AU2001282862A1 - Method and apparatus for removing minute particles from a surface - Google Patents
Method and apparatus for removing minute particles from a surfaceInfo
- Publication number
- AU2001282862A1 AU2001282862A1 AU2001282862A AU8286201A AU2001282862A1 AU 2001282862 A1 AU2001282862 A1 AU 2001282862A1 AU 2001282862 A AU2001282862 A AU 2001282862A AU 8286201 A AU8286201 A AU 8286201A AU 2001282862 A1 AU2001282862 A1 AU 2001282862A1
- Authority
- AU
- Australia
- Prior art keywords
- minute particles
- removing minute
- particles
- minute
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02046—Dry cleaning only
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
- B08B7/0035—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like
- B08B7/0042—Cleaning by methods not provided for in a single other subclass or a single group in this subclass by radiant energy, e.g. UV, laser, light beam or the like by laser
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/82—Auxiliary processes, e.g. cleaning or inspecting
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US22041800P | 2000-07-24 | 2000-07-24 | |
US60220418 | 2000-07-24 | ||
US09/909,993 US20020029956A1 (en) | 2000-07-24 | 2001-07-23 | Method and apparatus for removing minute particles from a surface |
US09/909,992 US6805751B2 (en) | 2000-07-24 | 2001-07-23 | Method and apparatus for removal of minute particles from a surface using thermophoresis to prevent particle redeposition |
PCT/US2001/021113 WO2002007926A1 (en) | 2000-07-24 | 2001-07-24 | Method and apparatus for removing minute particles from a surface |
USNOTGIVEN | 2001-08-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2001282862A1 true AU2001282862A1 (en) | 2002-02-05 |
Family
ID=27396791
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2001282862A Abandoned AU2001282862A1 (en) | 2000-07-24 | 2001-07-24 | Method and apparatus for removing minute particles from a surface |
AU2001282861A Abandoned AU2001282861A1 (en) | 2000-07-24 | 2001-07-24 | Method and apparatus for removal of minute particles from a surface using thermophoresis to prevent particle redeposition |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2001282861A Abandoned AU2001282861A1 (en) | 2000-07-24 | 2001-07-24 | Method and apparatus for removal of minute particles from a surface using thermophoresis to prevent particle redeposition |
Country Status (2)
Country | Link |
---|---|
AU (2) | AU2001282862A1 (en) |
WO (2) | WO2002007926A1 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1411388B1 (en) * | 2002-09-12 | 2006-12-20 | ASML Netherlands B.V. | A method of cleaning by removing particles from surfaces, a cleaning apparatus and a lithographic projection apparatus |
CN1961258A (en) | 2004-05-28 | 2007-05-09 | 皇家飞利浦电子股份有限公司 | Cleaning a mask substrate |
CN105012953B (en) | 2005-07-25 | 2018-06-22 | 阿普泰沃研发有限责任公司 | B- cells are reduced with CD37- specificity and CD20- specific binding molecules |
US10138539B1 (en) * | 2018-04-03 | 2018-11-27 | Shiping Cheng | Method of managing coating uniformity with an optical thickness monitoring system |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA1265209A (en) * | 1984-02-17 | 1990-01-30 | Robert Langen | Process to remove contaminants, particularly rust/from metallic surfaces |
US5373806A (en) * | 1985-05-20 | 1994-12-20 | Applied Materials, Inc. | Particulate-free epitaxial process |
US4752668A (en) * | 1986-04-28 | 1988-06-21 | Rosenfield Michael G | System for laser removal of excess material from a semiconductor wafer |
US5643472A (en) * | 1988-07-08 | 1997-07-01 | Cauldron Limited Partnership | Selective removal of material by irradiation |
US6048588A (en) * | 1988-07-08 | 2000-04-11 | Cauldron Limited Partnership | Method for enhancing chemisorption of material |
US5531857A (en) * | 1988-07-08 | 1996-07-02 | Cauldron Limited Partnership | Removal of surface contaminants by irradiation from a high energy source |
US5821175A (en) * | 1988-07-08 | 1998-10-13 | Cauldron Limited Partnership | Removal of surface contaminants by irradiation using various methods to achieve desired inert gas flow over treated surface |
