 2000-09-12 | Micron Technology, Inc. | Testing system for evaluating integrated circuits, a burn-in testing system, and a method for testing an integrated circuit |
US6175812B1 (en) * | 1998-02-26 | 2001-01-16 | Micron Technology, Inc. | Method and system for dynamic duration burn-in |
US6401220B1 (en) * | 1998-08-21 | 2002-06-04 | National Instruments Corporation | Test executive system and method including step types for improved configurability |
US6285967B1 (en) * | 1998-10-22 | 2001-09-04 | Dell Usa, L.P. | Troubleshooting computer systems during manufacturing using state and attribute information |
US6229325B1 (en) * | 1999-02-26 | 2001-05-08 | Micron Technology, Inc. | Method and apparatus for burn-in and test of field emission displays |
-
2001
- 2001-10-11 US US09/975,722 patent/US6766267B2/en not_active Expired - Fee Related
- 2001-10-11 WO PCT/US2001/031762 patent/WO2002031519A2/en active Application Filing
- 2001-10-11 AU AU2002211641A patent/AU2002211641A1/en not_active Abandoned
- 2001-10-11 WO PCT/US2001/031805 patent/WO2002031520A2/en active Application Filing
- 2001-10-11 AU AU2002213109A patent/AU2002213109A1/en not_active Abandoned
- 2001-10-11 US US09/975,686 patent/US6950830B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
AU2002211641A1 (en) | 2002-04-22 |
WO2002031520A8 (en) | 2003-04-17 |
US6766267B2 (en) | 2004-07-20 |
WO2002031519A3 (en) | 2002-07-18 |
US6950830B2 (en) | 2005-09-27 |
WO2002031520A2 (en) | 2002-04-18 |
US20020105355A1 (en) | 2002-08-08 |
WO2002031520A3 (en) | 2002-08-01 |
US20020107581A1 (en) | 2002-08-08 |
WO2002031519A2 (en) | 2002-04-18 |
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