ATE540478T1 - Analog-digital-umsetzer und verfahren zur analog- digital-umsetzung - Google Patents
Analog-digital-umsetzer und verfahren zur analog- digital-umsetzungInfo
- Publication number
- ATE540478T1 ATE540478T1 AT08016777T AT08016777T ATE540478T1 AT E540478 T1 ATE540478 T1 AT E540478T1 AT 08016777 T AT08016777 T AT 08016777T AT 08016777 T AT08016777 T AT 08016777T AT E540478 T1 ATE540478 T1 AT E540478T1
- Authority
- AT
- Austria
- Prior art keywords
- analog
- digital
- control signal
- charge stores
- converter
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
- H03M1/0656—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal
- H03M1/066—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal by continuously permuting the elements used, i.e. dynamic element matching
- H03M1/0673—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the time domain, e.g. using intended jitter as a dither signal by continuously permuting the elements used, i.e. dynamic element matching using random selection of the elements
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/34—Analogue value compared with reference values
- H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
- H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
- H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/66—Digital/analogue converters
- H03M1/68—Digital/analogue converters with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits
- H03M1/687—Segmented, i.e. the more significant bit converter being of the unary decoded type and the less significant bit converter being of the binary weighted type
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP08016777A EP2169829B1 (de) | 2008-09-24 | 2008-09-24 | Analog-Digital-Umsetzer und Verfahren zur Analog-Digital-Umsetzung |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE540478T1 true ATE540478T1 (de) | 2012-01-15 |
Family
ID=40451311
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT08016777T ATE540478T1 (de) | 2008-09-24 | 2008-09-24 | Analog-digital-umsetzer und verfahren zur analog- digital-umsetzung |
Country Status (2)
Country | Link |
---|---|
EP (1) | EP2169829B1 (de) |
AT (1) | ATE540478T1 (de) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8810443B2 (en) * | 2012-04-20 | 2014-08-19 | Linear Technology Corporation | Analog-to-digital converter system and method |
US9432041B2 (en) * | 2014-04-17 | 2016-08-30 | Stmicroelectronics S.R.L. | Method of calibrating a thermometer-code SAR A/D converter and thermometer-code SAR-A/D converter implementing said method |
US9362937B1 (en) * | 2014-11-26 | 2016-06-07 | Stmicroelectronics S.R.L. | Method of calibrating a SAR A/D converter and SAR-A/D converter implementing said method |
US10243577B1 (en) * | 2018-04-02 | 2019-03-26 | Nxp Usa, Inc. | Analog-to-digital converter (ADC) having calibration |
US11032501B2 (en) * | 2018-06-04 | 2021-06-08 | Apple Inc. | Low noise image sensor system with reduced fixed pattern noise |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5006854A (en) * | 1989-02-13 | 1991-04-09 | Silicon Systems, Inc. | Method and apparatus for converting A/D nonlinearities to random noise |
US7199746B1 (en) * | 2005-12-19 | 2007-04-03 | Silicon Laboratories Inc. | Method for search and matching of capacitors for a digital to analog converter of an SAR analog to digital converter |
-
2008
- 2008-09-24 AT AT08016777T patent/ATE540478T1/de active
- 2008-09-24 EP EP08016777A patent/EP2169829B1/de not_active Not-in-force
Also Published As
Publication number | Publication date |
---|---|
EP2169829A1 (de) | 2010-03-31 |
EP2169829B1 (de) | 2012-01-04 |
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