AU1715697A - Process for monitoring a disperse system for non-dispersed impurities and devi ce for carrying out said process - Google Patents

Process for monitoring a disperse system for non-dispersed impurities and devi ce for carrying out said process

Info

Publication number
AU1715697A
AU1715697A AU17156/97A AU1715697A AU1715697A AU 1715697 A AU1715697 A AU 1715697A AU 17156/97 A AU17156/97 A AU 17156/97A AU 1715697 A AU1715697 A AU 1715697A AU 1715697 A AU1715697 A AU 1715697A
Authority
AU
Australia
Prior art keywords
devi
monitoring
carrying
disperse system
dispersed impurities
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU17156/97A
Other languages
English (en)
Inventor
Fredi Stucki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Borealis AS
Original Assignee
ABB Research Ltd Sweden
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ABB Research Ltd Sweden filed Critical ABB Research Ltd Sweden
Publication of AU1715697A publication Critical patent/AU1715697A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C48/00—Extrusion moulding, i.e. expressing the moulding material through a die or nozzle which imparts the desired form; Apparatus therefor
    • B29C48/25—Component parts, details or accessories; Auxiliary operations
    • B29C48/92—Measuring, controlling or regulating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92009—Measured parameter
    • B29C2948/92228—Content, e.g. percentage of humidity, volatiles, contaminants or degassing
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92009—Measured parameter
    • B29C2948/92295—Errors or malfunctioning, e.g. for quality control
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92323—Location or phase of measurement
    • B29C2948/92438—Conveying, transporting or storage of articles
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92504—Controlled parameter
    • B29C2948/92723—Content, e.g. percentage of humidity, volatiles, contaminants or degassing
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92504—Controlled parameter
    • B29C2948/9279—Errors or malfunctioning, e.g. for quality control
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92819—Location or phase of control
    • B29C2948/92933—Conveying, transporting or storage of articles

Landscapes

  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mechanical Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AU17156/97A 1996-02-29 1997-02-21 Process for monitoring a disperse system for non-dispersed impurities and devi ce for carrying out said process Abandoned AU1715697A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19607582 1996-02-29
DE19607582A DE19607582A1 (de) 1996-02-29 1996-02-29 Verfahren zur Überwachung eines dispersen Systems auf nichtdispergierte Verunreinigungen und Vorrichtung zur Durchführung dieses Verfahrens
PCT/CH1997/000064 WO1997032200A1 (de) 1996-02-29 1997-02-21 Verfahren zur überwachung eines dispersen systems auf nichtdispergierte verunreinigungen und vorrichtung zur durchführung dieses verfahrens

Publications (1)

Publication Number Publication Date
AU1715697A true AU1715697A (en) 1997-09-16

Family

ID=7786714

Family Applications (1)

Application Number Title Priority Date Filing Date
AU17156/97A Abandoned AU1715697A (en) 1996-02-29 1997-02-21 Process for monitoring a disperse system for non-dispersed impurities and devi ce for carrying out said process

Country Status (7)

Country Link
EP (1) EP0883800A1 (de)
JP (1) JP2000505552A (de)
KR (1) KR19990087358A (de)
AU (1) AU1715697A (de)
CA (1) CA2247377A1 (de)
DE (1) DE19607582A1 (de)
WO (1) WO1997032200A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006179424A (ja) * 2004-12-24 2006-07-06 Toyota Motor Corp 電池の製造方法
EP1758398A1 (de) 2005-08-23 2007-02-28 Syneola SA Auf multidimensionale Semiotik und Fuzzylogik basierende Metadaten- und Benutzeroberfläche für ein interaktives Multimediasystem mit wissenbasierter Adaptationsfähigkeit
DE102015114658A1 (de) * 2015-09-02 2017-03-02 Troester Gmbh & Co. Kg Vorrichtung und Verfahren zur radioskopischen Untersuchung eines streifenförmigen Materials mit einem wesentlichen Bestandteil aus Kautschuk oder Kunststoff

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4289964A (en) * 1980-01-24 1981-09-15 Intec Corporation Radiation inspection system for a material making apparatus and method using a beta ray gauge
DE3224964A1 (de) * 1982-07-03 1984-01-05 Sauerwein, Kurt, Dr., 5657 Haan Durchstrahlungsverfahren und -vorrichtung zum materialpruefen
DE3325281C2 (de) * 1983-07-13 1985-09-26 Rheinisch-Westfälischer Technischer Überwachungsverein e.V ., 4300 Essen Verfahren und Vorrichtung zur fortlaufenden, zerstörungsfreien Werkstoffprüfung an kontinuierlich bewegtem Bandmaterial
GB8900254D0 (en) * 1989-01-06 1989-03-08 Vactite Ltd Treatment of plastics insulated wire
DE3928279C2 (de) * 1989-08-26 1998-05-14 Truetzschler Gmbh & Co Kg Verfahren und Vorrichtung zum Erkennen von störenden Partikeln, insbesondere Trashteilen, Nissen, Schalennissen, Noppen u. dgl., in textilem Fasergut, z. B. Baumwolle, Chemiefasern u. dgl.

Also Published As

Publication number Publication date
KR19990087358A (ko) 1999-12-27
EP0883800A1 (de) 1998-12-16
CA2247377A1 (en) 1997-09-04
JP2000505552A (ja) 2000-05-09
DE19607582A1 (de) 1997-09-04
WO1997032200A1 (de) 1997-09-04

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Legal Events

Date Code Title Description
MK5 Application lapsed section 142(2)(e) - patent request and compl. specification not accepted