ATE536537T1 - Dewar infrarotdetektor - Google Patents
Dewar infrarotdetektorInfo
- Publication number
- ATE536537T1 ATE536537T1 AT10169746T AT10169746T ATE536537T1 AT E536537 T1 ATE536537 T1 AT E536537T1 AT 10169746 T AT10169746 T AT 10169746T AT 10169746 T AT10169746 T AT 10169746T AT E536537 T1 ATE536537 T1 AT E536537T1
- Authority
- AT
- Austria
- Prior art keywords
- light
- dewar
- infrared detector
- substrate
- disposed
- Prior art date
Links
- 239000000758 substrate Substances 0.000 abstract 2
- 230000003595 spectral effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
- G01J5/53—Reference sources, e.g. standard lamps; Black bodies
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/007—Optical devices or arrangements for the control of light using movable or deformable optical elements the movable or deformable optical element controlling the colour, i.e. a spectral characteristic, of the light
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0004—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed
- G02B19/0028—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed refractive and reflective surfaces, e.g. non-imaging catadioptric systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/0047—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source
- G02B19/0061—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source the light source comprising a LED
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/0085—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with both a detector and a source
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/009—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with infrared radiation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
- G02B27/0927—Systems for changing the beam intensity distribution, e.g. Gaussian to top-hat
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
- G02B27/0933—Systems for active beam shaping by rapid movement of an element
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
- G02B27/0938—Using specific optical elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
- G02B27/0938—Using specific optical elements
- G02B27/0977—Reflective elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B23/00—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
- G02B23/12—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices with means for image conversion or intensification
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Astronomy & Astrophysics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/978,738 US7592588B2 (en) | 2007-10-30 | 2007-10-30 | Calibration source infrared assembly for an infrared detector |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE536537T1 true ATE536537T1 (de) | 2011-12-15 |
Family
ID=40365363
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT10169746T ATE536537T1 (de) | 2007-10-30 | 2008-10-29 | Dewar infrarotdetektor |
AT08853931T ATE534889T1 (de) | 2007-10-30 | 2008-10-29 | Kalibrierungsquellenanordnung für einen infrarotdetektor |
AT10169745T ATE536536T1 (de) | 2007-10-30 | 2008-10-29 | Infrarotdetektor mit einer kalibrierquellenanordnung |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT08853931T ATE534889T1 (de) | 2007-10-30 | 2008-10-29 | Kalibrierungsquellenanordnung für einen infrarotdetektor |
AT10169745T ATE536536T1 (de) | 2007-10-30 | 2008-10-29 | Infrarotdetektor mit einer kalibrierquellenanordnung |
Country Status (4)
Country | Link |
---|---|
US (1) | US7592588B2 (de) |
EP (3) | EP2244077B1 (de) |
AT (3) | ATE536537T1 (de) |
WO (1) | WO2009070408A1 (de) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8716651B2 (en) | 2011-08-18 | 2014-05-06 | Raytheon Company | Calibration system for detector |
US8861106B2 (en) | 2011-12-02 | 2014-10-14 | Raytheon Company | Variable monochromatic uniform calibration source |
JP2014020817A (ja) * | 2012-07-13 | 2014-02-03 | Nippon Steel & Sumitomo Metal | 放射温度計用校正装置及び放射温度計の校正方法 |
US9024253B2 (en) | 2012-08-21 | 2015-05-05 | Raytheon Company | Calibration system for detector |
EP3093637B1 (de) | 2015-05-01 | 2021-11-10 | ABB Schweiz AG | Kalibrierungssysteme und -verfahren für kleinvolumige infrarotquelle mit hoher emissivität |
US11268860B2 (en) | 2020-07-24 | 2022-03-08 | Raytheon Company | Radiometric calibration of detector |
US11800051B2 (en) * | 2021-12-17 | 2023-10-24 | Raytheon Company | Device and method for optical sensor calibration |
WO2023220415A1 (en) * | 2022-05-13 | 2023-11-16 | The University Of Chicago | Optical cavity array |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5404016A (en) * | 1984-08-31 | 1995-04-04 | Santa Barbara Research Center | Dewar detector assembly |
US4876453A (en) * | 1986-02-19 | 1989-10-24 | Hughes Aircraft Company | Method and apparatus for calibrating an imaging sensor |
GB8607356D0 (en) * | 1986-03-25 | 1986-05-21 | Ortec Inc | Modular cryogenic detector head assembly |
US4727255A (en) * | 1986-06-03 | 1988-02-23 | Hughes Aircraft Company | Silicone dielectric gel cryogenic detector interface |
US5587784A (en) * | 1995-06-16 | 1996-12-24 | Hughes Electronics | Multispectral-staring sensor |
US7119337B1 (en) * | 1997-08-04 | 2006-10-10 | Ion Optics, Inc. | Infrared radiation sources, sensors and source combinations, and methods of manufacture |
EP1384051A1 (de) * | 2001-05-02 | 2004-01-28 | Csir | Spektrometer mit überlappenden breitbandigen spektralfiltern |
SE524086C2 (sv) * | 2001-10-30 | 2004-06-22 | Phase In Ab | Mäthuvud för gasanalysator |
US6765663B2 (en) * | 2002-03-14 | 2004-07-20 | Raytheon Company | Efficient multiple emitter boresight reference source |
KR100601964B1 (ko) * | 2004-09-07 | 2006-07-19 | 삼성전자주식회사 | 다채널 다중 컬러 측정을 위한 광검출장치 및 이를 채용한다채널 시료 분석기 |
-
2007
- 2007-10-30 US US11/978,738 patent/US7592588B2/en active Active
-
2008
- 2008-10-29 AT AT10169746T patent/ATE536537T1/de active
- 2008-10-29 EP EP10169746A patent/EP2244077B1/de active Active
- 2008-10-29 WO PCT/US2008/081589 patent/WO2009070408A1/en active Application Filing
- 2008-10-29 EP EP08853931A patent/EP2205951B1/de active Active
- 2008-10-29 AT AT08853931T patent/ATE534889T1/de active
- 2008-10-29 EP EP10169745A patent/EP2244076B1/de active Active
- 2008-10-29 AT AT10169745T patent/ATE536536T1/de active
Also Published As
Publication number | Publication date |
---|---|
EP2244077B1 (de) | 2011-12-07 |
EP2205951A1 (de) | 2010-07-14 |
ATE534889T1 (de) | 2011-12-15 |
EP2205951B1 (de) | 2011-11-23 |
EP2244077A1 (de) | 2010-10-27 |
EP2244076B1 (de) | 2011-12-07 |
ATE536536T1 (de) | 2011-12-15 |
US20090108201A1 (en) | 2009-04-30 |
WO2009070408A1 (en) | 2009-06-04 |
US7592588B2 (en) | 2009-09-22 |
EP2244076A1 (de) | 2010-10-27 |
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