AU2001264826A1 - Method and apparatus for in-circuit impedance measurement - Google Patents

Method and apparatus for in-circuit impedance measurement

Info

Publication number
AU2001264826A1
AU2001264826A1 AU2001264826A AU6482601A AU2001264826A1 AU 2001264826 A1 AU2001264826 A1 AU 2001264826A1 AU 2001264826 A AU2001264826 A AU 2001264826A AU 6482601 A AU6482601 A AU 6482601A AU 2001264826 A1 AU2001264826 A1 AU 2001264826A1
Authority
AU
Australia
Prior art keywords
impedance measurement
circuit impedance
circuit
measurement
impedance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001264826A
Inventor
Kenneth M. Cox
Larry J Davis
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SIGNUS Inc
Original Assignee
SIGNUS Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SIGNUS Inc filed Critical SIGNUS Inc
Publication of AU2001264826A1 publication Critical patent/AU2001264826A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06755—Material aspects
    • G01R1/06761—Material aspects related to layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813—Checking the presence, location, orientation or value, e.g. resistance, of components or conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2843—In-circuit-testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
AU2001264826A 2000-05-22 2001-05-21 Method and apparatus for in-circuit impedance measurement Abandoned AU2001264826A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US57631300A 2000-05-22 2000-05-22
US09576313 2000-05-22
PCT/US2001/016618 WO2001090764A1 (en) 2000-05-22 2001-05-21 Method and apparatus for in-circuit impedance measurement

Publications (1)

Publication Number Publication Date
AU2001264826A1 true AU2001264826A1 (en) 2001-12-03

Family

ID=24303899

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001264826A Abandoned AU2001264826A1 (en) 2000-05-22 2001-05-21 Method and apparatus for in-circuit impedance measurement

Country Status (2)

Country Link
AU (1) AU2001264826A1 (en)
WO (1) WO2001090764A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101858940B (en) * 2009-04-07 2012-09-19 中茂电子(深圳)有限公司 Output impedance measuring method and device
US8310256B2 (en) * 2009-12-22 2012-11-13 Teradyne, Inc. Capacitive opens testing in low signal environments

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4050017A (en) * 1976-03-19 1977-09-20 Universal Instruments Corporation Sequence component tester
IT1209549B (en) * 1984-05-24 1989-08-30 Axis Spa Monitor for resistance values between commutator bars
US5140276A (en) * 1991-04-02 1992-08-18 Automation Technology, Inc. Armature connection resistance measuring method and apparatus
US5307019A (en) * 1992-09-21 1994-04-26 Slaughter Company, Division Of R. E. Phelon Company, Inc. Method and apparatus for determining the weld and coil resistances of a motor winding
US5457402A (en) * 1994-04-25 1995-10-10 Odawara Engineering Co., Ltd. Armature resistance measuring apparatus and method
US5550477A (en) * 1994-08-01 1996-08-27 Axis Usa, Inc. Methods and apparatus for testing armature coils and coil lead connections using resistance measurements
US5804979A (en) * 1997-05-13 1998-09-08 Fluke Corporation Circuit for measuring in-circuit resistance and current

Also Published As

Publication number Publication date
WO2001090764A1 (en) 2001-11-29

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