ATE487934T1 - Verfahren zur messung optischer nichlinearitätsraumprofile von proben - Google Patents

Verfahren zur messung optischer nichlinearitätsraumprofile von proben

Info

Publication number
ATE487934T1
ATE487934T1 AT03793270T AT03793270T ATE487934T1 AT E487934 T1 ATE487934 T1 AT E487934T1 AT 03793270 T AT03793270 T AT 03793270T AT 03793270 T AT03793270 T AT 03793270T AT E487934 T1 ATE487934 T1 AT E487934T1
Authority
AT
Austria
Prior art keywords
nicholarity
samples
measuring optical
fourier transform
space profiles
Prior art date
Application number
AT03793270T
Other languages
English (en)
Inventor
Aydogan Ozcan
Michel Digonnet
Gordon Kino
Original Assignee
Univ Leland Stanford Junior
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/357,275 external-priority patent/US7133134B2/en
Priority claimed from US10/378,591 external-priority patent/US6856393B2/en
Application filed by Univ Leland Stanford Junior filed Critical Univ Leland Stanford Junior
Application granted granted Critical
Publication of ATE487934T1 publication Critical patent/ATE487934T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/636—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/14—Fourier, Walsh or analogous domain transformations, e.g. Laplace, Hilbert, Karhunen-Loeve, transforms
    • G06F17/141—Discrete Fourier transforms

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Pure & Applied Mathematics (AREA)
  • Computational Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Data Mining & Analysis (AREA)
  • Databases & Information Systems (AREA)
  • Chemical & Material Sciences (AREA)
  • General Engineering & Computer Science (AREA)
  • Discrete Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Optics & Photonics (AREA)
  • Algebra (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Software Systems (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Analysis (AREA)
AT03793270T 2002-08-21 2003-08-21 Verfahren zur messung optischer nichlinearitätsraumprofile von proben ATE487934T1 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US40540502P 2002-08-21 2002-08-21
US10/357,275 US7133134B2 (en) 2002-08-21 2003-01-31 Method of measuring a physical function using a symmetric composite function
US10/378,591 US6856393B2 (en) 2002-08-21 2003-03-03 Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function
PCT/US2003/026311 WO2004019018A2 (en) 2002-08-21 2003-08-21 Method of measuring nonlinearity spatial profiles of samples and temporal profiles of optical pulses

Publications (1)

Publication Number Publication Date
ATE487934T1 true ATE487934T1 (de) 2010-11-15

Family

ID=46123495

Family Applications (1)

Application Number Title Priority Date Filing Date
AT03793270T ATE487934T1 (de) 2002-08-21 2003-08-21 Verfahren zur messung optischer nichlinearitätsraumprofile von proben

Country Status (2)

Country Link
EP (3) EP2278302B1 (de)
AT (1) ATE487934T1 (de)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4792230A (en) * 1986-09-08 1988-12-20 Nippon Telegraph And Telephone Corporation Method and apparatus for measuring ultrashort optical pulses
US5530544A (en) * 1992-10-26 1996-06-25 Sandia Corporation Method and apparatus for measuring the intensity and phase of one or more ultrashort light pulses and for measuring optical properties of materials

Also Published As

Publication number Publication date
EP2278302B1 (de) 2018-12-12
EP2278302A2 (de) 2011-01-26
EP2270473B1 (de) 2018-06-27
EP2270473A3 (de) 2012-08-01
EP2270473A2 (de) 2011-01-05
EP2270474A2 (de) 2011-01-05
EP2278302A3 (de) 2012-08-01
EP2270474A3 (de) 2012-08-01

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Legal Events

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