ATE96914T1 - VECTOR ANALYZER FOR MILLIMETER AND/OR SUBMILLIMETER NETWORK. - Google Patents

VECTOR ANALYZER FOR MILLIMETER AND/OR SUBMILLIMETER NETWORK.

Info

Publication number
ATE96914T1
ATE96914T1 AT90402700T AT90402700T ATE96914T1 AT E96914 T1 ATE96914 T1 AT E96914T1 AT 90402700 T AT90402700 T AT 90402700T AT 90402700 T AT90402700 T AT 90402700T AT E96914 T1 ATE96914 T1 AT E96914T1
Authority
AT
Austria
Prior art keywords
millimetre
network
source
receiver
microwave source
Prior art date
Application number
AT90402700T
Other languages
German (de)
Inventor
Philippe Goy
Michel Gross
Original Assignee
Millimetre Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Millimetre Ab filed Critical Millimetre Ab
Application granted granted Critical
Publication of ATE96914T1 publication Critical patent/ATE96914T1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Superheterodyne Receivers (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
  • Disintegrating Or Milling (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The vector analyser for a millimetre and/or submillimetre network consists of a millimetre source 3 and a millimetre heterodyne receiver 5, the network 1 to be analysed having to be placed between the said source 3 and the said receiver 5. The millimetre source 3 consists of a first microwave source 6 supplying a millimetre harmonic generator 7. The millimetre heterodyne receiver 5 has a front end consisting of a millimetre harmonic mixer supplied by a second microwave source 10 which serves as a local oscillator for it, an HF (high frequency) vector receiver 9 together with means of displaying the characteristics of the analysed network. <??>The invention incorporates a device 11 for locking the transmission frequency of the second microwave source 10 to the frequency of the first microwave source 6 (or vice versa) together with a principal HF (high frequency) oscillator 15 controlling this locking device 11. The principal oscillator 15 is also used directly as a phase reference for the HF (high frequency) vector receiver 9. The millimetre harmonic generator 7 supplied by the first microwave source 6 and the millimetre harmonic mixer 8 of the millimetre heterodyne receiver 5 operate at the same order harmonic. <IMAGE>
AT90402700T 1989-09-29 1990-09-28 VECTOR ANALYZER FOR MILLIMETER AND/OR SUBMILLIMETER NETWORK. ATE96914T1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8912766A FR2652653B1 (en) 1989-09-29 1989-09-29 VECTOR ANALYZER OF MILLIMETRIC AND / OR SUBMILLIMETRIC NETWORK.
EP90402700A EP0420767B1 (en) 1989-09-29 1990-09-28 Vector analyser for millimeter and/or submillimeter network

Publications (1)

Publication Number Publication Date
ATE96914T1 true ATE96914T1 (en) 1993-11-15

Family

ID=9385954

Family Applications (1)

Application Number Title Priority Date Filing Date
AT90402700T ATE96914T1 (en) 1989-09-29 1990-09-28 VECTOR ANALYZER FOR MILLIMETER AND/OR SUBMILLIMETER NETWORK.

Country Status (6)

Country Link
US (1) US5119035A (en)
EP (1) EP0420767B1 (en)
JP (1) JPH03273171A (en)
AT (1) ATE96914T1 (en)
DE (1) DE69004399T2 (en)
FR (1) FR2652653B1 (en)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5263193A (en) * 1991-05-31 1993-11-16 The United States Of America As Represented By The Secretary Of The Air Force Selfmixing heterodyne system
US5493719A (en) * 1994-07-01 1996-02-20 The United States Of America As Represented By The Secretary Of The Air Force Integrated superconductive heterodyne receiver
US6020733A (en) * 1994-12-22 2000-02-01 Anritsu Company Two port handheld vector network analyzer with frequency monitor mode
JPH10139491A (en) * 1996-11-14 1998-05-26 Central Glass Co Ltd Low reflecting dark gray glass
DE19812604C1 (en) * 1998-03-23 1999-09-16 Karlsruhe Forschzent Vectorial network analyzer for millimeter wave range
US6348683B1 (en) 1998-05-04 2002-02-19 Massachusetts Institute Of Technology Quasi-optical transceiver having an antenna with time varying voltage
FR2817620B1 (en) * 2000-12-04 2003-02-07 Centre Nat Rech Scient ELECTROMAGNETIC CHARACTERIZATION DEVICE OF A STRUCTURE UNDER TEST
US6373344B1 (en) * 2000-12-08 2002-04-16 Agilent Technologies, Inc. High performance dual-YTO microwave synthesizer
GB2388703B (en) * 2001-11-09 2005-12-14 Marconi Applied Techn Ltd Terahertz power generation
US7088111B2 (en) * 2003-05-09 2006-08-08 Anritsu Company Enhanced isolation level between sampling channels in a vector network analyzer
US8841923B1 (en) 2007-08-30 2014-09-23 Agilent Technologies, Inc. Device and method for performing remote frequency response measurements
US7801505B2 (en) * 2007-08-30 2010-09-21 Agilent Technologies, Inc. Multipulse/multitone mixing receiver
US8212573B2 (en) 2009-01-15 2012-07-03 The Curators Of The University Of Missouri High frequency analysis of a device under test
CN102055536A (en) * 2010-10-18 2011-05-11 中国电子科技集团公司第五十四研究所 Reflector antenna delay measurement method
DE102018115079B4 (en) * 2018-06-22 2020-01-30 Tu Dresden Radar arrangement and method for operating a radar arrangement
CN110333472B (en) * 2019-07-25 2021-02-23 北京无线电计量测试研究所 Three-position model terahertz probe transient characteristic calibration method and system
CN110531297B (en) * 2019-08-28 2021-03-19 北京无线电计量测试研究所 Terahertz probe transient characteristic calibration method and system based on single-position model
CN110441723B (en) * 2019-08-29 2021-08-31 北京无线电计量测试研究所 Terahertz probe transient response calibration method and device
FR3116113B1 (en) 2020-11-10 2023-06-23 Terakalis DEVICE AND METHOD FOR ESTIMATING TEMPERATURES OF A MULTILAYER COMPRISING A PLURALITY OF LAYERS OF MATERIAL
CN115189797A (en) * 2022-09-09 2022-10-14 中国科学院国家授时中心 Time synchronization method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3866118A (en) * 1973-11-08 1975-02-11 Rca Corp Microwave spectrometer
US4703433A (en) * 1984-01-09 1987-10-27 Hewlett-Packard Company Vector network analyzer with integral processor
US4733165A (en) * 1986-03-10 1988-03-22 The United States Of America As Represented By The Secretary Of The Navy Multimode resonance chamber and method of determining an equivalent single mode relaxation response
GB8702804D0 (en) * 1987-02-07 1987-03-11 Schlumberger Electronics Uk Frequency response analysis
US4853613A (en) * 1987-10-27 1989-08-01 Martin Marietta Corporation Calibration method for apparatus evaluating microwave/millimeter wave circuits

Also Published As

Publication number Publication date
DE69004399D1 (en) 1993-12-09
US5119035A (en) 1992-06-02
EP0420767B1 (en) 1993-11-03
FR2652653B1 (en) 1991-12-13
DE69004399T2 (en) 1994-05-19
FR2652653A1 (en) 1991-04-05
EP0420767A1 (en) 1991-04-03
JPH03273171A (en) 1991-12-04

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Legal Events

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