US5151135A (en) * | 1989-09-15 | 1992-09-29 | Amoco Corporation | Method for cleaning surfaces using UV lasers |
US4987286A (en) * | 1989-10-30 | 1991-01-22 | University Of Iowa Research Foundation | Method and apparatus for removing minute particles from a surface |
US5023424A (en) * | 1990-01-22 | 1991-06-11 | Tencor Instruments | Shock wave particle removal method and apparatus |
US5332879A (en) * | 1992-12-02 | 1994-07-26 | The Aerospace Corporation | Method for removing trace metal contaminants from organic dielectrics |
KR0141659B1 (en) * | 1993-07-19 | 1998-07-15 | 가나이 쓰토무 | An apparatus for removing foreign particles and the method |
US5516369A (en) * | 1994-05-06 | 1996-05-14 | United Microelectronics Corporation | Method and apparatus for particle reduction from semiconductor wafers |
US5637245A (en) * | 1995-04-13 | 1997-06-10 | Vernay Laboratories, Inc. | Method and apparatus for minimizing degradation of equipment in a laser cleaning technique |
TW284907B (en) * | 1995-06-07 | 1996-09-01 | Cauldron Lp | Removal of material by polarized irradiation and back side application for radiation |
US5950071A (en) * | 1995-11-17 | 1999-09-07 | Lightforce Technology, Inc. | Detachment and removal of microscopic surface contaminants using a pulsed detach light |
JP3044188B2 (en) * | 1996-02-15 | 2000-05-22 | 核燃料サイクル開発機構 | Laser decontamination method |
US5800625A (en) * | 1996-07-26 | 1998-09-01 | Cauldron Limited Partnership | Removal of material by radiation applied at an oblique angle |
US6064035A (en) * | 1997-12-30 | 2000-05-16 | Lsp Technologies, Inc. | Process chamber for laser peening |
-
2001
- 2001-07-24 WO PCT/US2001/021113 patent/WO2002007926A1/en active Application Filing
- 2001-07-24 WO PCT/US2001/021112 patent/WO2002007925A1/en active Application Filing
- 2001-07-24 AU AU2001282862A patent/AU2001282862A1/en not_active Abandoned
- 2001-07-24 AU AU2001282861A patent/AU2001282861A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
AU2001282861A1 (en) | 2002-02-05 |
WO2002007926A8 (en) | 2002-06-20 |
WO2002007926A1 (en) | 2002-01-31 |
WO2002007925A1 (en) | 2002-01-31 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
AU2001278325A1 (en) | Method and apparatus for formation damage removal | |
AU2002226002A1 (en) | Apparatus and method for detecting and removing undesirable material from workpieces | |
AU2001229729A1 (en) | Device and method for selectively removing a thrombus filter | |
AU2001270205A1 (en) | Method and apparatus for wafer cleaning | |
AU2001277061A1 (en) | Method and apparatus for fine feature spray deposition | |
AU2003202895A1 (en) | Apparatus and method for stone removal from a body | |
EP1128415B8 (en) | Sheet removing apparatus and method | |
GB0211641D0 (en) | Apparatus and method for cleaning a surface | |
AU2002230053A1 (en) | A method and apparatus for processing a token | |
AU2002211838A1 (en) | Apparatus for switchng and manipulating particles and method of use thereof | |
AU1396300A (en) | Method and apparatus for removing particulates | |
AU2001289093A1 (en) | Method and apparatus for counting submicron sized particles | |
AU2001227007A1 (en) | A processing method and apparatus | |
AU2003251606A1 (en) | Method and apparatus for removing minute particle(s) from a surface | |
AU4567500A (en) | Apparatus and process for removing solid particles from gases | |
AU7969300A (en) | Method and apparatus for removing solid particles from a gas | |
AU5157100A (en) | Process for removing contaminant from a surface and composition useful therefor | |
AU2001282862A1 (en) | Method and apparatus for removing minute particles from a surface | |
AU2001292994A1 (en) | A method and apparatus for controlled polishing | |
EP0747788A3 (en) | Cleaning apparatus and method for removing particles from a surface | |
AU2002222137A1 (en) | Method and apparatus for processing waste | |
AU2001287546A1 (en) | A method and an apparatus for separating waste | |
GB2382022B (en) | A method and apparatus for removing gum | |
AU2001237032A1 (en) | Apparatus and process for selecting and positioning particles | |
AU2001266556A1 (en) | Methods and apparatus for particulate removal from fabrics |