AU2001244350A1 - Methods and apparatus for atomic force microscopy - Google Patents

Methods and apparatus for atomic force microscopy

Info

Publication number
AU2001244350A1
AU2001244350A1 AU2001244350A AU4435001A AU2001244350A1 AU 2001244350 A1 AU2001244350 A1 AU 2001244350A1 AU 2001244350 A AU2001244350 A AU 2001244350A AU 4435001 A AU4435001 A AU 4435001A AU 2001244350 A1 AU2001244350 A1 AU 2001244350A1
Authority
AU
Australia
Prior art keywords
methods
atomic force
force microscopy
microscopy
atomic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001244350A
Inventor
Massimo Antognozzi
Andrew David Laver Humphris
Terence James Mcmaster
Mervyn John Miles
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Bristol
Original Assignee
University of Bristol
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Bristol filed Critical University of Bristol
Publication of AU2001244350A1 publication Critical patent/AU2001244350A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/02—Monitoring the movement or position of the probe by optical means
AU2001244350A 2000-03-30 2001-03-30 Methods and apparatus for atomic force microscopy Abandoned AU2001244350A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB0007747.9A GB0007747D0 (en) 2000-03-30 2000-03-30 Methods and apparatus for atomic force microscopy
GB0007747 2000-03-30
PCT/GB2001/001470 WO2001075427A1 (en) 2000-03-30 2001-03-30 Methods and apparatus for atomic force microscopy

Publications (1)

Publication Number Publication Date
AU2001244350A1 true AU2001244350A1 (en) 2001-10-15

Family

ID=9888772

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001244350A Abandoned AU2001244350A1 (en) 2000-03-30 2001-03-30 Methods and apparatus for atomic force microscopy

Country Status (7)

Country Link
EP (1) EP1269168A1 (en)
JP (1) JP2003529761A (en)
KR (1) KR20030015220A (en)
AU (1) AU2001244350A1 (en)
CA (1) CA2404604A1 (en)
GB (1) GB0007747D0 (en)
WO (1) WO2001075427A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100626222B1 (en) * 2004-12-22 2006-09-21 한양대학교 산학협력단 Functional disk of Scanning Probe Microscope and method for measuring voltage/current between the tip and the sample using functional disk of Scanning Probe Microscope
DE102007031112A1 (en) 2007-06-27 2009-01-02 Technische Universität Ilmenau Apparatus and method for investigating surface properties of various materials
KR101488059B1 (en) * 2008-06-06 2015-01-29 인피니트시마 리미티드 Probe detection system
KR101607606B1 (en) 2015-08-17 2016-03-31 한국표준과학연구원 Measuring method for atomic force microscope
JP6936964B2 (en) * 2016-08-26 2021-09-22 大日本印刷株式会社 Scanning probe microscope
CN111077347B (en) * 2019-12-25 2022-05-03 北京航空航天大学 Atomic force microscopy probe clamping device

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5206702A (en) * 1989-10-09 1993-04-27 Olympus Optical Co., Ltd. Technique for canceling the effect of external vibration on an atomic force microscope
US5291775A (en) * 1992-03-04 1994-03-08 Topometrix Scanning force microscope with integrated optics and cantilever mount
JPH05256641A (en) * 1992-03-11 1993-10-05 Olympus Optical Co Ltd Cantilever displacement detector
US5408094A (en) * 1992-05-07 1995-04-18 Olympus Optical Co., Ltd. Atomic force microscope with light beam emission at predetermined angle
US5509300A (en) * 1994-05-12 1996-04-23 Arizona Board Of Regents Acting For Arizona State University Non-contact force microscope having a coaxial cantilever-tip configuration
US5982009A (en) * 1997-03-01 1999-11-09 Korea Advanced Institute Of Science & Technology Integrated device of cantilever and light source

Also Published As

Publication number Publication date
KR20030015220A (en) 2003-02-20
WO2001075427A1 (en) 2001-10-11
GB0007747D0 (en) 2000-05-17
JP2003529761A (en) 2003-10-07
CA2404604A1 (en) 2001-10-11
EP1269168A1 (en) 2003-01-02

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