ATE61472T1 - Einrichtung und verfahren fuer oberflaechenpruefung. - Google Patents

Einrichtung und verfahren fuer oberflaechenpruefung.

Info

Publication number
ATE61472T1
ATE61472T1 AT88300497T AT88300497T ATE61472T1 AT E61472 T1 ATE61472 T1 AT E61472T1 AT 88300497 T AT88300497 T AT 88300497T AT 88300497 T AT88300497 T AT 88300497T AT E61472 T1 ATE61472 T1 AT E61472T1
Authority
AT
Austria
Prior art keywords
radiation
channel
test
detector
selector
Prior art date
Application number
AT88300497T
Other languages
English (en)
Inventor
Lionel Baker
Original Assignee
Cogent Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cogent Ltd filed Critical Cogent Ltd
Application granted granted Critical
Publication of ATE61472T1 publication Critical patent/ATE61472T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/65—Spatial scanning object beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Optics & Photonics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Diaphragms For Electromechanical Transducers (AREA)
AT88300497T 1987-01-30 1988-01-21 Einrichtung und verfahren fuer oberflaechenpruefung. ATE61472T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB878702130A GB8702130D0 (en) 1987-01-30 1987-01-30 Surface inspection
EP88300497A EP0276951B1 (de) 1987-01-30 1988-01-21 Einrichtung und Verfahren für Oberflächenprüfung

Publications (1)

Publication Number Publication Date
ATE61472T1 true ATE61472T1 (de) 1991-03-15

Family

ID=10611498

Family Applications (1)

Application Number Title Priority Date Filing Date
AT88300497T ATE61472T1 (de) 1987-01-30 1988-01-21 Einrichtung und verfahren fuer oberflaechenpruefung.

Country Status (7)

Country Link
US (1) US4845356A (de)
EP (1) EP0276951B1 (de)
JP (1) JPS63193005A (de)
AT (1) ATE61472T1 (de)
DE (1) DE3861860D1 (de)
ES (1) ES2021425B3 (de)
GB (1) GB8702130D0 (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5042949A (en) * 1989-03-17 1991-08-27 Greenberg Jeffrey S Optical profiler for films and substrates
US4980880A (en) * 1989-11-06 1990-12-25 Laser Magnetic Storage International Company Method and apparatus for simultaneously reading both sides of an optical storage disk
US5032734A (en) * 1990-10-15 1991-07-16 Vti, Inc. Method and apparatus for nondestructively measuring micro defects in materials
US5128797A (en) * 1991-02-11 1992-07-07 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Non-mechanical optical path switching and its application to dual beam spectroscopy including gas filter correlation radiometry
JPH06109647A (ja) * 1992-09-24 1994-04-22 Nikon Corp 欠陥検査装置
US5455899A (en) * 1992-12-31 1995-10-03 International Business Machines Corporation High speed image data processing circuit
US5804813A (en) * 1996-06-06 1998-09-08 National Science Council Of Republic Of China Differential confocal microscopy
US5847834A (en) * 1997-09-11 1998-12-08 Webview, Inc. Expandable, continuous illumination source for a web inspection assembly and method
US6359446B1 (en) * 1997-09-25 2002-03-19 Jack R. Little, Jr. Apparatus and method for nondestructive testing of dielectric materials
US6236429B1 (en) 1998-01-23 2001-05-22 Webview, Inc. Visualization system and method for a web inspection assembly
US6057923A (en) * 1998-04-20 2000-05-02 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Optical path switching based differential absorption radiometry for substance detection
US6867406B1 (en) * 1999-03-23 2005-03-15 Kla-Tencor Corporation Confocal wafer inspection method and apparatus using fly lens arrangement
GB2385417B (en) * 2002-03-14 2004-01-21 Taylor Hobson Ltd Surface profiling apparatus
US8750702B1 (en) * 2002-06-21 2014-06-10 Rockstar Consortium Us Lp Passive optical loopback
GB2395777B (en) * 2002-11-27 2005-12-28 Taylor Hobson Ltd A surface profiling apparatus
US7916308B2 (en) * 2003-04-01 2011-03-29 Seagate Technology Llc Method and optical profiler
GB2401937B (en) * 2003-05-23 2006-07-19 Taylor Hobson Ltd Surface profiling apparatus
DE10348250A1 (de) * 2003-10-16 2005-05-12 Bosch Gmbh Robert Interferometrische Messvorrichtung
US7663742B2 (en) * 2005-11-24 2010-02-16 Novartis Ag Lens inspection system using phase contrast imaging
DE102007024059B4 (de) * 2007-05-22 2017-11-09 Illinois Tool Works Inc. Vorrichtung und Verfahren zur Beurteilung eines Kontrollkörpers bei einem Farb-Eindring-Verfahren
WO2016094827A1 (en) * 2014-12-12 2016-06-16 Velo3D, Inc. Feedback control systems for three-dimensional printing
JP6361587B2 (ja) * 2015-06-04 2018-07-25 Ｊｆｅスチール株式会社 金属帯穴検査装置の点検装置および点検方法
US11691343B2 (en) 2016-06-29 2023-07-04 Velo3D, Inc. Three-dimensional printing and three-dimensional printers
WO2018064349A1 (en) 2016-09-30 2018-04-05 Velo3D, Inc. Three-dimensional objects and their formation
KR20220031745A (ko) 2019-07-26 2022-03-11 벨로3디, 인크. 3차원 물체 형상화에 대한 품질 보증

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3743431A (en) * 1972-05-09 1973-07-03 Philco Ford Corp Radiation sensitive means for detecting flaws in glass
GB1403911A (en) * 1972-07-26 1975-08-28 Sira Institute Method and apparatus for testing optical components
WO1984002398A1 (en) * 1982-12-15 1984-06-21 Sira Ltd Inspection apparatus and method
EP0226658B1 (de) * 1985-12-23 1989-11-15 Ibm Deutschland Gmbh Verfahren und Anordnung für das optische Bestimmen von Oberflächenprofilen

Also Published As

Publication number Publication date
GB8702130D0 (en) 1987-03-04
DE3861860D1 (de) 1991-04-11
JPS63193005A (ja) 1988-08-10
EP0276951B1 (de) 1991-03-06
EP0276951A1 (de) 1988-08-03
US4845356A (en) 1989-07-04
ES2021425B3 (es) 1991-11-01

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Legal Events

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RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties