ATE481815T1 - Kabeltopologiebestimmungsanordnung und -verfahren - Google Patents

Kabeltopologiebestimmungsanordnung und -verfahren

Info

Publication number
ATE481815T1
ATE481815T1 AT06291989T AT06291989T ATE481815T1 AT E481815 T1 ATE481815 T1 AT E481815T1 AT 06291989 T AT06291989 T AT 06291989T AT 06291989 T AT06291989 T AT 06291989T AT E481815 T1 ATE481815 T1 AT E481815T1
Authority
AT
Austria
Prior art keywords
determination arrangement
topology determination
cable topology
cable
reflectograms
Prior art date
Application number
AT06291989T
Other languages
English (en)
Inventor
Marc Fossion
Michael Duvivier
Original Assignee
Alcatel Lucent
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alcatel Lucent filed Critical Alcatel Lucent
Application granted granted Critical
Publication of ATE481815T1 publication Critical patent/ATE481815T1/de

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H04M3/305—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop testing of physical copper line parameters, e.g. capacitance or resistance
    • H04M3/306—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop testing of physical copper line parameters, e.g. capacitance or resistance for frequencies above the voice frequency, e.g. xDSL line qualification
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/11—Locating faults in cables, transmission lines, or networks using pulse reflection methods

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Communication Cables (AREA)
  • Laying Of Electric Cables Or Lines Outside (AREA)
AT06291989T 2006-12-19 2006-12-19 Kabeltopologiebestimmungsanordnung und -verfahren ATE481815T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP06291989A EP1936931B1 (de) 2006-12-19 2006-12-19 Kabeltopologiebestimmungsanordnung und -verfahren

Publications (1)

Publication Number Publication Date
ATE481815T1 true ATE481815T1 (de) 2010-10-15

Family

ID=38235183

Family Applications (1)

Application Number Title Priority Date Filing Date
AT06291989T ATE481815T1 (de) 2006-12-19 2006-12-19 Kabeltopologiebestimmungsanordnung und -verfahren

Country Status (3)

Country Link
EP (1) EP1936931B1 (de)
AT (1) ATE481815T1 (de)
DE (1) DE602006016970D1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101788624B (zh) * 2009-12-25 2012-08-22 上海磁浮交通发展有限公司 用于测试电气连接拓扑结构的装置
EP2461170B1 (de) * 2010-12-02 2017-08-30 Alcatel Lucent Modul und verfahren zur bestimmung einer physikalischen fehlerdomäne

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1515850A (en) * 1974-10-09 1978-06-28 Lim Ching Hwa Methods and equipment for testing transmission lines
DE4220410C1 (de) * 1992-06-19 1993-11-25 Siemens Ag Verfahren zum Bestimmen eines Fehlers auf einer elektrischen Übertragungsleitung
DE60315622T2 (de) * 2003-07-03 2008-06-05 Alcatel Lucent Verfahren und Vorrichtung zur einseitigen Prüfung einer Leitung

Also Published As

Publication number Publication date
DE602006016970D1 (de) 2010-10-28
EP1936931B1 (de) 2010-09-15
EP1936931A1 (de) 2008-06-25

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties