ATE41709T1 - Verfahren und schaltung zur pruefung dielektrischer materialien, insbesondere kondensatoren. - Google Patents

Verfahren und schaltung zur pruefung dielektrischer materialien, insbesondere kondensatoren.

Info

Publication number
ATE41709T1
ATE41709T1 AT85400873T AT85400873T ATE41709T1 AT E41709 T1 ATE41709 T1 AT E41709T1 AT 85400873 T AT85400873 T AT 85400873T AT 85400873 T AT85400873 T AT 85400873T AT E41709 T1 ATE41709 T1 AT E41709T1
Authority
AT
Austria
Prior art keywords
stimulating pulses
circuit
dielectric materials
reference impedance
tested
Prior art date
Application number
AT85400873T
Other languages
English (en)
Inventor
Burgat Michel De
Traon Andre Le
Jean-Claude Pilet
Ammar Sharaiha
Original Assignee
Univ Rennes
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Rennes filed Critical Univ Rennes
Application granted granted Critical
Publication of ATE41709T1 publication Critical patent/ATE41709T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/64—Testing of capacitors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Inorganic Insulating Materials (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Electrotherapy Devices (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
AT85400873T 1984-05-10 1985-05-06 Verfahren und schaltung zur pruefung dielektrischer materialien, insbesondere kondensatoren. ATE41709T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8407196A FR2564205B1 (fr) 1984-05-10 1984-05-10 Procede et dispositif pour le test rapide de condensateurs et de materiaux dielectriques
EP85400873A EP0165109B1 (de) 1984-05-10 1985-05-06 Verfahren und Schaltung zur Prüfung dielektrischer Materialien, insbesondere Kondensatoren

Publications (1)

Publication Number Publication Date
ATE41709T1 true ATE41709T1 (de) 1989-04-15

Family

ID=9303829

Family Applications (1)

Application Number Title Priority Date Filing Date
AT85400873T ATE41709T1 (de) 1984-05-10 1985-05-06 Verfahren und schaltung zur pruefung dielektrischer materialien, insbesondere kondensatoren.

Country Status (6)

Country Link
US (1) US4683417A (de)
EP (1) EP0165109B1 (de)
JP (1) JPS6150072A (de)
AT (1) ATE41709T1 (de)
DE (1) DE3569041D1 (de)
FR (1) FR2564205B1 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2584196B1 (fr) * 1985-07-01 1988-04-22 Univ Rennes Procede et dispositif pour le test rapide, par reflectrometrie, dans les gammes v.h.f., de composants passifs
FR2661509B1 (fr) * 1990-04-27 1992-06-19 Europ Composants Electron Procede de controle des mesures realisees dans un appareil de test et de tri d'articles miniatures.
US5469364A (en) * 1993-03-15 1995-11-21 Hughey; Bradley W. Apparatus and methods for measuring and detecting variations in the value of a capacitor
US6054864A (en) * 1996-11-18 2000-04-25 Butts; Joseph R. In-circuit capacitor checker
TW460701B (en) * 2000-01-20 2001-10-21 Winbond Electronics Corp Improved test circuit of TDDB
FR2818554B1 (fr) * 2000-12-22 2003-03-28 Ela Medical Sa Procede de mesure de l'impedance complexe d'une sonde de dispositif medical implantable actif, notamment de stimulateur cardiaque, defibrillateur et/ou cardioverteur
US7938937B2 (en) * 2005-03-24 2011-05-10 Showa Denko K.K. Solid-electrolyte capacitor manufacturing device and manufacturing method
WO2007075887A2 (en) * 2005-12-21 2007-07-05 Weiss Instruments, Inc. Micropower voltage-independent capacitance measuring method and circuit
DE112006004114A5 (de) * 2006-08-30 2009-08-13 Siemens Aktiengesellschaft Verfahren zum Erzeugen eines Fehlersignals, das einen Fehler in einer Kondensatoranordnung angibt und elektrisches Schutzgerät zur Durchführung des Verfahrens
DE102008044908A1 (de) * 2008-08-29 2010-03-04 Lemförder Electronic GmbH Anordnung zur Messung wenigstens eines Wertes einer an einer elektronischen Komponente anliegenden Spannung
JP2010230688A (ja) * 2010-07-06 2010-10-14 Nippon Chemicon Corp 電解コンデンサの測定方法及び測定プログラム
US10006956B2 (en) * 2015-03-26 2018-06-26 Lenovo Enterprise Solutions (Singapore) Pte. Ltd. Systems and methods for determining an operational condition of a capacitor package
CN109828157B (zh) * 2019-01-30 2020-12-25 东南大学 一种介质基片介电常数测量机构及其测量方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE792405A (fr) * 1971-12-08 1973-03-30 Paratronic Ag Dispositif pour mesurer sans les detruire l'epaisseur de revetements electriquement non conducteurs sur des supports electriquement conducteurs
JPS539542B2 (de) * 1972-09-21 1978-04-06
US4282480A (en) * 1978-05-02 1981-08-04 Matsushita Electric Industrial Co., Ltd. Apparatus for humidity detection
US4216424A (en) * 1978-10-30 1980-08-05 Vette Carl W Method and apparatus for testing electrolytic capacitors
US4404481A (en) * 1980-10-20 1983-09-13 Matsushita Electric Industrial Co., Ltd. Capacitance to voltage conversion apparatus
US4330777A (en) * 1980-11-05 1982-05-18 The United States Of America As Represented By The United States Department Of Energy Device for detecting imminent failure of high-dielectric stress capacitors
AT377859B (de) * 1982-03-18 1985-05-10 List Hans Einrichtung zur bestimmung des mischungsverhaeltnisses von fluessigkeiten
US4558274A (en) * 1983-09-14 1985-12-10 Johnson Service Company Apparatus and method determining the value of a capacitance

Also Published As

Publication number Publication date
JPS6150072A (ja) 1986-03-12
DE3569041D1 (en) 1989-04-27
EP0165109A1 (de) 1985-12-18
FR2564205A1 (fr) 1985-11-15
FR2564205B1 (fr) 1986-10-24
EP0165109B1 (de) 1989-03-22
US4683417A (en) 1987-07-28

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Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties